Contact for testing semiconductor device, and test socket device therefor
Disclosed is related generally to a contact for testing a semiconductor device and a socket device therefor. The contact of the present invention, being a spring contact configured in an integrated body by blanking and bending a metal board, includes: an elastic part composed of various strips in a fixed pattern, and sharp end parts provided on opposite ends of the elastic part, respectively. Preferably, with a filler having conductivity and elasticity being filled in space volume, the contact of the present invention has excellent durability and electrical characteristics. In addition, the test socket according to the present invention, being the rubber type adopting the above-stated contacts, provides an appropriate effect for a test of a semiconductor device having a fine pitch.
1. A contact configured in an integrated body by blanking a metal board and rolling the metal board into a cylindrical shape, the contact comprising:
an elastic part being bent into a cylindrical shape by being connected in a zigzag pattern with unit strips each composed of a horizontal strip and a vertical strip extending perpendicularly from one end of the horizontal strip and having a shorter length than the horizontal strip;
an upper head part being bent into a cylindrical shape by being provided with an upper sharp end part formed by protruding upwards and extending from an uppermost end of the elastic part;
a lower head part being bent into a cylindrical shape by being provided with a lower sharp end part formed by protruding downwards and extending from a lowermost end of the elastic part; and
a filler having conductivity and elasticity by being filled in a cylindrical shape into an elastic section at least between the upper head part and the lower head part.
2. The contact of claim 1 , wherein the elastic part is bent into the cylindrical shape by taking a center of the horizontal strip as a vertical axis.
3. The contact of claim 1 , wherein the upper sharp end part is a plurality of teeth formed by protruding upwards.
4. The contact of claim 3 , wherein the upper sharp end part has a plurality of teeth configured in a conic shape.
5. The contact of claim 1 , wherein the lower sharp end part is a plurality of teeth formed by protruding downwards.
6. The contact of claim 5 , wherein the lower sharp end part has a plurality of teeth configured in a conic shape.
7. A contact configured in an integrated body by blanking a metal board and rolling the metal board into a cylindrical shape, the contact comprising:
an elastic part being bent into a cylindrical shape by being connected with a plurality of closed loop strips of an equal size in series by nodes;
an upper head part being bent into a cylindrical shape by being provided with an upper sharp end part formed by protruding upwards and extending from an uppermost end of the elastic part;
a lower head part being bent into a cylindrical shape by being provided with a lower sharp end part formed by protruding downwards and extending from a lowermost end of the elastic part; and
a filler having conductivity and elasticity by being filled in a cylindrical shape into an elastic section at least between the upper head part and the lower head part.
8. The contact of claim 7 , wherein the nodes are provided on a vertical axis of the elastic part.
9. The contact of claim 7 , wherein the upper sharp end part is a plurality of teeth formed by protruding upwards.
10. The contact of claim 9 , wherein the upper sharp end part has a plurality of teeth configured in a conic shape.
11. The contact of claim 7 , wherein the lower sharp end part is a plurality of teeth formed by protruding downwards.
12. The contact of claim 11 , wherein the lower sharp end part has a plurality of teeth configured in a conic shape.
13. A test socket including the contact according to claim 1 , the test socket comprising:
a mounting part being formed with a plurality of through holes in each of which the contact is inserted and located corresponding to a lead of a device; and
an insulation body part having elasticity to allow the contact to be fastened to the mounting part in an integrated body.
14. The test socket of claim 13 , wherein the mounting part includes an insulating flat plate member formed with holes for mounting and holes for guiding an assembling position.
15. The test socket of claim 13 , wherein the mounting part includes:
a first mounting part being formed with the through holes and supporting the insulation body part; and
a second mounting part being mounted and located on a top of the first mounting part,
wherein the first mounting part and the second mounting part are formed to have holes for mounting and holes for guiding an assembling position, each of the holes being penetrated.
16. The test socket of claim 13 , further comprising:
a mounting seat on a top of the insulation body part, the mounting seat having electrical insulation property and being formed with holes formed corresponding to the through holes.
17. The test socket of claim 16 , wherein the contact has a lower side sharp end part being located by protruding out of corresponding one of the through holes and an upper side sharp end part being located by protruding out of a top of the mounting seat to face the device.
18. The test socket of claim 16 , wherein the contact has the upper sharp end part being located lower than the top of the mounting seat to face the device.
19. The test socket of claim 13 , wherein the contact further includes a bumper contact part having conductivity and elasticity on a top thereof.
20. The test socket of claim 13 , wherein the test socket is provided with a plurality of contacts having different heights, thereby allowing a test for a composite type device having heterogeneous leads to be possible.
21. A test socket including the contact according to claim 7 , the test socket comprising:
a mounting part being formed with a plurality of through holes in each of which the contact is inserted and located corresponding to a lead of a device; and
an insulation body part having elasticity to allow the contact to be fastened to the mounting part in an integrated body.
22. The test socket of claim 21 , wherein the mounting part includes an insulating flat plate member formed with holes for mounting and holes for guiding an assembling position.
23. The test socket of claim 21 , wherein the mounting part includes:
a first mounting part being formed with the through holes and supporting the insulation body part; and
a second mounting part being mounted and located on a top of the first mounting part,
wherein the first mounting part and the second mounting part are formed to have holes for mounting and holes for guiding an assembling position, each of the holes being penetrated.
24. The test socket of claim 21 , further comprising: a mounting seat on a top of the insulation body part, the mounting seat having electrical insulation property and being formed with holes formed corresponding to the through holes.
25. The test socket of claim 24 , wherein the contact has a lower side sharp end part being located by protruding out of corresponding one of the through holes and an upper side sharp end part being located by protruding out of a top of the mounting seat to face the device.
26. The test socket of claim 24 , wherein the contact has the upper sharp end part being located lower than the top of the mounting seat to face the device.
27. The test socket of claim 21 , wherein the contact further includes a bumper contact part having conductivity and elasticity on a top thereof.
28. The test socket of claim 21 , wherein the test socket is provided with a plurality of contacts having different heights, thereby allowing a test for a composite type device having heterogeneous leads to be possible.