Lithographic apparatus and device manufacturing method
A lithographic apparatus with a cover plate formed separately from a substrate table and means for stabilizing a temperature of the substrate table by controlling the temperature of the cover plate is disclosed. A lithographic apparatus with thermal insulation provided between a cover plate and a substrate table so that the cover plate acts as a thermal shield for the substrate table is disclosed. A lithographic apparatus comprising means to determine a substrate table distortion and improve position control of a substrate by reference to the substrate table distortion is disclosed.
1. A substrate holder arranged to support a substrate, the substrate holder comprising:
a support configured to support the substrate, the support comprising:
a body having a first major side and a second major side opposing the first major side;
a first set of one or more protrusions on the first major side, the first set of one or more protrusions configured to support the substrate; and
a heat exchange device of the body, the heat exchange device configured to exchange heat with the body,
wherein the body is configured to be removably supported on a support surface using a second set of one or more protrusions at the second major side.
2. The holder of claim 1 , wherein the heat exchange device is a heater.
3. The holder of claim 1 , wherein the heat exchange device comprises one or more channels to conduct a heat exchange fluid.
4. The holder of claim 1 , wherein the body is made of SiSiC.
5. A lithographic apparatus, comprising:
the holder of claim 1 ; and
a projection system configured to project a beam of radiation onto a radiation-sensitive target portion of the substrate; and
a liquid supply system configured to supply liquid via an inlet with a liquid supply opening to a space between the holder and the projection system.
6. The lithographic apparatus of claim 5 , further comprising a fluid extraction system with an extraction opening in a surface of a fluid handling body to extract fluid into the fluid handling body, the fluid handling body being above the substrate holder.
7. A substrate table comprising:
a support surface; and
a support configured to support a substrate, the support comprising:
a body having a first major side and a second major side opposing the first major side; and
a first set of one or more protrusions on the first major side, the first set of one or more protrusions configured to support the substrate,
wherein the support is removably supported on the support surface using a second set of one or more protrusions at the second major side; and
a part of a linear encoder system configured to measure at least translation of the table, the part of the linear encoder system located horizontally outward of the support.
8. The table of claim 7 , further comprising a structure located horizontally outward of the support and located horizontally inward of the part of the linear encoder system, the structure having a surface arranged to be substantially co-planar with a plane defined by the substrate when supported on the tops of the first set of one or more protrusions.
9. The table of claim 7 , further comprising a heat exchange device of the body, the heat exchange device configured to exchange heat with the body.
10. The table of claim 7 , further comprising a plurality of temperature sensors and a further heat exchange device in a structure separate from the support.
11. A lithographic apparatus, comprising:
the table of claim 7 ; and
a projection system configured to project a beam of radiation onto a radiation-sensitive target portion of the substrate; and
a liquid supply system configured to supply liquid via an inlet with a liquid supply opening to a space between the table and the projection system.
12. The lithographic apparatus of claim 11 , further comprising a fluid extraction system with an extraction opening in a surface of a fluid handling body to extract fluid into the fluid handling body, the fluid handling body being above the substrate table.
13. A substrate table comprising:
a structure having a recess;
a support configured to support a substrate, the support comprising:
a body having a first major side and a second major side opposing the first major side; and
a first set of one or more protrusions on the first major side, the first set of one or more protrusions configured to support the substrate,
wherein the support is removably supported in the recess using a second set of one or more protrusions at the second major side.
14. The table of claim 13 , further comprising a heat exchange device of the body, the heat exchange device configured to exchange heat with the body.
15. The table of claim 14 , wherein the heat exchange device comprises one or more channels to conduct a heat exchange fluid.
16. The table of claim 13 , wherein the structure has a surface arranged to be substantially co-planar with a plane defined by the substrate when supported on the tops of the first set of one or more protrusions.
17. A lithographic apparatus, comprising:
the table of claim 13 ; and
a projection system configured to project a beam of radiation onto a radiation-sensitive target portion of the substrate; and
a liquid supply system configured to supply liquid via an inlet with a liquid supply opening to a space between the table and the projection system.
18. A substrate holder arranged to support a substrate, the substrate holder comprising:
a body made of SiSiC and having a first major side and a second major side opposing the first major side;
a first set of one or more protrusions on the first major side, the first set of one or more protrusions configured to support the substrate; and
a second set of one or more protrusions on the second major side, the second set of one or more protrusions configured to support the body on a surface.
19. The substrate holder of claim 18 , wherein the body further comprises a heat exchange device.
20. A lithographic apparatus, comprising:
the holder of claim 18 ; and
a projection system configured to project a beam of radiation onto a radiation-sensitive target portion of the substrate; and
a liquid supply system configured to supply liquid via an inlet with a liquid supply opening to a space between the holder and the projection system.
21. The holder of claim 1 , wherein the heat exchange device comprises a heater and one or more channels to conduct a heat exchange fluid, the heater and the one or more channels both configured to thermally condition the holder and/or the substrate.
22. The holder of claim 1 , further comprising a temperature sensor configured to provide information about the substrate.
23. The holder of claim 19 , wherein the heat exchange device comprises a heater and one or more channels to conduct a heat exchange fluid, the heater and the one or more channels both configured to thermally condition the holder and/or the substrate.
24. The holder of claim 18 , further comprising a temperature sensor configured to provide information about the substrate.