IP Library › Granted Patent US 10,763,183
Granted Patent B2
US 10,763,183 · App. 16/318,537 · Granted Sep 1, 2020

Semiconductor device

Inventors: Naohiro Ogushi (Tokyo, JP); Koichi Taguchi (Tokyo, JP)
Assignee: Mitsubishi Electric Corporation
H01L23/055H01L24/48H01L24/73H01L2224/48091H01L2224/48155H01L2224/73265
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Quick Facts
Patent No.
US 10,763,183
App. No.
16/318,537
Granted
Sep 1, 2020
Kind
B2
Abstract

A case ( 6 ) surrounds a semiconductor chip ( 5 ). A case electrode ( 7 ) is attached to an upper face of the case ( 6 ). A wire ( 8 ) is connected to the semiconductor chip ( 5 ) and the case electrode ( 7 ). A first holding portion ( 10 ) presses down the case electrode ( 7 ) on the upper face of the case ( 6 ) outside a joint portion where the wire ( 8 ) is bonded to the case electrode ( 7 ). A second holding portion ( 11 ) presses down the case electrode ( 7 ) on the upper face of the case ( 6 ) inside the joint portion. A recess ( 12 ) is formed on the upper face of the case ( 6 ). The case electrode ( 7 ) is bent such as to fit into the recess ( 12 ). The second holding portion ( 11 ) is disposed inside the recess ( 12 ).

Claims (53)

1. A semiconductor device comprising:

a semiconductor chip;

a case surrounding the semiconductor chip;

a case electrode attached to an upper face of the case;

a wire connected to the semiconductor chip and the case electrode;

a first holding portion pressing down the case electrode on the upper face of the case outside a joint portion where the wire is bonded to the case electrode; and

a second holding portion pressing down the case electrode on the upper face of the case inside the joint portion,

wherein a recess is formed on the upper face of the case,

the case electrode is bent such as to fit into the recess, and

the second holding portion is disposed inside the recess.

2. The semiconductor device according to claim 1 , wherein the recess is spaced from an inner end face of the case.

3. The semiconductor device according to claim 1 , wherein a through hole is formed in a bent portion of the case electrode.

4. The semiconductor device according to claim 1 , wherein an upper face of the second holding portion is positioned at a height not greater than a height of an upper face of the joint portion of the case electrode.

5. The semiconductor device according to claim 1 , wherein the semiconductor chip is made of a wide-band-gap semiconductor having a bandgap wider than that of silicon.

6. A semiconductor device comprising:

a semiconductor chip;

a case surrounding the semiconductor chip;

a case electrode attached to an upper face of the case;

a wire connected to the semiconductor chip and the case electrode;

a first holding portion pressing down the case electrode on the upper face of the case outside a joint portion where the wire is bonded to the case electrode; and

a second holding portion pressing down the case electrode on the upper face of the case inside the joint portion,

wherein a recess is formed on the upper face of the case, and

the second holding portion is disposed inside the recess.

7. The semiconductor device according to claim 6 , wherein the recess is a through hole that is reduced in width downward.

8. The semiconductor device according to claim 7 , wherein the recess is a through hole having a trapezoidal cross-sectional shape.

9. The semiconductor device according to claim 6 , wherein an upper face of the second holding portion is positioned at a height not greater than a height of an upper face of the joint portion of the case electrode.

10. The semiconductor device according to claim 6 , wherein the semiconductor chip is made of a wide-band-gap semiconductor having a bandgap wider than that of silicon.

11. A semiconductor device comprising:

a semiconductor chip;

a case surrounding the semiconductor chip;

a case electrode attached to an upper face of the case; and

a wire connected to the semiconductor chip and the case electrode,

wherein a recess is formed on a side face of the case electrode, and

the case electrode is fixed to the case with case resin filled in the recess.

12. The semiconductor device according to claim 11 , wherein the semiconductor chip is made of a wide-band-gap semiconductor having a bandgap wider than that of silicon.

13. A semiconductor device comprising:

a semiconductor chip;

a case surrounding the semiconductor chip;

a case electrode attached to an upper face of the case;

a wire connected to the semiconductor chip and the case electrode;

a first holding portion pressing down the case electrode on the upper face of the case outside a joint portion where the wire is bonded to the case electrode; and

a second holding portion pressing down the case electrode on the upper face of the case inside the joint portion,

wherein the second holding portion is tapered along the wire.

14. The semiconductor device according to claim 13 , wherein the semiconductor chip is made of a wide-band-gap semiconductor having a bandgap wider than that of silicon.

15. A semiconductor device comprising:

a semiconductor chip;

a case surrounding the semiconductor chip;

a case electrode attached to an upper face of the case;

a wire connected to the semiconductor chip and the case electrode;

a first holding portion pressing down the case electrode on the upper face of the case outside a joint portion where the wire is bonded to the case electrode; and

a second holding portion pressing down the case electrode on the upper face of the case inside the joint portion,

wherein the second holding portion is adhesive.

16. The semiconductor device according to claim 15 , wherein the semiconductor chip is made of a wide-band-gap semiconductor having a bandgap wider than that of silicon.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2019
From: OGUSHI, NAOHIRO; TAGUCHI, KOICHI
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 048049/0979 →
Continuity (1)
Related Publication 20190318971A1 · Oct 17, 2019
Cited By (1)
US 12,456,708