IP Library › Granted Patent US 10,770,367
Granted Patent B2
US 10,770,367 · App. 16/159,745 · Granted Sep 8, 2020

Semiconductor apparatus, method for manufacturing the same and electric power conversion device

Inventors: Takuya Kitabayashi (Tokyo, JP); Hiroshi Yoshida (Tokyo, JP); Hidetoshi Ishibashi (Tokyo, JP); Daisuke Murata (Tokyo, JP)
Assignee: Mitsubishi Electric Corporation
H01L23/3142H01L23/02H01L23/12H01L23/492H01L23/585
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Quick Facts
Patent No.
US 10,770,367
App. No.
16/159,745
Granted
Sep 8, 2020
Kind
B2
Abstract

A semiconductor apparatus includes: a substrate including a circuit pattern on an upper surface side and a metal plate on a lower surface side; a semiconductor device joined to the circuit pattern via a conductive component; a case located to surround the substrate; a sealing material sealing the semiconductor device and the substrate in a section surrounded by the case; and a bonding agent bonding the case and the metal plate on a side face of the substrate.

Claims (30)

1. A semiconductor apparatus comprising:

a substrate including an insulator disposed between a circuit pattern on an upper surface side and a metal plate on a lower surface side;

a semiconductor device joined to the circuit pattern via a conductive component;

a case located to surround the substrate, a gap being between the case and a lateral side face of the substrate;

a sealing material sealing the semiconductor device and the substrate in a section surrounded by the case; and

a bonding agent bonding the case and the metal plate on the lateral side face of the substrate, the bonding agent extending along a bottom surface of the case and filling the gap between the case and the lateral side face of the substrate.

2. The semiconductor apparatus according to claim 1 , wherein a lower part of the case includes a protrusion that makes contact with an upper surface of the metal plate.

3. The semiconductor apparatus according to claim 1 , wherein a lower part of the case includes a step.

4. The semiconductor apparatus according to claim 2 , wherein a lower part of the case includes a step.

5. The semiconductor apparatus according to claim 1 , wherein the bonding agent covers a lower part of the case that is higher than the bottom surface of the case.

6. The semiconductor apparatus according to claim 2 , wherein the bonding agent covers the protrusion.

7. The semiconductor apparatus according to claim 3 , wherein the bonding agent covers the step.

8. The semiconductor apparatus according to claim 4 , wherein the bonding agent covers one or both of the protrusion and the step.

9. An electric power conversion device comprising:

a main conversion circuit including the semiconductor apparatus according to claim 1 , converting input power and outputting converted power; and

a control circuit outputting a control signal for controlling the main conversion circuit to the main conversion circuit.

10. The semiconductor apparatus of claim 1 , wherein the bonding agent includes a thermoplastic resin.

11. A semiconductor apparatus comprising:

a substrate including an insulator disposed between a circuit pattern on an upper surface side and a metal plate on a lower surface side;

a semiconductor device joined to the circuit pattern via a conductive component;

a case located to surround the substrate;

a sealing material sealing the semiconductor device and the substrate in a section surrounded by the case; and

a bonding agent bonding the case and the metal plate on a lateral side face of the substrate, the bonding agent covering a bottom surface of the case.

12. The semiconductor apparatus according to claim 11 , wherein a bottom surface of the bonding agent is coplanar with a bottom surface of the metal plate.

13. A semiconductor apparatus comprising:

a substrate including an insulator disposed between a circuit pattern on an upper surface side and a metal plate on a lower surface side;

a semiconductor device joined to the circuit pattern via a conductive component;

a case located to surround the substrate;

a sealing material sealing the semiconductor device and the substrate in a section surrounded by the case; and

a bonding agent covering a lower inner part, a lower outer part, and a lower surface of the case, bonding the lower inner part of the case and a lateral side face of the metal plate on a lateral side face of the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2018
From: KITABAYASHI, TAKUYA; YOSHIDA, HIROSHI; ISHIBASHI, HIDETOSHI; MURATA, DAISUKE
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 047156/0880 →
Priority Claims (1)
JP 2018-067818 · Mar 30, 2018 · national
Continuity (1)
Related Publication 20190304866A1 · Oct 3, 2019