Terahertz inspection for additively manufactured materials
Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.
1. An apparatus comprising:
an additive manufacturing device comprising a material deposition head;
a terahertz inspection device located proximate to the material deposition head;
said terahertz inspection device comprising a terahertz probe, said
terahertz probe comprising a thermal shield substantially enveloping the terahertz probe; and
wherein the terahertz inspection device comprises a lens, said lens selected to focus terahertz radiation to a predetermined distance from the terahertz inspection device.
2. The apparatus of claim 1 , wherein the additive manufacturing device is configured to form an additively manufactured build, said build comprising a plurality of individually deposited layers of material.
3. The apparatus of claim 1 , wherein the terahertz inspection device is configured to non-destructively inspect individual deposited layers of material.
4. The apparatus of claim 1 , wherein the terahertz inspection device is configured to inspect individual deposited layers of material substantially in real time during the depositing of the material layers.
5. The apparatus of claim 1 , further comprising a material deposition chamber, said chamber defined by a housing, and said material deposition chamber configured to house said material deposition device and said terahertz inspection device.
6. The apparatus of claim 1 , wherein the material deposition head is oriented within a first distance from the terahertz inspection device, said first distance ranging from about 0.5″ to about 2.0″.
7. The apparatus of claim 1 , wherein the terahertz inspection device comprises a monostatic terahertz probe.
8. The apparatus of claim 1 , wherein the terahertz inspection device comprises a bistatic terahertz probe.
9. The apparatus of claim 1 , wherein the thermal shield is made from a material comprising at least one of: a ceramic; sodium silicate; potassium silicate; calcium silicate; tantalum carbide; hafnium carbide; a high temperature bismaleimide resin-containing material; a high temperature polyimide containing material; or a fiberglass-containing material.
10. The apparatus of claim 1 , wherein the thermal shield is made from a material comprising a ceramic material.
11. A system comprising:
a housing;
an additive manufacturing device comprising a material deposition head, said material deposition head located within the housing, said material deposition head configured to deposit a plurality of material layers to form a part;
a terahertz inspection device located within the housing and further located proximate to the additive manufacturing device, said terahertz inspection device comprising a thermal shield substantially enveloping the terahertz inspection device; and
wherein the terahertz inspection device comprises a lens, said lens selected to focus terahertz radiation to a predetermined distance from the terahertz inspection device.
12. The system of claim 11 , wherein, the terahertz inspection device is configured to non-destructively inspect in substantially real time at least one deposited material layer during or immediately after the deposit of the at least one deposited material layer.
13. The system of claim 11 , wherein the plurality of material layers comprises a composite material.
14. The system of claim 11 , wherein the additive manufacturing device is in communication with a supply of feedstock material.
15. The system of claim 14 , wherein the feedstock material comprises at least one of ULTEM 9085; FDM Nylon 6, FDM Nylon 12CF, DFM Nylon 12, ULTEM 1010; a polyether ketone ketone or a polyphenylsulfone.
16. A method for additively manufacturing an additively manufactured part, the method comprising:
individually depositing a plurality of material layers from a material deposition head of an additive manufacturing device to form the part,
said additive manufacturing device comprising:
an additive manufacturing device comprising a material deposition head;
a terahertz inspection device located proximate to the material deposition head, said terahertz inspection device comprising a terahertz probe, said terahertz probe comprising a thermal shield substantially enveloping the terahertz probe;
non-destructively inspecting at least one material layer using terahertz energy, and further comprising:
directing terahertz energy from a terahertz inspection device to a location on or within the at least one material layer;
receiving terahertz energy from the at least one material layer;
detecting characteristics of the at least one material layer; and
wherein the terahertz inspection device comprises a lens, said lens selected to focus terahertz radiation to a predetermined distance from the terahertz inspection device.
17. The method of claim 16 , further comprising:
orienting the terahertz inspection device proximate to the material deposition head;
depositing at least one material layer at a temperature ranging from about 300° F. to about 450° F.;
substantially concurrently with the depositing of the plurality of material layers, nondestructively inspecting at least one material layer in real time; and
wherein, said terahertz inspection device is substantially enveloped in a thermal shield.
18. The method of claim 16 , further comprising:
detecting characteristics of the at least one material layer in real time during or immediately after depositing at least one material layer onto a build.
19. An additively manufactured part manufactured and inspected according to the method of claim 16 .
20. An apparatus comprising:
an additive manufacturing device comprising a material deposition head; and
a terahertz inspection device located proximate to the material deposition head;
said terahertz inspection device comprising a monostatic terahertz probe, said monstatic terahertz probe comprising a thermal shield substantially enveloping the monostatic terahertz probe.
21. An apparatus comprising:
an additive manufacturing device comprising a material deposition head; and
a terahertz inspection device located proximate to the material deposition head;
said terahertz inspection device comprising a bistatic terahertz probe, said bistatic terahertz probe comprising a thermal shield substantially enveloping the bistatic terahertz probe.