Delay-based residue stage
An analog-to-digital converter, comprising: a voltage to delay circuit having a voltage input, a threshold voltage input, a first output and a second output, wherein a leading edge of the first output is delayed, by a first delay magnitude, in relationship to a leading edge of the second output; and a first stage including: a first logic gate having a first input coupled to the first output of the voltage to delay circuit, a second input coupled to the second output of the voltage to delay circuit, and an output; and a first stage delay comparator having a first input coupled to the first output of the voltage to delay circuit, a second input coupled to the second output of the voltage to delay circuit, a sign signal output and a first stage delay comparator output, wherein the sign signal output represents whether the voltage input is greater than or less than the threshold voltage input. The analog-to-digital converter further includes a digital block having an input connected to the sign signal output of the delay comparator.
1. An analog-to-digital converter, comprising:
a voltage to delay circuit having a voltage input, a threshold voltage input, a first output and a second output, wherein a leading edge of the first output is delayed, by a first delay magnitude, in relationship to a leading edge of the second output;
a first stage including:
a first logic gate having a first input coupled to the first output of the voltage to delay circuit, a second input coupled to the second output of the voltage to delay circuit, and an output; and
a first stage delay comparator having a first input coupled to the first output of the voltage to delay circuit, a second input coupled to the second output of the voltage to delay circuit, a sign signal output and a first stage delay comparator output, wherein the sign signal output represents whether the voltage input is greater than or less than the threshold voltage input; and
a digital block having an input connected to the sign signal output of the delay comparator.
2. The analog-to-digital converter of claim 1 , wherein the first delay magnitude represents a magnitude of the voltage input in relationship to the threshold voltage input.
3. The analog-to-digital converter of claim 1 , wherein the first delay magnitude is greater the closer the magnitude of the voltage input is to the magnitude of the threshold input voltage.
4. The analog-to-digital converter of claim 1 , wherein the sign signal output represents whether the first output of the voltage to delay circuit is received by the first stage delay comparator before or after the second output of the voltage to delay circuit.
5. The analog-to-digital converter of claim 1 , wherein the first stage generates a single bit of digital information.
6. The analog-to-digital converter of claim 1 , further including a second stage having a first input coupled to the output of the first logic gate, a second input coupled to the first stage delay comparator output, a first output and a second output.
7. The analog-to-digital converter of claim 6 , wherein the second stage generates a single bit of digital information.
8. The analog-to-digital converter of claim 1 , further including a clock coupled to the voltage to delay circuitry and the digital block.
9. An analog-to-digital converter, comprising:
a voltage to delay circuit having a voltage input, a threshold voltage input, a first output and a second output, wherein the first output or the second output is delayed, by a first delay magnitude, in relationship to the other;
a zero-level stage including:
a plurality of delays, each having an input coupled to the second output of the voltage to delay circuit and an output;
a plurality of delay comparators, each having a first input coupled to the first output of the voltage to delay circuit, a second input coupled to the output of one of the delays, a sign signal output and an output line; and
a combiner having a plurality of inputs, each coupled to the output line of a delay comparator, a first output coupled to the first output of the zero-level stage and a second output coupled to the second output of the zero-level stage;
a first stage including:
a first stage logic gate having a first input coupled to the first output of the combiner, a second input coupled to the second output of the combiner; and
a first stage delay comparator having a first input coupled to the first output of the combiner, a second input coupled to the second output of the combiner, a first stage sign signal output and a first stage delay comparator output; and
a digital block having an input connected to the sign signal output of each of the plurality of delay comparators and the first stage sign signal output.
10. The analog-to-digital converter of claim 9 , wherein each delay has a different delay duration.
11. The analog-to-digital converter of claim 9 , wherein the first delay magnitude is related to the magnitude of the voltage input in relationship to the threshold voltage input.
12. The analog-to-digital converter of claim 9 , wherein each sign signal output is related to a difference in timing between the first input and the second input of the delay comparator in which the sign signal output is connected to.
13. The analog-to-digital converter of claim 9 , wherein the first stage generates a single bit of digital information.
14. The analog-to-digital converter of claim 9 , further including a second stage having a first input coupled to the output of the first logic gate, a second input coupled to the first stage delay comparator output, a first output and a second output.
15. The analog-to-digital converter of claim 14 , wherein the second stage generates a single bit of digital information.
16. The analog-to-digital converter of claim 9 , further including a clock coupled to the voltage to delay circuitry and the digital block.