Granted Patent B2

US 12,542,563 · App. 18/619,537 · Granted Feb 3, 2026

Inventors: Mishab I (Manjeri, IN); Viswanathan Nagarajan (Bangalore, IN); Himanshu Varshney (Bangalore, IN); Mujammil Patel (Mumbai, IN); Karan Vaity (Bangalore, IN)

Assignee: TEXAS INSTRUMENTS INCORPORATED

H03M1/464H03M1/06H03M1/1009H03M1/1014H03M1/36

Abstract

Claims (135)

1 . A method, comprising:

converting a first analog level plus a first offset to a first digital value using a first delay domain analog-to-digital converter (ADC);

converting the first analog level plus a second offset to a second digital value using a second delay domain ADC;

computing a first difference value between the first digital value and the second digital value;

converting the first analog level minus the first offset to a third digital value using the first delay domain ADC;

converting the first analog level plus the second offset to a fourth digital value using the second delay domain ADC;

computing a second difference value between the third digital value and the fourth digital value;

computing a third difference between the first and second difference values; and

storing, in a memory associated with the first delay domain ADC, an adjustment corresponding to the first analog level and based on the third difference.

2 . The method of claim 1 , further comprising:

converting a reference digital value to the first analog level using a digital-to-analog converter (DAC).

3 . The method of claim 1 , wherein converting the first analog level plus a first offset to a first digital value comprises:

adding the first offset and the first analog level; and

applying the added first offset and first analog level to an input of the first ADC;

wherein converting a first analog level plus a second offset to a second digital value comprises:

adding the second offset and the first analog level; and

applying the added second offset and first analog level to an input of the second ADC;

and wherein converting a first analog level minus the first offset to a third digital value comprises:

adding a negative of the first offset and the first analog level; and

applying the added negative of the first offset and first analog level to an input of the first ADC.

4 . The method of claim 3 , wherein the converting of the first analog level plus the first offset to the first digital value and the converting of the first analog level plus the second offset to the second digital value are performed at substantially the same time;

wherein converting a first analog level plus the second offset to a fourth digital value comprises:

adding the second offset and the first analog level; and

applying the added second offset and first analog level to an input of the second ADC;

and wherein the converting of the first analog level minus the first offset to the third digital value and the converting of the first analog level plus the second offset to the fourth digital value are performed at substantially the same time.

5 . The method of claim 1 , wherein the first delay domain ADC includes a look-up-table (LUT) memory storing correction values associated with a plurality of analog levels;

wherein storing an adjustment comprises:

applying the adjustment to a correction value stored in the LUT memory associated with the first analog level.

6 . The method of claim 5 , further comprising:

repeating the converting and computing operations;

applying an incremental adjustment based on the third difference obtained in the repeated computing operations to the correction value stored in the LUT memory associated with the first analog level; and

again repeating the converting and computing operations and applying the incremental adjustment until a convergence criterion is satisfied.

7 . The method of claim 1 , wherein converting to the first digital value and converting to the second digital value are each performed for each of a plurality of analog levels including the first analog level;

wherein the computing of the first difference value is performed over the plurality of analog levels including the first analog level;

wherein converting to the third digital value and converting to the fourth digital value are each performed for each of the plurality of analog levels including the first analog level;

wherein the computing of the second difference value is performed over the plurality of analog levels including the first analog level;

the method further comprising:

integrating the third differences for each of the plurality of analog levels including the first analog level into an integral non-linearity (INL) estimate;

and wherein the adjustment for the first delay domain ADC is based on the INL estimate and corresponds to each of the plurality of analog levels including the first analog level.

8 . The method of claim 7 , wherein the computing of the first difference value comprises:

accumulating differences between the first and second digital values over the plurality of analog levels including the first analog level;

and wherein the computing of the second difference value comprises:

accumulating differences between the third and fourth digital values over the plurality of analog levels including the first analog level.

9 . The method of claim 7 , further comprising:

detecting a rate of change of error between the first and second differences over the plurality of analog levels; and

applying a correction to the adjustment for the first delay domain ADC based on the detected rate of change of error.

10 . The method of claim 1 , further comprising:

converting a second analog level plus a third offset to a fifth digital value using the second delay domain ADC;

converting the second analog level with a fourth offset to a sixth digital value using the first delay domain ADC;

computing a fourth difference value between the fifth digital value and the sixth digital value;

converting the second analog level minus the third offset to a seventh digital value using the second delay domain ADC;

converting the second analog level with the fourth offset to an eighth digital value using the first delay domain ADC;

computing a fifth difference value between the seventh digital value and the eighth digital value;

computing a sixth difference between the fourth and fifth difference values; and

storing, in the memory, an adjustment for the second delay domain ADC, the adjustment corresponding to the second analog level and based on the sixth difference.

11 . The method of claim 1 , further comprising:

performing the converting, and computing steps over a range of analog levels to obtain third difference values corresponding to the range of analog levels;

obtaining a fit coefficient corresponding to a fit of the third difference values to a known error profile of one or more analog stages in the first delay domain ADC;

adjusting an analog setting responsive to the fit coefficient;

repeating the performing, obtaining, and adjusting over a plurality of iterations; and

adjusting analog parameters in the one or more analog stages responsive to the adjusted analog setting.

12 . A circuit, comprising:

a digital-to-analog converter (DAC), having an output;

a first analog-to-digital converter (ADC) of a delay-domain type, having an input coupled to the DAC, and having an output;

a first look-up-table, having an input coupled to the output of the first ADC, and configured to store correction values for the first ADC;

a second ADC of a delay-domain type, having an input coupled to the output of the DAC, and having an output; and

logic circuitry, configured to modify contents of the first look-up table by performing a plurality of operations comprising:

controlling the first ADC to convert a first analog level from the DAC plus a first offset to a first digital value;

controlling the second ADC to convert the first analog level plus a second offset to a second digital value;

computing a first difference value between the first digital value and the second digital value;

controlling the first ADC to convert the first analog level minus the first offset to a third digital value;

controlling the second ADC to convert the first analog level plus the second offset to a fourth digital value;

computing a second difference value between the third digital value and the fourth digital value;

computing a third difference between the first and second difference values; and

based on the third difference, adjusting a correction value associated with the first analog level in the first look-up table.

13 . The circuit of claim 12 , further comprising:

a first input multiplexer, having an input coupled to the output of the DAC, an input coupled to receive an input signal, and an output;

a second input multiplexer, having an input coupled to the output of the DAC, an input coupled to receive an input signal, and an output;

a first adder, having an input coupled to the output of the first input multiplexer, an input coupled to receive a first offset signal, and an output coupled to the input of the first ADC; and

a second adder, having an input coupled to the output of the first input multiplexer, an input coupled to receive a second offset signal, and an output coupled to the input of the second ADC.

14 . The circuit of claim 12 , wherein the control circuitry is configured to control the first ADC to convert the first analog level plus the first offset to the first digital value and controls the second ADC to convert the first analog level plus the second offset to the second digital value at substantially the same time;

and wherein the control circuitry is configured to control the first ADC to convert the first analog level minus the first offset to the third digital value and controls the second ADC to convert the first analog level plus the second offset to the fourth digital value at substantially the same time.

15 . The circuit of claim 12 , wherein the control circuitry is configured to:

control the first and second ADCs to convert to the first and second digital values, respectively, for each of a plurality of analog levels including the first analog level;

compute the first difference value over the plurality of analog levels including the first analog level;

control the first and second ADCs to convert to the third and fourth digital values, respectively, for each of the plurality of analog levels including the first analog level;

compute the second difference value over the plurality of analog levels including the first analog level;

compute the third difference value over the plurality of analog levels including the first analog level;

integrate the third differences for each of the plurality of analog levels including the first analog level into an integral non-linearity (INL) estimate;

adjust correction values for each of the plurality of analog levels including the first analog level based on the INL estimate.

16 . The circuit of claim 15 , wherein the control circuitry is configured to compute the first difference value by:

accumulating differences between the first and second digital values over the plurality of analog levels including the first analog level;

and wherein the control circuitry is configured to compute the second difference value by:

accumulating differences between the third and fourth digital values over the plurality of analog levels including the first analog level.

17 . The circuit of claim 15 , wherein the control circuitry is further configured to:

detect a rate of change of error between the first and second differences over the plurality of analog levels; and

further adjust the correction values for each of the plurality of analog levels including the first analog level based on the detected rate of change of error.

18 . An analog-to-digital converter, comprising:

a first half analog-to-digital converter (HADC) of a delay domain type;

a first look-up-table (LUT) memory associated with the first HADC, and configured to store correction values associated with a plurality of analog levels;

a second HADC of the delay domain type;

control logic configured to adjust correction values associated with the plurality of analog levels in the first LUT memory by a plurality of operations comprising, for each of the plurality of analog levels:

controlling the first HADC to convert the analog level plus a first offset to a first digital value;

controlling the second HADC to convert the analog level plus a second offset to a second digital value;

computing a first difference value between the first digital value and the second digital value;

controlling the first HADC to convert the analog level minus the first offset to a third digital value;

controlling the second HADC to convert the analog level plus the second offset to a fourth digital value;

computing a second difference value between the third digital value and the fourth digital value;

computing a third difference between the first and second difference values; and

based on the third difference, adjusting a correction value associated with the analog level in the first LUT memory.

19 . The analog-to-digital converter of claim 18 , further comprising:

a second LUT memory associated with the second HADC, and configured to store correction values associated with the plurality of analog levels;

and wherein the control logic is further configured to adjust correction values associated with the plurality of analog levels in the second LUT memory by a plurality of operations comprising, for each of the plurality of analog levels:

controlling the second HADC to convert the analog level plus a third offset to a fifth digital value;

controlling the first HADC to convert the analog level with a fourth offset to a sixth digital value;

computing a fourth difference value between the fifth digital value and the sixth digital value;

controlling the first ADC to convert the analog level minus the third offset to a seventh digital value;

controlling the second ADC to convert the analog level with the fourth offset to an eighth digital value;

computing a fifth difference value between the seventh digital value and the eighth digital value;

computing a sixth difference between the fourth and fifth difference values; and

based on the sixth difference, adjusting a correction value associated with the analog level in the second LUT memory.

20 . The analog-to-digital converter of claim 18 , wherein the control logic is configured to control the first HADC to convert the analog level plus the first offset to the first digital value and controls the second HADC to convert the analog level plus the second offset to the second digital value at substantially the same time;

and wherein the control logic is configured to control the first HADC to convert the analog level minus the first offset to the third digital value and controls the second HADC to convert the analog level plus the second offset to the fourth digital value at substantially the same time.

21 . The analog-to-digital converter of claim 18 , wherein the control logic is further configured to:

detect a rate of change of error between the first and second differences over a plurality of analog input values; and

further adjust the correction value based on the detected rate of change of error.

22 . The analog-to-digital converter of claim 18 , wherein the first HADC comprises:

a plurality of analog stages coupled in a sequence;

digital circuitry having inputs coupled to digital outputs of the plurality of analog stages, and having one or more adjustment outputs coupled to at least one of the plurality of analog stages;

wherein the control logic is further configured to:

performing the controlling and computing steps over a range of analog levels to obtain third difference values corresponding to the range of analog levels;

obtaining a fit coefficient corresponding to a fit of the third difference values to a known error profile of one or more of the analog stages;

adjusting an analog setting responsive to the fit coefficient;

repeating the performing, obtaining, and adjusting over a plurality of iterations; and

operating the digital circuitry to adjust analog parameters in the one or more analog stages responsive to the adjusted analog setting.

Assignments (1)

Continuity (1)

References Cited (24)