IP Library › Granted Patent US 10,788,376
Granted Patent B2
US 10,788,376 · App. 15/717,924 · Granted Sep 29, 2020

Apparatus for sensing temperature in electronic circuitry and associated methods

Inventors: Mohamed M. Elsayed (Austin, TX); Kenneth W. Fernald (Cedar Park, TX)
Assignee: Silicon Laboratories Inc.
G01K7/02G01K7/01G05F1/56G05F3/30H03K5/24G01K2219/00
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Quick Facts
Patent No.
US 10,788,376
App. No.
15/717,924
Granted
Sep 29, 2020
Kind
B2
Abstract

An apparatus includes a temperature measurement circuit. The temperature measurement circuit includes a bandgap circuit including an amplifier having an offset voltage that is compensated by using a set of trimming bits. The bandgap circuit provides first and second voltages related to a temperature to be measured. The temperature measurement circuit further includes a measuring circuit coupled to receive the first and second voltages. The measuring circuit further includes a comparator coupled to receive the first and second voltages, wherein the measuring circuit derives a temperature measurement from the first and second voltages.

Claims (26)

1. An apparatus, comprising:

a temperature measurement circuit, comprising:

a bandgap circuit including an amplifier having an offset voltage that is compensated by using a set of trimming bits, the bandgap circuit providing first and second voltages related to a temperature to be measured; and

a measuring circuit coupled to receive the first and second voltages, the measuring circuit including a comparator coupled to receive the first and second voltages and to derive a temperature measurement from the first and second voltages.

2. The apparatus according to claim 1 , wherein the comparator is coupled to receive a set of voltages at a first input, wherein the set of voltages comprises the first and second voltages.

3. The apparatus according to claim 2 , wherein the set of voltages further comprises third and fourth voltages, wherein the third and fourth voltages have fixed values.

4. The apparatus according to claim 3 , further comprising a multiplexer (MUX) coupled to provide the set of voltages to the first input of the comparator.

5. The apparatus according to claim 2 , further comprising a ramp generator circuit to provide a ramp voltage to a second input of the comparator.

6. The apparatus according to claim 5 , further comprising at least one counter coupled to a clock source, the at least one counter providing a set of count values depending on an output signal of the comparator.

7. The apparatus according to claim 6 , wherein the set of count values includes first and second count values corresponding to the first and second voltages.

8. The apparatus according to claim 7 , wherein the temperature measurement is derived from the first and second count values.

9. The apparatus according to claim 7 , wherein the set of count values includes third and fourth count values corresponding to fixed voltages.

10. A method of measuring a temperature, the method comprising:

compensating an offset voltage of an amplifier by using a set of trimming bits;

generating first and second voltages related to the temperature, by using a bandgap circuit; and

using the first and second voltages to derive the temperature by generating count values corresponding to the first and second voltages.

11. The method according to claim 10 , wherein compensating the offset voltage of the amplifier by using the set of trimming bits is performed in a first mode of operation of the bandgap circuit.

12. The method according to claim 11 , wherein generating first and second voltages related to the temperature, by using the bandgap circuit, is performed in a second mode of operation of the bandgap circuit.

13. The method according to claim 10 , wherein generating count values further comprises generating count values corresponding to first and second fixed voltages, and wherein the temperature is derived by using the count values corresponding to the first and second voltages and the count values corresponding to the first and second fixed voltages.

14. The method according to claim 13 , wherein the count values are generated by counting cycles of a clock signal.

15. The method according to claim 13 , wherein generating count values further comprises comparing the first and second voltages and the first and second fixed voltages with a ramp voltage.

16. The method according to claim 15 , comparing the first and second voltages and the first and second fixed voltages with the ramp voltage comprises using a comparator to perform the comparing.

17. The method according to claim 16 , wherein comparing the first and second voltages and the first and second fixed voltages with the ramp voltage comprises using a multiplexer (MUX) to selectively provide the first and second voltages and the first and second fixed voltages to the comparator.

18. The method according to claim 17 , wherein using the MUX to selectively provide the first and second voltages and the first and second fixed voltages to the comparator comprises using a controller to control select signals of the MUX.

19. The method according to claim 18 , wherein using the controller to control select signals of the MUX comprises using an output signal of the comparator.

20. The method according to claim 13 , wherein using the count values corresponding to the first and second voltages and the count values corresponding to the first and second fixed voltages comprises using a set of counters to count cycles of a clock signal in response to corresponding enable signals.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2017
From: ELSAYED, MOHAMED M.; FERNALD, KENNETH W.
To: SILICON LABORATORIES INC.
Reel/Frame 043720/0469 →
Continuity (1)
Related Publication 20190094079A1 · Mar 28, 2019