Semiconductor device and method for manufacturing the same
View Patent ↗Many of the physical properties of a silicon semiconductor have already been understood, whereas many of the physical properties of an oxide semiconductor have been still unclear. In particular, an adverse effect of an impurity on an oxide semiconductor has been still unclear. In view of the above, a structure is disclosed in which an impurity that influences electrical characteristics of a semiconductor device including an oxide semiconductor layer is prevented or is eliminated. A semiconductor device which includes a gate electrode, an oxide semiconductor layer, and a gate insulating layer provided between the gate electrode and the oxide semiconductor layer and in which the nitrogen concentration in the oxide semiconductor layer is 1×10 20 atoms/cm 3 or less is provided.
1. A semiconductor device comprising:
a substrate;
a gate electrode over the substrate;
a gate insulating layer over the gate electrode;
an oxide semiconductor layer over the gate insulating layer;
a pair of contact electrodes over and in contact with the oxide semiconductor layer; and
an insulating layer over the oxide semiconductor layer and the pair of contact electrodes,
wherein the pair of contact electrodes are in contact with a side surface of the oxide semiconductor layer,
wherein the oxide semiconductor layer comprises a channel formation region, and
wherein a nitrogen concentration in the channel formation region is 1×10 20 atoms/cm 3 or less.
2. The semiconductor device according to claim 1 , further comprising a channel protective layer over and in contact with the oxide semiconductor layer,
wherein the pair of contact electrodes is over the oxide semiconductor layer and the channel protective layer.
3. The semiconductor device according to claim 1 , wherein a hydrogen concentration in the oxide semiconductor layer is 6×10 18 atoms/cm 3 or less.
4. The semiconductor device according to claim 1 , wherein the oxide semiconductor layer is in an oxygen-excess state.
5. The semiconductor device according to claim 1 , wherein the oxide semiconductor layer comprises indium, gallium, and zinc.
6. The semiconductor device according to claim 1 , wherein the insulating layer is an oxide insulating layer and in contact with part of the oxide semiconductor layer between the pair of contact electrodes.
7. The semiconductor device according to claim 1 , wherein each of the pair of contact electrodes comprises a metal film.
8. A semiconductor device comprising:
a substrate;
an oxide semiconductor layer over the substrate;
a pair of contact electrodes over and in contact with the oxide semiconductor layer;
a gate insulating layer over the oxide semiconductor layer and the pair of contact electrodes;
a gate electrode over the gate insulating layer;
wherein the pair of contact electrodes are in contact with a side surface of the oxide semiconductor layer,
wherein the oxide semiconductor layer comprises a channel formation region, and
wherein a nitrogen concentration in the channel formation region is 1×10 20 atoms/cm 3 or less.
9. The semiconductor device according to claim 8 , wherein a hydrogen concentration in the oxide semiconductor layer is 6×10 18 atoms/cm 3 or less.
10. The semiconductor device according to claim 8 , wherein the oxide semiconductor layer is in an oxygen-excess state.
11. The semiconductor device according to claim 8 , wherein the oxide semiconductor layer comprises indium, gallium, and zinc.
12. The semiconductor device according to claim 8 , wherein the gate electrode overlaps with the pair of contact electrodes.
13. The semiconductor device according to claim 8 , wherein each of the pair of contact electrodes comprises a metal film.