IP Library › Granted Patent US 10,804,877
Granted Patent B2
US 10,804,877 · App. 15/661,468 · Granted Oct 13, 2020

Film bulk acoustic wave resonator (FBAR) having stress-relief

Inventors: Richard C. Ruby (Menlo Park, CA); Suresh Sridaran (Fort Collins, CO)
Assignee: Avago Technologies International Sales Pte. Limited
H03H9/173H03H9/132H03H9/171H03H9/54
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Quick Facts
Patent No.
US 10,804,877
App. No.
15/661,468
Granted
Oct 13, 2020
Kind
B2
Abstract

An acoustic resonator structure comprises: a substrate comprising a cavity having a plurality of sides; a first electrode disposed over the cavity; a first connection portion that connects to the first electrode over only one side of the plurality of sides of the cavity; a piezoelectric layer disposed over at least a portion of the first electrode; a second electrode disposed over the piezoelectric layer; and a second connection portion that connects to the second electrode over only the one side of the plurality of sides. The second connection portion does not overlap the first connection portion, and a contacting overlap of the first electrode, the piezoelectric layer and the second electrode provides an active area of the acoustic resonator.

Claims (41)

1. A film bulk acoustic resonator (FBAR) structure comprising:

a substrate comprising a cavity having a plurality of sides and a bottom surface, wherein the bottom surface comprises a first portion and a second portion;

a first electrode disposed over the cavity;

a first connection portion that connects to the first electrode over only one side of the plurality of sides of the cavity;

a piezoelectric layer disposed over at least a portion of the first electrode;

a second electrode disposed over the piezoelectric layer; and

a second connection portion that connects to the second electrode over only the one side of the plurality of sides that is the same side over which the first connection portion connects to the first electrode, the second connection portion not overlapping the first connection portion, wherein a contacting overlap of the first electrode, the piezoelectric layer and the second electrode provides an active area of the FBAR;

wherein at least a portion of the first electrode, the piezoelectric layer, and the second electrode are suspended over the first portion of the bottom surface and at least one of the first electrode, the piezoelectric layer, or the second electrode extend up to the second portion of the bottom surface from the one side of the plurality of sides exposing the second portion of the bottom surface.

2. The FBAR structure of claim 1 , wherein the piezoelectric layer does not exist between the first and second connection portions.

3. The FBAR structure of claim 1 , wherein the active area is suspended over the cavity and does not extend over any of the sides.

4. The FBAR structure of claim 1 , wherein the first electrode comprises a plurality of edges, and the piezoelectric layer extends past each of the plurality of edges of the first electrode.

5. The FBAR structure of claim 1 , wherein the piezoelectric layer comprises a plurality of edges, and the first electrode extends past each of the plurality of edges of the piezoelectric layer.

6. The FBAR structure of claim 1 , wherein the one side of the plurality of sides of the cavity has a length that is substantially less than respective lengths of other sides of the plurality of sides of the cavity.

7. The FBAR structure of claim 6 , wherein the one side of the plurality of sides of the cavity exists in a recess in the cavity.

8. The FBAR structure of claim 6 , wherein the length of the one side is in a range of approximately 30% to approximately 80% of the respective lengths of the other sides.

9. The FBAR structure of claim 4 , wherein the piezoelectric layer extends past each of the plurality of edges of the first electrode by a distance in a range of approximately 1.0 μm to approximately 10.0 μm.

10. The FBAR structure of claim 1 , wherein the piezoelectric layer comprises a plurality of edges, and the first electrode extends past each of the plurality of edges of the piezoelectric layer by a distance in a range of approximately 0.5 μm to approximately 10.0 μm.

11. The FBAR structure of claim 6 , wherein a recess exists in the one side of the plurality of sides of the cavity has a width in a range of approximately 1.0 μm to approximately 20.0 μm.

12. The FBAR structure of claim 1 , further comprising a bridge connecting the second electrode to the second connection portion.

13. The FBAR structure of claim 12 , wherein a gap is provided beneath the bridge.

14. The FBAR structure of claim 13 , wherein the gap is filled with a non-etchable borosilicate glass (NEBSG).

15. The FBAR structure of claim 13 , wherein the gap is filled with air.

16. An electrical filter comprising a plurality of FBAR structures, at least one of the plurality of FBAR structures comprising:

a substrate comprising a cavity having a plurality of sides and a bottom surface, wherein the bottom surface comprises a first portion and a second portion;

a first electrode disposed over the cavity;

a first connection portion that connects to the first electrode over only one side of the plurality of sides of the cavity;

a piezoelectric layer disposed over at least a portion of the first electrode;

a second electrode disposed over the piezoelectric layer; and

a second connection portion that connects to the second electrode over only the one side of the plurality of sides that is the same side over which the first connection portion connects to the first electrode, the second connection portion not overlapping the first connection portion, wherein a contacting overlap of the first electrode, the piezoelectric layer and the second electrode provides an active area of the FBAR;

wherein at least a portion of the first electrode, the piezoelectric layer, and the second electrode are suspended over the first portion of the bottom surface and at least one of the first electrode, the piezoelectric layer, or the second electrode extend up to the second portion of the bottom surface from the one side of the plurality of sides exposing the second portion of the bottom surface.

17. The electrical filter of claim 16 , wherein the plurality of FBAR structures are electrically connected to provide a ladder filter.

18. The electrical filter of claim 16 , wherein the plurality of FBAR structures are electrically connected to provide a lattice filter.

19. An electronic circuit comprising:

a substrate comprising a cavity having a plurality of sides and a bottom surface, wherein the bottom surface comprises a first portion and a second portion;

a first electrode disposed over the cavity;

a first connection portion that connects to the first electrode over at least one side of the plurality of sides of the cavity;

a piezoelectric layer disposed over at least a portion of the first electrode;

a second electrode disposed over the piezoelectric layer; and

a second connection portion that connects to the second electrode over at least one side of the plurality of sides of the cavity, wherein a contacting overlap of the first electrode, the piezoelectric layer and the second electrode provides an active area;

wherein at least a portion of the first electrode, the piezoelectric layer, and the second electrode are suspended over the first portion of the bottom surface and at least one of the first electrode, the piezoelectric layer, or the second electrode extend up to the second portion of the bottom surface exposing the second portion of the bottom surface.

20. The electronic circuit of claim 19 , wherein the first electrode, the piezoelectric layer, and the second electrode form a first area, wherein a second area of the bottom surface is greater than the first area.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF THE MERGER AND APPLICATION NOS. 13/237,550 AND 16/103,107 FROM THE MERGER PREVIOUSLY RECORDED ON REEL 047231 FRAME 0369. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 8, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048549/0113 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047231/0369 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2017
From: RUBY, RICHARD C; SRIDARAN, SURESH
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 043118/0375 →
Continuity (3)
Continuation In Part 14159518 · Jan 21, 2014
Continuation In Part 15449276 · Mar 3, 2017
Related Publication 20170338799A1 · Nov 23, 2017
Cited By (1)
US 12,455,222