IP Library Granted Patent US 10,811,461
Granted Patent B2
US 10,811,461 · App. 16/461,334 · Granted Oct 20, 2020

Access transmission gate

Inventors: Abhishek A. Sharma (Hillsboro, OR); Ravi Pillarisetty (Portland, OR); Van H. Le (Beaverton, OR); Gilbert W. Dewey (Beaverton, OR)
Assignee: Intel Corporation
H01L27/2436H01L21/823828H01L21/823857H01L25/0657H01L27/0922
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Quick Facts
Patent No.
US 10,811,461
App. No.
16/461,334
Granted
Oct 20, 2020
Kind
B2
Abstract

Substrates, assemblies, and techniques for a transmission gate that includes an n-type back end transistor and a p-type back end transistor in parallel with the n-type back end transistor. The transmission gate can be on a non-silicon substrate and include a second gate, a p-type semiconducting layer over the second gate, an n-type semiconducting layer over the p-type semiconducting layer, a bit line over the n-type semiconducting layer, a first gate over the n-type semiconducting layer, and a source line over the n-type semiconducting layer. The transmission gate may be coupled to a memory element.

Claims (46)

1. An apparatus, comprising:

a transmission gate, wherein the transmission gate includes:

an n-type back-end transistor; and

a p-type back-end transistor in parallel with the n-type back-end transistor.

2. The apparatus of claim 1 , wherein the transmission gate is on a non-silicon substrate.

3. The apparatus of claim 2 , wherein the transmission gate is over a logic element.

4. The apparatus of claim 1 , wherein the transmission gate includes:

a second gate;

a p-type semiconducting layer over the second gate;

an n-type semiconducting layer over the p-type semiconducting layer;

a bit line over the n-type semiconducting layer;

a first gate over the n-type semiconducting layer; and

a source line over the n-type semiconducting layer.

5. The apparatus of claim 4 , wherein a dielectric is between the second gate and the p-type semiconducting layer.

6. The apparatus of claim 4 , wherein a dielectric insulates the first gate from the bit line, source line, and the n-type semiconducting layer.

7. The apparatus of claim 1 , wherein the transmission gate is coupled to a memory element.

8. The apparatus of claim 7 , wherein the memory element is resistive random access memory (RRAM).

9. A computing device, comprising:

a memory device including a memory element coupled to a transmission gate, wherein the transmission gate includes:

an n-type back-end transistor; and

a p-type back-end transistor in parallel with the n-type back-end transistor.

10. The computing device of claim 9 , wherein the transmission gate is on a non-silicon substrate.

11. The computing device of claim 9 , wherein the transmission gate is over a logic element.

12. The computing device of claim 9 , wherein the transmission gate includes:

a second gate;

a p-type semiconducting layer over the second gate;

an n-type semiconducting layer over the p-type semiconducting layer;

a bit line over the n-type semiconducting layer;

a first gate over the n-type semiconducting layer; and

a source line over the n-type semiconducting layer.

13. The computing device of claim 9 , wherein the memory element is resistive random access memory (RRAM).

14. An integrated circuit (IC) die, comprising:

a non-silicon substrate;

a transmission gate on top of the non-silicon substrate, wherein the transmission gate includes:

an n-type back-end transistor; and

a p-type back-end transistor in parallel with the n-type back-end transistor.

15. The IC die of claim 14 , wherein the transmission gate is over a logic element.

16. The IC die of claim 14 , wherein the transmission gate includes:

a second gate;

a p-type semiconducting layer over the second gate;

an n-type semiconducting layer over the p-type semiconducting layer;

a bit line over the n-type semiconducting layer;

a first gate over the n-type semiconducting layer; and

a source line over the n-type semiconducting layer.

17. The IC die of claim 14 , wherein the transmission gate is coupled to a memory element.

18. The IC die of claim 17 , wherein the memory element is resistive random access memory (RRAM).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2019
From: SHARMA, ABHISHEK A.; PILLARISETTY, RAVI; LE, VAN H.; DEWEY, GILBERT W.
To: INTEL CORPORATION
Reel/Frame 049189/0427 →
Continuity (1)
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