Level and surface temperature gauge
A level and surface temperature gauge includes a housing structure, a level scanner, and a temperature scanner). The level scanner is supported by the housing structure and is configured to generate surface level measurements of a process material surface at a plurality of locations on the surface. The temperature scanner is supported by the housing structure and is configured to generate temperature measurements of the process material surface at a plurality of locations on the surface.
1. A level and surface temperature gauge comprising:
a housing structure;
a level scanner supported by the housing structure and configured to generate surface level measurements of a plurality of locations on the surface of a process material surface formed of solids; and
a temperature scanner supported by the housing structure and configured to generate temperature measurements of the process material surface at a plurality of locations on the surface,
wherein the temperature scanner includes a thermographic imaging device comprising:
optics;
an array of infrared detectors each configured to generate an infrared level signal based on infrared light received by the infrared detector through the optics; and
temperature measurement circuitry configured to generate the temperature measurements based on the infrared level signals.
2. The gauge of claim 1 , wherein; the level scanner includes a phased-array level gauge system comprising:
a plurality of acoustic antennas, each configured to transmit acoustic signals toward the process material surface and receive echo signals corresponding to reflections of the acoustic signals from the process material surface; and
level measurement circuitry configured to generate the level measurements based on the received echo signals.
3. The gauge of claim 2 , further comprising a controller configured to communicate the level measurements and the temperature measurements to a computing device using communications circuitry.
4. The gauge of claim 3 , wherein:
each of the temperature measurements includes a temperature and a location on the material surface corresponding to the temperature; and
each of the level measurements includes a level and a location on the material surface corresponding to the level.
5. The gauge of claim 1 , further comprising a surround extending from the housing structure, wherein the optics of the thermographic imaging device are supported at a proximal end of the surround and are configured to receive the infrared light through an opening at a distal end of the surround.
6. The gauge of claim 5 , wherein the surround is conically shaped and tapers toward the proximal end.
7. The gauge of claim 5 , further comprising a dust purging device configured to purge dust from the surround.
8. The gauge of claim 7 , wherein the dust purging device includes a vibrator attached to the surround.
9. The gauge of claim 8 , wherein the thermographic imaging device is isolated from vibrations generated by the vibrator.
10. The gauge of claim 7 , wherein the dust purging device includes an air purging system including a nozzle configured to direct a flow of air into an interior of the surround.
11. A method comprising:
installing a level and surface temperature gauge on a process vessel containing a process material formed of solids, the gauge comprising:
a housing structure attached the process vessel;
a level scanner supported by the housing structure; and
a temperature scanner supported by the housing structure;
generating surface level measurements of a surface of the process material at a plurality of locations on the surface using the level scanner; and
generating temperature measurements of the surface at a plurality of locations on the surface using the temperature scanner,
wherein:
the temperature scanner includes a thermographic imaging device comprising:
optics;
an array of infrared detectors; and
temperature measurement circuitry; and
generating temperature measurements comprises:
receiving infrared light at each of the infrared detectors through the optics;
generating infrared level signals using the infrared detectors based on the received infrared light; and
generating the temperature measurements based on the infrared signals.
12. The method of claim 11 , wherein:
the level scanner includes a phased-array level gauge system comprising:
a plurality of acoustic antennas; and
level measurement circuitry; and
generating surface level measurements comprises:
transmitting acoustic signals toward the surface using each of the acoustic antennas;
receiving echo signals corresponding to reflections of the transmitted acoustic signals from the surface using the acoustic antennas; and
generating the level measurements based on the received echo signals.
13. The method of claim 11 , further comprising communicating the level measurements and the temperature measurements to a computing device.
14. The method of claim 13 , wherein:
each of the temperature measurements includes a temperature and a location on the material surface corresponding to the temperature; and
each of the level measurements includes a level and a location on the material surface corresponding to the level.
15. The method of claim 14 , further comprising displaying graphical representations of the level measurements and the temperature measurements on a display of the computing device.
16. The method of claim 15 , wherein the graphical representation of the level measurements includes a 3D representation of the surface of the process material, and the graphical representation of the temperature measurements includes a mapping of the temperature measurements on the 3D representation of the surface.
17. The method of claim 11 , further comprising generating an alert based on the temperature measurements.
18. The method of claim 11 , wherein:
the thermographic imaging device comprises a surround extending from the housing structure, wherein the optics are supported at a proximal end of the surround and are configured to receive the infrared light through an opening at a distal end of the surround; and
the method comprises purging dust from the surround using a dust purging device including one of vibrating the surround using a vibrator of the dust purging device, and blowing air against an interior of the surround using a nozzle of the dust purging device.
19. A process vessel for storing process material formed of solids, the process vessel comprising:
a vessel housing having an interior cavity for containing the process material; and
a level and surface temperature gauge comprising:
a housing structure supported by the vessel housing;
a level scanner supported by the housing structure and configured to generate surface level measurements of a process material surface at a plurality of locations on the surface; and
a temperature scanner supported by the housing structure and configured to generate temperature measurements of the process material surface at a plurality of locations on the surface.
20. The process vessel of claim 19 , wherein the temperature scanner includes a thermographic imaging device comprising:
optics;
an array of infrared detectors each configured to generate an infrared level signal based on infrared light received by the infrared detector through the optics; and
temperature measurement circuitry configured to generate the temperature measurements based on the infrared level signals.
21. The process vessel of claim 20 , further comprising:
a surround extending from the housing structure within the interior of the vessel housing, wherein the optics of the thermographic imaging device are supported at a proximal end of the surround and are configured to receive the infrared light through an opening at a distal end of the surround; and
a dust purging device configured to purge dust from the surround.