Method of sensing characteristic value of circuit element and display device using it

1. A display device, comprising:

a display panel including a plurality of gate lines, a plurality of data lines, and a plurality of subpixels formed adjacent to overlapping locations of the gate lines and the data lines;

a gate driver circuit for driving the plurality of gate lines;

a data driver circuit for driving the plurality of data lines;

a deterioration sensing circuit electrically connected to the plurality of the subpixels for sensing deterioration of a first organic light-emitting diode in a first subpixel of the plurality of subpixels and a second organic light-emitting diode in a second subpixel of the plurality of subpixels, wherein the first organic light-emitting diode is connected to a first gate line of the plurality of gate lines and the second organic light-emitting diode is connected to a second gate line of the plurality of gate lines; and

a timing controller for controlling signals applied to the gate driver circuit and the data driver circuit,

wherein the timing controller controls the gate driver circuit to progress a first deterioration sensing process including an initializing period, a boosting period, and a sampling period with respect to the first organic light-emitting diode in the first subpixel connected to the first gate line, and to begin another initializing period of a second deterioration sensing process during the boosting period of the first deterioration sensing process with respect to the second organic light-emitting diode in the second subpixel connected to a second gate line.

2. The display device according to claim 1 , wherein the subpixel of the plurality of subpixels comprises:

an organic light-emitting diode;

a driving transistor driving the organic light-emitting diode and receiving a driving voltage-for-sensing deterioration, the driving transistor including a source node, a gate node, and a drain node;

a switching transistor electrically connected between the gate node of the driving transistor and a data line among the plurality of data lines; and

a sensing transistor electrically connected between either the source node or the drain node of the driving transistor and a reference voltage line.

3. The display device according to claim 1 , wherein the deterioration sensing circuit comprises:

an amplifier in which a non-inverting input terminal receives a reference voltage-for-sensing and an inverting input terminal is connected to a reference voltage line;

a feedback capacitor electrically connected between the inverting input terminal and an output terminal of the amplifier;

a reset switch connected to the feedback capacitor in parallel; and

a sampling switch connected to the output terminal of the amplifier.

4. The display device according to claim 1 , wherein the deterioration sensing process with respect to the first organic light-emitting diode comprises:

an initializing period in which a high level scan signal is supplied to the first gate line to charge a voltage for the deterioration sensing the first organic light-emitting diode;

a boosting period in which a parasitic capacitor of the first organic light-emitting diode is charged by a current flowing through the first organic light-emitting diode after the voltage charging for the deterioration sensing of the first organic light-emitting diode is completed; and

a sampling period in which a capacitance charged in the parasitic capacitor of the first organic light-emitting diode is detected.

5. The display device according to claim 4 , wherein the deterioration sensing process with respect to the first organic light-emitting diode further comprises a reset period for resetting the deterioration sensing circuit after the sampling period.

6. The display device according to claim 5 , wherein a time interval between the first deterioration sensing process and the second deterioration sensing process is larger than a time duration of the reset period of the deterioration sensing circuit.

7. A method of sensing a characteristic value of a circuit element in a display device comprising:

charging a voltage of a first organic light-emitting diode connected to a first gate line at a first initializing period;

charging a parasitic capacitor connected parallel to the first organic light-emitting diode at a first boosting period, wherein the first boosting period starts after the first initializing period;

detecting a parasitic capacitance of the parasitic capacitor at a first sampling period after the first boosting period; and

charging a voltage of a second organic light-emitting diode connected to a second gate line at a second initializing period during the first boosting period of the first organic light-emitting diode.

8. The method according to claim 7 , further comprising:

forming a subpixel, wherein forming the subpixel includes:

forming an organic light-emitting diode;

forming a driving transistor driving the organic light-emitting diode that is configured to receive a driving voltage-for-sensing deterioration;

forming a switching transistor electrically connected between a gate node of the driving transistor and a data line among a plurality of data lines; and

forming a sensing transistor electrically connected between a source node or a drain node of the driving transistor and a reference voltage line.

9. The method according to claim 8 , further comprising:

forming a deterioration sensing circuit, wherein forming the deterioration sensing circuit includes:

forming an amplifier in which a non-inverting input terminal receives a reference voltage-for-sensing and an inverting input terminal is connected to a reference voltage line;

forming a feedback capacitor electrically connected between the inverting input terminal and an output terminal of the amplifier;

forming a reset switch connected to the feedback capacitor in parallel; and

forming a sampling switch connected to the output terminal of the amplifier.

10. The method according to claim 9 , further comprising:

resetting the deterioration sensing circuit after the sampling period during a reset period.

11. The method according to claim 10 , wherein a time interval between the first initializing period and the second initializing period is larger than a time duration of the reset period of the deterioration sensing circuit.

12. The method according to claim 7 , wherein charging a voltage of a first organic light-emitting diode connected to a first gate line at a first initializing period includes:

supplying a high level scan signal to the first gate line to charge a voltage for the first organic light-emitting diode.

13. The method according to claim 7 , wherein charging a parasitic capacitor connected parallel to the first organic light-emitting diode at a first boosting period includes:

charging the parasitic capacitor of the first organic light-emitting diode by a current flowing through the first organic light-emitting diode after the voltage charging for the first organic light-emitting diode is completed.

14. The method according to claim 7 , wherein detecting a parasitic capacitance of the parasitic capacitor at a first sampling period after the first boosting period includes:

detecting the parasitic capacitance charged in the parasitic capacitor of the first organic light-emitting diode.