IP Library › Granted Patent US 10,823,685
Granted Patent B2
US 10,823,685 · App. 16/249,855 · Granted Nov 3, 2020

Method and system to automatically inspect parts using x-rays

Inventor: Guilherme Cardoso (Carlsbad, CA)
Assignee: CREATIVE ELECTRON, INC.
G01N23/083G06N20/00G01N2223/401G01N2223/6113
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Quick Facts
Patent No.
US 10,823,685
App. No.
16/249,855
Granted
Nov 3, 2020
Kind
B2
Abstract

A system and method for automating programming of an industrial use x-ray inspection machine, utilizing an artificial intelligence (AI) engine in both a navigator level and planner level stage of an x-ray parts inspection machine, the AI engine performing at least one of identifying and classifying a sample, assessing location(s) to be inspected on the sample, and implementing a test criteria for each assessed location on the sample. The AI engine removes the typical interactions and setup procedures performed by the machine operator, thus enabling a higher degree of system automation and accuracy.

Claims (28)

1. A method for automating programming of an industrial use x-ray inspection machine, comprising:

utilizing an artificial intelligence (AI) engine in both a navigator level and planner level stage of an x-ray parts inspection machine, the AI engine performing:

at least one of identifying and classifying a sample;

assessing location(s) to be inspected on the sample; and

implementing a test criteria for each assessed location on the sample.

2. The method of claim 1 , further comprising AI engine instructions to the x-ray machine for:

moving the sample in the x-ray machine to the assessed location(s); and

generating an x-ray image of the assessed location(s).

3. The method of claim 2 , further comprising applying the generated x-ray images to the test criteria to determine a quality level of the sample.

4. The method of claim 3 , further comprising generating a report of the sample inspection.

5. The method of claim 1 , wherein x-ray machine operation information and at least one of sample identity, sample classification, sample inspection location, and sample test criteria information is communicated to the AI engine from a remote database.

6. The method of claim 5 , wherein information gathered from the sample inspection is communicated to the remote database.

7. The method of claim 1 , wherein x-ray machine operation information and at least one of sample identity, sample classification, sample inspection location, and sample test criteria information is communicated locally a resident AI engine on the x-ray inspection machine.

8. The method of claim 7 , wherein information gathered from the sample inspection is communicated to the local AI engine.

9. A system for automatic programming of an industrial use x-ray inspection machine, comprising:

an artificial intelligence (AI) engine in both a navigator level and planner level stage of an x-ray parts inspection machine, the AI engine having information for:

at least one of the identity and classification of a sample;

an assessed location(s) to be inspected on the sample; and

a test criteria for each assessed location on the sample.

10. The system of claim 9 , further comprising AI engine instructions to the x-ray machine to:

move the sample in the x-ray machine to the assessed location(s); and

generate an x-ray image of the assessed location(s).

11. The system of claim 10 , further comprising an imager level stage, the imager level stage generating x-ray images.

12. The system of claim 11 , further comprising an analyzer level stage, the analyzer level stage comparing the generated x-ray images to the test criteria to determine a quality level of the sample.

13. The system of claim 12 , further comprising a reporting module, reporting quality level of the sample.

14. The system of claim 9 , further comprising a remote database, wherein x-ray machine operation information and at least one of sample identity, sample classification, sample inspection location, and sample test criteria information is communicated to the AI engine from the remote database.

15. The system of claim 14 , wherein information gathered from the sample inspection is communicated to the remote database.

16. The system of claim 9 , wherein the AI engine is resident on the x-ray inspection machine.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2022
From: CARDOSO, GUILHERME
To: CREATIVE ELECTRON, INC.
Reel/Frame 059880/0315 →
Continuity (2)
Provisional Application 62618035 · Jan 16, 2018
Related Publication 20190219525A1 · Jul 18, 2019