Element used for an oscillation or detection of a terahertz wave
Provided is an element that can reduce a parasitic oscillation. An element used for an oscillation or a detection of a terahertz wave includes a resonance unit 108 including a first conductor 102 , a second conductor 105 , a dielectric 104 arranged between the first conductor and the second conductor, a first negative resistance element 101 a and a second negative resistance element 101 b mutually connected in parallel between the first conductor and the second conductor, a bias circuit 120 that supplies a bias voltage to each of the first negative resistance element and the second negative resistance element, and a line 103 that connects the bias circuit to the resonance unit, and the element is configured in a manner that a mutual injection locking in a positive phase between the first negative resistance element and the second negative resistance element is unstable, and a mutual injection locking in a reversed phase between the first negative resistance element and the second negative resistance element becomes stable.
1. An element used for an oscillation or a detection of a terahertz wave, the element comprising:
a resonance unit including a first conductor, a second conductor, a dielectric arranged between the first conductor and the second conductor, and a first negative resistance element and a second negative resistance element mutually connected in parallel between the first conductor and the second conductor;
a bias circuit that supplies a bias voltage to each of the first negative resistance element and the second negative resistance element; and
a line that connects the bias circuit to the resonance unit,
wherein
the element is configured in a manner that a mutual injection locking in a positive phase between the first negative resistance element and the second negative resistance element is unstable, and a mutual injection locking in a reversed phase between the first negative resistance element and the second negative resistance element becomes stable, and
the element being configured to reduce a parasitic oscillation in a range between 50 GHz or higher and 500 GHz or lower.
2. The element according to claim 1 , wherein the second negative resistance element is arranged at an axisymmetric position with respect to a position where the first negative resistance element is arranged while a straight line passing through a gravity center of the first conductor and also being perpendicular to a resonance direction of an electromagnetic wave in the resonance unit and a lamination direction of the first conductor layer and the second conductor layer is set as an axis in the first conductor.
3. The element according to claim 1 , wherein a gain of the first negative resistance element is equal to the gain of the second negative resistance element.
4. The element according claim 1 , wherein the line is connected to the resonance unit at the position corresponding to a node of the electric field of the terahertz wave standing in the resonance unit of the element.
5. The element according to claim 1 , wherein the resonance unit is a patch antenna.
6. The element according to claim 1 , wherein a frequency band of an electromagnetic wave oscillated by the first negative resistance element is overlapped with a frequency band of an electromagnetic wave oscillated by the second negative resistance element.
7. An element used for an oscillation or a detection of a terahertz wave, the element comprising:
a resonance unit including a first conductor, a second conductor, a dielectric arranged between the first conductor and the second conductor, and a first negative resistance element and a second negative resistance element mutually connected in parallel between the first conductor and the second conductor;
a bias circuit that supplies a bias voltage to each of the first negative resistance element and the second negative resistance element; and
a line that connects the bias circuit to the resonance unit,
wherein the following Expression (1) is satisfied;
[Math. 1]
Re ( Y 12 )>⅓[ G−Re ( Y 11 )] (1)
where Re(Y 12 ) denotes a real part of a mutual admittance between the first negative resistance element and the second negative resistance element;
where G denotes a gain of the first negative resistance element or the second negative resistance element; and
where Re(Y 11 ) denotes a real part of an admittance of an entire configuration including the resonance unit as viewed from the first negative resistance element.
8. An element comprising:
a resonance unit including a first antenna unit including a first negative resistance element, a second antenna unit including a second negative resistance element, and a coupling part where a strong coupling between the first antenna unit and the second antenna unit is performed, in which a terahertz wave resonates;
a bias circuit that supplies a bias voltage to the first negative resistance element and the second negative resistance element; and
a line that connects the bias circuit to the resonance unit,
wherein
the resonance unit is configured in a manner that a mutual injection locking in a positive phase between the first negative resistance element and the second negative resistance element at a frequency of resonance based on an inductance of the line and a capacitance of the resonance unit is unstable, and a mutual injection locking in a reversed phase at a frequency of the terahertz wave becomes stable, and
the resonance unit is configured to reduce a parasitic oscillation in a range between 50 GHz or higher and 500 GHz or lower.
9. The element according to claim 8 , wherein
the first antenna unit includes a first conductor layer, a conductor, a dielectric arranged between the first conductor layer and the conductor, and the first negative resistance element electrically connected between the first conductor layer and the conductor, and
the second antenna unit includes a second conductor layer, the conductor, a dielectric arranged between the second conductor layer and the conductor, and the second negative resistance element electrically connected between the second conductor layer and the conductor.
10. The element according to claim 9 , wherein the coupling part includes a connection part that connects the first conductor layer to the second conductor layer, the conductor, and the dielectric arranged between the connection part and the conductor.
11. The element according to claim 9 , wherein the first conductor layer, the second conductor layer, and the connection part are formed of a single conductor.
12. The element according to claim 9 , wherein the conductor includes a conductor included in the first antenna unit, a conductor included in the second antenna unit, and a conductor included in the coupling part.
13. The element according to claim 8 , wherein the coupling part is arranged at a position corresponding to a node of an electric field of the terahertz wave standing in the resonator.
14. The element according to claim 8 , wherein the coupling part performs a DC coupling between the first antenna unit and the second antenna unit.
15. The element according to claim 8 , wherein the first antenna unit and the second antenna unit are mirror symmetrical while the coupling part is set as an axis.
16. An element comprising:
a resonance unit including a first antenna unit including a first negative resistance element, a second antenna unit including a second negative resistance element, and a coupling part where a strong coupling between the first antenna unit and the second antenna unit is performed, in which a terahertz wave resonates;
a bias circuit that supplies a bias voltage to the first negative resistance element and the second negative resistance element; and
a line that connects the bias circuit to the antenna,
wherein
the following Expression (1) is satisfied;
[Math. 2]
Re ( Y 12 )>⅓[ G−Re ( Y 11 )] (1)
where Re(Y 12 ) denotes a real part of a mutual admittance between the first negative resistance element and the second negative resistance element;
where G denotes a gain of the first negative resistance element or the second negative resistance element; and
where Re(Y 11 ) denotes a real part of an admittance of an entire configuration including the resonance unit as viewed from the first negative resistance element.