IP Library Granted Patent US 10,839,765
Granted Patent B2
US 10,839,765 · App. 16/476,321 · Granted Nov 17, 2020

GOA detection circuit and testing method therefor

Inventor: Di Zhang (Wuhan, CN)
Assignee: Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
G09G3/3677G01R31/2825
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,839,765
App. No.
16/476,321
Granted
Nov 17, 2020
Kind
B2
Abstract

The present disclosure provides a gate on array (GOA) detection circuit and a detection method. The GOA detection circuit includes a GOA circuit module and a detection signal collection module. The GOA circuit module includes a plurality of scanning lines, a GOA circuit, a plurality of common control thin film transistors (TFT), and a plurality of single-stage control TFTs. An output end of each scanning line is connected to a signal collection line. A gate of each common control TFT is connected to a detection signal control wire of the detection signal collection module, and a source of each common control TFT is connected to the signal collection line. A test point for detecting an electrical signal is disposed on the signal collection line.

Claims (17)

1. A gate on array (GOA) detection circuit, comprising: a GOA circuit module and a detection signal collection module, wherein the GOA circuit module comprises a plurality of scanning lines spaced in parallel and a GOA circuit electrically connected to the plurality of scanning lines; an output end of each of the scanning line is electrically connected to a signal collection line; the GOA circuit comprises a plurality of cascaded GOA units; each of the GOA unit is electrically connected to a scanning signal output end; each of the scanning signal output end is correspondingly electrically connected to one of the scanning line; the GOA circuit module further comprises a plurality of common control thin film transistors (TFT) and a plurality of single-stage control TFTs; a gate of each of the common control TFT is electrically connected to a detection signal control wire of the detection signal collection module; a source of each of the common control TFT is electrically connected to the signal collection line; each of the single-stage control TFT is disposed on one of the scanning line; a drain of each of the single-stage control TFT is electrically connected to one of the scanning signal output end; a source of each of the single-stage control TFT is electrically connected to a drain of a corresponding common control TFT; a gate of each of the single-stage control TFT is electrically connected to a single-stage signal control wire; a test point for detecting an electrical signal is disposed on the signal collection line; the GOA circuit module further comprises a plurality of unilateral conduction components; each unilateral conduction component is disposed on one of the scanning line; the unilateral conduction component is configured to prevent mutual interference between output signals of different stages of the GOA units; and the gate of each of the common control TFT and the gate of each of the single-stage control TFT are electrically connected to a phase inverter.

2. A gate on array (GOA) detection circuit, comprising: a GOA circuit module and a detection signal collection module, wherein the GOA circuit module comprises a plurality of scanning lines spaced in parallel and a GOA circuit electrically connected to the plurality of scanning lines; an output end of each of the scanning line is electrically connected to a signal collection line; the GOA circuit comprises a plurality of cascaded GOA units; each of the GOA unit is electrically connected to a scanning signal output end; each of the scanning signal output end is correspondingly electrically connected to one of the scanning line; the GOA circuit module further comprises a plurality of common control thin film transistors (TFT) and a plurality of single-stage control TFTs; a gate of each of the common control TFT is electrically connected to a detection signal control wire of the detection signal collection module; a source of each of the common control TFT is electrically connected to the signal collection line; each of the single-stage control TFT is disposed on one of the scanning line; a drain of each of the single-stage control TFT is electrically connected to one of the scanning signal output end; a source of each of the single-stage control TFT is electrically connected to a drain of a corresponding common control TFT; a gate of each of the single-stage control TFT is electrically connected to a single-stage signal control wire; and a test point for detecting an electrical signal is disposed on the signal collection line.

3. The GOA detection circuit according to claim 2 , wherein the detection signal collection module further comprises a reset component and a capacitor; the reset component is a reset control TFT; a gate of the reset control TFT receives a reset signal; a source of the reset control TFT is electrically connected to the signal collection line; a drain of the reset control TFT receives a low-level voltage signal; when the gate of the reset control TFT receives the reset signal, the signal collection line obtains a voltage level according to the low-level voltage signal received by the drain of the reset control TFT; one end of the capacitor is connected to the signal collection line; and the capacitor is used for storing electrical charge.

4. The GOA detection circuit according to claim 2 , wherein the detection signal collection module further comprises a reset component and a capacitor; the reset component is a reset control TFT; a gate of the reset control TFT receives a reset signal; a source of the reset control TFT is electrically connected to the signal collection line; a drain of the reset control TFT receives a high-level voltage signal; when the gate of the reset control TFT receives the reset signal, the signal collection line obtains a voltage level according to the high-level voltage signal received by the drain of the reset control TFT; one end of the capacitor is connected to the signal collection line; and the capacitor is used for storing electrical charge.

5. The GOA detection circuit according to claim 2 , wherein the GOA circuit module further comprises a plurality of unilateral conduction components; each unilateral conduction component is disposed on one of the scanning line; and the unilateral conduction component is configured to prevent mutual interference between output signals of different stages of the GOA units.

6. The GOA detection circuit according to claim 5 , wherein the unilateral conduction component is a unilateral conduction control TFT; and when an output signal of the GOA unit is a negative voltage pulse signal, a drain of the unilateral conduction control TFT is electrically connected to a gate of the unilateral conduction control TFT by a phase inverter.

7. The GOA detection circuit according to claim 5 , wherein the unilateral conduction component is a unilateral conduction control TFT; and when an output signal of the GOA unit is a negative voltage pulse signal, a source of the unilateral conduction control TFT is electrically connected to a gate of the unilateral conduction control TFT.

8. The GOA detection circuit according to claim 5 , wherein the unilateral conduction component is a unilateral conduction control TFT; and when an output signal of the GOA unit is a positive voltage pulse signal, a source of the unilateral conduction control TFT is electrically connected to a gate of the unilateral conduction control TFT by a phase inverter.

9. The GOA detection circuit according to claim 5 , wherein the unilateral conduction component is a unilateral conduction control TFT; and when an output signal of the GOA unit is a positive voltage pulse signal, a drain of the unilateral conduction control TFT is electrically connected to a gate of the unilateral conduction control TFT.

10. The GOA detection circuit according to claim 4 , wherein the gate of each of the common control TFT and the gate of each of the single-stage control TFT are electrically connected to a phase inverter.

11. A testing method for a gate on array (GOA) detection circuit, comprising the following steps:

(a) providing the GOA detection circuit, wherein the GOA detection circuit comprises a GOA circuit module and a detection signal collection module; the GOA circuit module comprises a plurality of scanning lines spaced in parallel and a GOA circuit electrically connected to the plurality of scanning lines; an output end of each of the scanning line is electrically connected to a signal collection line; the GOA circuit comprises a plurality of cascaded GOA units; each of the GOA unit is electrically connected to a scanning signal output end; each of the scanning signal output end is correspondingly electrically connected to one of the scanning line; the GOA circuit module further comprises a plurality of common control thin film transistors (TFT) and a plurality of single-stage control TFTs; a gate of each of the common control TFT is electrically connected to a detection signal control wire of the detection signal collection module, a source of each of the common control TFT is electrically connected to the signal collection line; each of the single-stage control TFT is disposed on one of the scanning line; a drain of each of the single-stage control TFT is electrically connected to one of the scanning signal output end; a source of each of the single-stage control TFT is electrically connected to a drain of a corresponding common control TFT; and a gate of each of the single-stage control TFT is electrically connected to a single-stage signal control wire;

(b) controlling the detection signal control wire and the single-stage signal control wire, to perform on-off detection on the GOA circuit module; and

(c) disposing a test point for detecting a voltage signal of the signal collection line, and determining on-off of a corresponding GOA unit according to a voltage waveform of the test point.

12. The testing method according to claim 11 , wherein in the step (b), when an input voltage of the detection signal control wire is at a low level, and an input voltage of each single-stage signal control wire is at a low level, each of the single-stage control TFT in the GOA circuit module is in an on state, to perform on-off detection on each of the GOA unit.

13. The testing method according to claim 11 , wherein before the step (b), the method further comprises: before each of the GOA unit outputs a signal, receiving, by a reset component of the detection signal collection module, a reset signal, to reset the GOA circuit module.

14. The testing method according to claim 11 , wherein in the step (b), when an input voltage of the detection signal control wire is at a low level, an input voltage of a first single-stage signal control wire is at a low level, and input voltages of the single-stage signal control wires except the first single-stage signal control wire are at high voltages, the input voltage of the detection signal control wire turns on the single-stage control TFT corresponding to first single-stage signal control wire and turns off the single-stage control TFTs corresponding to single-stage signal control wires except the first single-stage signal control wire in order to perform on-off detection on the corresponding GOA unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2019
From: ZHANG, DI
To: WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
Reel/Frame 050963/0254 →
Continuity (1)
Related Publication 20200152151A1 · May 14, 2020