IP Library › Granted Patent US 10,840,936
Granted Patent B2
US 10,840,936 · App. 16/316,469 · Granted Nov 17, 2020

Sensor, driving method, and electronic device

Inventors: Masako Hasegawa (Tokyo, JP); Ryuta Okamoto (Kanagawa, JP); Tomonori Yamashita (Kanagawa, JP); Atsumi Niwa (Kanagawa, JP); Yosuke Ueno (Kanagawa, JP)
Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
H03M1/18H03M1/56H04N5/374H04N5/378H04N5/357H04N5/3765
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Quick Facts
Patent No.
US 10,840,936
App. No.
16/316,469
Granted
Nov 17, 2020
Kind
B2
Abstract

Provided is an AD conversion unit that includes a comparator to compare an electric signal with a reference signal having a variable level, and performs AD conversion of the electric signal by using a result of the comparison between the electric signal and the reference signal by the comparator. An attenuation unit attenuates the electric signal supplied to the comparator with the amplitude of the electric signal.

Claims (48)

1. A sensor, comprising:

an AD conversion circuit that comprises a comparator circuit, wherein

the comparator circuit is configured to:

receive an electric signal through an auto zero processing capacitor; and

compare the electric signal with a reference signal,

the reference signal has a variable level, and

the AD conversion circuit is configured to execute analog-to-digital (AD) conversion of the electric signal based on a result of the comparison between the electric signal and the reference signal; and

an attenuation circuit configured to attenuate the electric signal based on:

an amplitude of the electric signal, and

voltage division of the electric signal by the auto zero processing capacitor and a specific capacitor, wherein the attenuation circuit includes the specific capacitor.

2. The sensor according to claim 1 , further comprising a control circuit configured to control the attenuation circuit to attenuate the electric signal.

3. The sensor according to claim 1 , wherein the amplitude of the electric signal is based on the result of the comparison.

4. The sensor according to claim 1 , wherein

the comparator circuit is further configured to:

execute an auto zero process by the auto zero processing capacitor; and

obtain the result of the comparison based on the execution of the auto zero process, wherein the result of the comparison indicates that the electric signal matches with the reference signal.

5. The sensor according to claim 1 , further comprising a pixel that includes a photoelectric conversion element configured to:

execute photoelectric conversion on light incident on the pixel; and

output the electric signal based on the photoelectric conversion.

6. The sensor according to claim 1 , wherein

the attenuation circuit is further configured to attenuate the electric signal based on the amplitude of the electric signal that exceeds a specific threshold, and

the comparator circuit is further configured to output a high level signal based on the amplitude of the electric signal that exceeds the specific threshold.

7. The sensor according to claim 1 , wherein the attenuation circuit further includes a switch between the auto zero processing capacitor and the specific capacitor.

8. A driving method, comprising:

in a sensor including an AD conversion circuit, a comparator circuit, and an attenuation circuit:

receiving, by the comparator circuit, an electric signal through an auto zero processing capacitor;

comparing, by the comparator circuit, the electric signal with a reference signal, wherein the reference signal has a variable level,

executing, by the AD conversion circuit, analog-to-digital (AD) conversion of the electric signal based on a result of the comparison between the electric signal and the reference signal; and

attenuating, by the attenuation circuit, the electric signal based on:

an amplitude of the electric signal, and

voltage division of the electric signal by the auto zero processing capacitor and a specific capacitor, wherein the attenuation circuit includes the specific capacitor.

9. An electronic device, comprising:

an optical system configured to condense light; and

an image sensor configured to:

receive light; and

output a specific signal corresponding to an amount of the received light, wherein the image sensor includes:

a pixel that includes a photoelectric conversion element configured to:

execute photoelectric conversion on light incident on the pixel; and

output an electric signal based on the photoelectric conversion;

a reference signal output circuit configured to output a reference signal having a variable level;

an AD conversion circuit that comprises a comparator circuit, wherein

the comparator circuit is configured to:

receive the electric signal through an auto zero processing capacitor; and

compare the electric signal with the reference signal, and

the AD conversion circuit is configured to execute analog-to-digital (AD) conversion of the electric signal based on a result of the comparison between the electric signal and the reference signal; and

an attenuation circuit configured to attenuate the electric signal based on:

an amplitude of the electric signal, and

voltage division of the electric signal by the auto zero processing capacitor and a specific capacitor, wherein the attenuation circuit includes the specific capacitor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2019
From: HASEGAWA, MASAKO; OKAMOTO, RYUTA; YAMASHITA, TOMONORI; NIWA, ATSUMI; UENO, YOSUKE
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 047942/0388 →
Priority Claims (1)
JP 2016-148565 · Jul 28, 2016 · national
Continuity (1)
Related Publication 20190305792A1 · Oct 3, 2019
Cited By (1)
US 12,289,116