IP Library › Granted Patent US 10,845,422
Granted Patent B2
US 10,845,422 · App. 16/414,864 · Granted Nov 24, 2020

Electricity storage device tester

Inventors: Kiwamu Kobayashi (Anjo, JP); Takeshi Goto (Kasugai, JP)
Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
G01R31/392
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Quick Facts
Patent No.
US 10,845,422
App. No.
16/414,864
Granted
Nov 24, 2020
Kind
B2
Abstract

An electricity storage device tester including: a voltage application unit configured to apply to a circuit a direct-current voltage; an ammeter configured to acquire a current value of the circuit; a voltage control unit configured to control an output voltage of the voltage application unit; and a determination unit configured to determine whether the electricity storage device is defective or not based on the value acquired by the ammeter. The voltage application unit includes a plurality of power source devices connected in series with each other. One of the power source devices is a specific power source device which is configured to have a variable output voltage and of which both a maximum value and a step width of the output voltage are smaller than the power source devices other than the specific power source device.

Claims (10)

1. An electricity storage device tester comprising:

a plurality of power source devices configured to apply to a circuit a direct-current voltage in an opposite direction from a voltage of an electricity storage device, the circuit including the plurality of power source devices connected to the electricity storage device being tested;

an ammeter configured to acquire a current value of the circuit, wherein

a determination is made as to whether the electricity storage device is defective or not based on the current value acquired by the ammeter,

each of the plurality of power source devices is connected in series with each other,

one of the power source devices is a specific power source device which is configured to have an output voltage that is variable, a maximum value of the output voltage of the specific power source device is smaller than maximum values of output voltages of the power source devices other than the specific power source device, and a step width of the output voltage of the specific power source device is smaller than step widths of the output voltages of the power source devices other than the specific power source device, and

when the plurality of power source devices applies a voltage to the circuit for the determination to be made, the output voltage of the plurality of power source devices is adjusted by manipulating the output voltage of the specific power source device.

2. The electricity storage device tester according to claim 1 , wherein when the plurality of power sources devices applies the voltage to the circuit for the determination to be made, feedback control is performed of raising the output voltage of the plurality of power source devices based on a parasitic resistance value of the circuit and the current value of the circuit.

3. The electricity storage device tester according to claim 1 , wherein when the plurality of power source devices applies the voltage to the circuit for the determination to be made, the output voltage of the plurality of power source devices is raised according to a parasitic resistance value of the circuit, within such a range that an absolute value of an imaginary resistance value remains below the parasitic resistance value of the circuit, the imaginary resistance value is a negative value obtained by converting an increase in a current of the circuit resulting from raising the output voltage of the plurality of power source devices into a decrease in a parasitic resistance of the circuit.

4. The electricity storage device tester according to claim 1 , wherein the step width of the output voltage of the specific power source device is equal to or smaller than 10 μV.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2019
From: KOBAYASHI, KIWAMU; GOTO, TAKESHI
To: TOYOTA JIDOSHA KABUSHIKI KAISHA
Reel/Frame 049219/0429 →
Priority Claims (1)
JP 2018-145271 · Aug 1, 2018 · national
Continuity (1)
Related Publication 20200041575A1 · Feb 6, 2020