Device and method for producing test data
A device for producing test data stores a plurality of simulated test data each of which substantially conforms to the data format accepted by a device under test (DUT). The data format includes different data blocks. The device for producing test data also mutates each of the simulated test data in one of a plurality of mutation forms to generate a plurality of first test data for testing the DUT. Each of the mutation forms refers to mutating one of the data blocks in one of a plurality of mutation ways.
1. A device for producing test data, comprising:
a storage, configured to store a plurality of simulated test data, wherein each of the plurality of simulated test data substantially conforms to a data format accepted by a device under test (DUT), and the data format comprises a plurality of different data blocks; and
a processor electrically connected with the storage, configured to:
determine a weight value for each of a plurality of mutation forms, wherein weight values of mutation forms corresponding to the same data block and a data variation rate of simulated test data of the data block are inversely correlated; and
mutate each of the plurality of simulated test data in one of a plurality of mutation forms randomly decided based on the plurality of weight values to produce a plurality of first test data for testing the DUT, wherein each of the plurality of mutation forms refers to mutating one of the plurality of data blocks in one of a plurality of mutation ways.
2. The device for producing test data of claim 1 , wherein the plurality of mutation ways comprise at least a bit mutation, a character mutation and a length mutation.
3. The device for producing test data of claim 1 , wherein the processor is further configured to:
learn a mode of communicating with the DUT to obtain the data format accepted by the DUT; and
produce the plurality of simulated test data based on the data format.
4. The device for producing test data of claim 3 , wherein the processor learns the mode of communicating with the DUT with a machine learning algorithm.
5. The device for producing test data of claim 1 , wherein the processor is further configured to adjust the plurality of weight values of the plurality of mutation forms according to test result produced by the plurality of first test data, and mutate each of the plurality of simulated test data in one of the plurality of mutation forms randomly decided based on the plurality of adjusted weight values to produce a plurality of second test data for testing the DUT.
6. A method for producing test data, comprising:
determining, by a device for producing test data, a weight value for each of the plurality of mutation forms, wherein weight values of mutation forms corresponding to the same data block and a data variation rate of simulated test data of the data block are inversely correlated; and
storing, by the device for producing test data, a plurality of simulated test data, wherein each of the plurality of simulated test data substantially conforms to a data format accepted by a device under test (DUT), and the data format comprises a plurality of different data blocks; and
mutating, by the device for producing test data, each of the plurality of simulated test data in one of a plurality of mutation forms randomly decided based on the plurality of weight values to produce a plurality of first test data for testing the DUT, wherein each of the plurality of mutation forms refers to mutating one of the plurality of data blocks in one of a plurality of mutation ways.
7. The method for producing test data of claim 6 , wherein the plurality of mutation ways comprise at least a bit mutation, a character mutation and a length mutation.
8. The method for producing test data of claim 6 , further comprising:
learning, by the device for producing test data, a mode of communicating with the DUT to obtain the data format accepted by the DUT; and
producing, by the device for producing test data, the plurality of simulated test data based on the data format.
9. The method for producing test data of claim 8 , wherein the device for producing test data learns the mode of communicating with the DUT with a machine learning algorithm.
10. The method for producing test data of claim 6 , further comprising:
adjusting, by the device for producing test data, the plurality of weight values of the plurality of mutation forms according to test results produced by the plurality of first test data; and
mutating, by the device for producing test data, each of the plurality of simulated test data in one of the plurality of mutation forms randomly decided based on the plurality of adjusted weight values to produce a plurality of second test data for testing the DUT.