Mass analysis apparatus and method
Disclosed is a mass analysis apparatus and method, wherein the precision of detection of a first material including a second material is improved, without enlarging the apparatus, and the measurement time is reduced. The mass analysis apparatus for analyzing a sample containing a first material including an organic compound and at least one second material including an organic compound and having a mass spectrum peak overlapping that of the first material includes a peak correction unit, wherein, when an intensity ratio (peak B)/(peak A) of peak A, not overlapping that of the first material, and peak B, overlapping that of the first material, is a correction coefficient (W), an intensity of a net peak D of the mass spectrum of the first material is calculated by subtracting W×(intensity of peak A) from an intensity of a peak C of the mass spectrum of the first material in the sample.
1. A mass analysis apparatus for analyzing a sample containing a first material comprising an organic compound and at least one second material comprising an organic compound and having a mass spectrum peak overlapping a mass spectrum peak of the first material, the mass analysis apparatus comprising:
an ion source for ionizing the first material and the second material, a detector for detecting a mass spectrum peak of a gas component which is ionized in the ion source and a computer configured to calculate a net peak of the mass spectrum based on a detection signal from the detector,
wherein the computer is configured such that, when an intensity ratio (peak B)/(peak A) of peak A, which does not overlap the mass spectrum peak of the first material, and peak B, which overlaps the mass spectrum peak of the first material, among mass spectrum peaks of standard materials for the at least one second material, is a correction coefficient (W), an intensity of a net peak D of a mass spectrum of the first material is calculated by subtracting W×(intensity of peak A) from an intensity of a peak C of the mass spectrum of the first material in the sample.
2. The mass analysis apparatus of claim 1 , wherein two or more second materials are present, and
the computer subtracts a sum of W×(intensity of peak A) values for the second materials from the intensity of the peak C.
3. The mass analysis apparatus of claim 2 , wherein the peak B is based on fragment ions generated from the second materials upon ionization.
4. The mass analysis apparatus of claim 2 , wherein the computer calculates the intensity of the peak D when W×(intensity of peak A) exceeds a predetermined threshold value.
5. The mass analysis apparatus of claim 4 , wherein the peak B is based on fragment ions generated from the second material upon ionization.
6. The mass analysis apparatus of claim 1 , wherein the computer calculates the intensity of the peak D when W×(intensity of peak A) exceeds a predetermined threshold value.
7. The mass analysis apparatus of claim 6 , wherein the peak B is based on fragment ions generated from the second material upon ionization.
8. The mass analysis apparatus of claim 1 , wherein the peak B is based on fragment ions generated from the second material upon ionization.