IP Library Granted Patent US 10,852,367
Granted Patent B2
US 10,852,367 · App. 14/812,907 · Granted Dec 1, 2020

Magnetic-field sensor with a back-bias magnet

Inventors: Helmut Koeck (Villach, AT); Tobias Werth (Villach, AT); Frank Heinrichs (Villach, AT); Udo Ausserlechner (Villach, AT)
Assignee: INFINEON TECHNOLOGIES AG
G01R33/09G01D5/14G01D5/145G01R3/00G01R33/02G01R33/072H01F7/0294Y10T29/49002
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Quick Facts
Patent No.
US 10,852,367
App. No.
14/812,907
Granted
Dec 1, 2020
Kind
B2
Abstract

An embodiment of a magnetic-field sensor includes a magnetic-field sensor arrangement and a magnetic body which has, for example, a non-convex cross-sectional area with regard to a cross-sectional plane running through the magnetic body, the magnetic body having an inhomogeneous magnetization.

Claims (24)

1. A magnetic-field sensor comprising:

a magnetic-field sensor arrangement; and

a back-bias magnet, wherein a structure of the back-bias magnet comprises an inhomogeneous magnetization.

2. The magnetic-field sensor as claimed in claim 1 , wherein the back-bias magnet is moldable as unitary member and of cuboidal shape, circular shape, elliptical, or frustum shape.

3. The magnetic-field sensor as claimed in claim 2 , wherein the back-bias magnet comprises materials selected from the group consisting of ferrites, aluminum-nickel-cobalt (AlNiCo), samarium-cobalt (SmCo) and neodymium-iron-boron (NdFeB).

4. The magnetic-field sensor as claimed in claim 1 , wherein the inhomogeneous magnetization of the back-bias magnet is symmetrical to a first symmetry line within at least one cross-section of the back-bias magnet.

5. The magnetic-field sensor as claimed in claim 4 , wherein the first symmetry line is a symmetry line of a substantially mirror-symmetrical inhomogeneous magnetization within the at least one cross-section of the back-bias magnet.

6. The magnetic-field sensor as claimed in claim 4 , wherein the first symmetry line within the at least one cross-section of the back-bias magnet is a symmetry line of higher order, rotational symmetry, or ellipsoidal symmetry.

7. The magnetic-field sensor as claimed in claim 4 , wherein the inhomogeneous magnetization is further symmetrical to the first symmetry line within a further cross-section of the back-bias magnet, the further cross-section intersecting the cross-section at the first symmetry line.

8. The magnetic-field sensor as claimed in claim 1 , wherein the inhomogeneous magnetization of the back-bias magnet causes a magnetic flux density outside the back-bias magnet.

9. The magnetic-field sensor as claimed in claim 3 , wherein magnetic flux caused by the inhomogeneous magnetization is substantially not confined to an inside of the back-bias magnet.

10. The magnetic-field sensor as claimed in claim 1 , wherein the back-bias magnet comprises the inhomogeneous magnetization in at least 50% of a volume of the back-bias magnet.

11. The magnetic-field sensor as claimed in claim 4 ,

wherein the at least one cross-section is spanned by a first direction and a second direction, the first and second direction not being parallel, and

wherein when walking along the second direction for a given coordinate value for the first direction, an angle between the second direction and a local direction of magnetization varies at least over a portion of a walking path, the walking path being different from the first symmetry line.

12. The magnetic-field sensor as claimed in claim 11 , wherein the angle varies monotonically when walking along the walking path.

13. The magnetic-field sensor as claimed in claim 11 , wherein the angle varies non-monotonically when walking along the walking path, if the walking path runs perpendicular to the first symmetry line.

14. The magnetic-field sensor as claimed in claim 1 , wherein the magnetic-field sensor arrangement comprises a first magnetic-field sensor element and a second magnetic-field sensor element, the first magnetic-field sensor element being arranged, with respect to the back-bias magnet, such that the first magnetic-field sensor element is exposed, with regard to a predetermined spatial direction, to a magnetic flux density caused by the back-bias magnet and being within a first flux density range, and the second magnetic-field sensor element being arranged, with respect to the back-bias magnet, such that the second magnetic-field sensor element is exposed, with regard to the predetermined spatial direction, to a magnetic flux density caused by the back-bias magnet and being within a second flux density range.

15. The magnetic-field sensor as claimed in claim 14 , wherein the first flux density range and the second flux density range enable operation of the first and second magnetic-field sensor elements.

16. The magnetic-field sensor as claimed in claim 14 , wherein the first and second flux density ranges only comprise values smaller than or equal to 20 mT in magnitude.

17. The magnetic-field sensor as claimed in claim 14 , wherein the first flux density range comprises flux densities of opposite sign to the second flux density range.

18. The magnetic-field sensor as claimed in claim 15 , wherein the first and second magnetic-field sensor elements are magneto-resistive sensor elements.

19. The magnetic-field sensor as claimed in claim 15 , wherein the first and second magnetic-field sensor elements are arranged on a substrate, and wherein the predetermined spatial direction is substantially parallel to a main surface of the substrate.

20. The magnetic-field sensor as claimed in claim 1 , wherein the back-bias magnet is annular or comprises an annular section.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2015
From: KOECK, HELMUT; WERTH, TOBIAS; HEINRICHS, FRANK; AUSSERLECHNER, UDO
To: INFINEON TECHNOLOGIES AG
Reel/Frame 036745/0592 →
Priority Claims (1)
DE 10 2007 025 000 · May 30, 2007 · national
Continuity (3)
Continuation In Part 14290780 · May 29, 2014
Division 12130678 · May 30, 2008
Related Publication 20150331070A1 · Nov 19, 2015