X-ray inspection apparatus
Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.
1. An X-ray inspection apparatus that irradiates a carried object to be inspected with an X-ray, and inspects the object to be inspected on the basis of a transmission amount of the X-ray transmitted through the object to be inspected, the X-ray inspection apparatus comprising:
an X-ray irradiation portion that has an X-ray tube generating the X-ray;
an X-ray sensor that has detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to a carrying surface of the object to be inspected and detecting the X-ray;
a collimator that restricts an irradiation region of the X-ray for the X-ray sensor; and
at least one processor configured to designate one or more detection element arrays to be used for inspection in the irradiation region restricted by the collimator.
2. The X-ray inspection apparatus according to claim 1 , further comprising:
a display that displays a detection amount of X-rays detected by the detection element arrays in the plurality of stages.
3. The X-ray inspection apparatus according to claim 1 , wherein the at least one processor is further configured to determine the one or more detection element arrays to be used for the inspection on the basis of a graph indicating detection amounts of X-rays detected by the detection element arrays in the plurality of stages for the carrying direction.