IP Library Granted Patent US 10,876,830
Granted Patent B2
US 10,876,830 · App. 16/298,666 · Granted Dec 29, 2020

Non-contact sheet material thickness measurement system

Inventor: Michael Kon Yew Hughes (Vancouver, CA)
Assignee: Honeywell International Inc.
G01B11/0691
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Quick Facts
Patent No.
US 10,876,830
App. No.
16/298,666
Granted
Dec 29, 2020
Kind
B2
Abstract

A non-contact thickness measurement system includes a first optical displacement sensor in a first scanner head and a second optical displacement sensor in a second scanner head on opposite sides of a sheet material. The displacement sensors measure a plurality of distances to a first line in a first direction along the top of the material and plurality of distances to a second line in a second direction along a bottom of the material. An x,y position sensor determines x,y position data. A z-position sensor measures a sensor-to-sensor distance. A computing device determines a projected intersection point of the first and second lines, and using the projected intersection point selects a first distance from the distances from first displacement sensor and a second distance from the distances from the second displacement sensor, and for calculating a sheet material thickness using the first distance, second distance, and the sensor-to-sensor distance.

Claims (23)

1. A method of non-contact thickness measurement for a sheet material, comprising:

measuring a plurality of distances from a first optical displacement sensor in a first scanner head positioned above the sheet material to a first line in a first direction along a top of the sheet material, and measuring a plurality of distances from a second optical displacement sensor in a second scanner head positioned below the sheet material to a second line in a second direction that is at an angle relative to the first direction along a bottom of the sheet material;

determining a projected intersection point (x,y) of the first line and the second line;

determining at the projected intersection point a first distance from first optical displacement sensor to the top of the sheet material and a second distance from second optical displacement sensor to the bottom of the sheet material, and

calculating a thickness of the sheet material from the first distance, the second distance, and a sensor-to-sensor distance between the first optical displacement sensor and the second optical displacement sensor,

wherein the first optical displacement sensor is recessed relative to an emitting face of the first scanner head, wherein the second optical displacement sensor is recessed relative to an emitting face of the second scanner head, and wherein the calculating the thickness of the sheet material further comprising adding an offset term that reflects a distance the first optical displacement sensor is recessed and a distance the second optical displacement sensor is recessed.

2. The method of claim 1 , wherein the optical displacement sensors both comprise a laser-based triangulation profile-measurement device including a light source and a photodetector array.

3. The method of claim 1 , further comprising correcting the thickness of the sheet material using an angle of the sheet material relative to a face of the first and second scanner heads.

4. The method of claim 1 , further comprising correcting the measurement of the projected intersection point for an angle of the first and second scanner heads with respect to one another.

5. The method of claim 1 , wherein the sheet material comprises a moving sheet material and wherein the method is performed multiple times while the sheet material is being produced.

6. The method of claim 1 , wherein the angle is 85 to 95 degrees.

7. The method of claim 1 , wherein a z-position sensor is positioned in at least one of the first and second scanner heads that is used for the measuring of the sensor-to-sensor distance.

8. A non-contact thickness measurement system for a sheet material, comprising:

a first optical displacement sensor positioned in a first scanner head positioned on a first side of the sheet material and a second optical displacement sensor positioned in a second scanner head positioned on a second side of the sheet material opposite the first side, wherein the first optical displacement sensor is configured to measure a plurality of distances to a first line in a first direction along a top of the sheet material, and wherein the second optical displacement sensor is configured to measure a plurality of distances to a second line in a second direction at an angle to the first direction along a bottom of the sheet material;

an x,y position sensor in at least one of the scanner heads for determining x,y position data,

a z-position sensor in at least one of the scanner heads for measuring a sensor-to-sensor distance between the first optical displacement sensor and the second optical displacement sensor,

a computing device including a processor having an associated memory communicably coupled to receive and process the x,y position data to determine a projected intersection point of the first line and the second line, using the projected intersection point selecting a first distance (d 1 ) from the plurality of distances to the first line and a second distance (d 2 ) from the plurality of distances to the second line, and implementing an equation for calculating a thickness of the sheet material that utilizes the d 1 , the d 2 , and the sensor-to-sensor distance,

wherein first optical displacement sensor is recessed relative to an emitting face of the first scanner head, wherein the second optical displacement sensor is recessed relative to an emitting face of the second scanner head, and wherein the calculating the thickness of the sheet material further comprising adding an offset term that reflects a distance the first optical displacement sensor is recessed and a distance the second optical displacement sensor is recessed.

9. The system of claim 8 , wherein the first and the second optical displacement sensors both comprise a laser-based triangulation profile-measurement device including a light source and a photodetector array.

10. The system of claim 8 , wherein the computing device is configured for implementing correcting the thickness of the sheet material using an angle of the sheet material relative to a face of the first and the second scanner heads.

11. The system of claim 8 , wherein the computing device is configured for implementing correcting the measurement of the projected intersection point for an angle of the first and the second scanner heads with respect to one another.

12. The system of claim 8 , wherein the angle is 85 to 95 degrees.

13. The system of claim 8 , wherein the z-position sensor comprises an inductive or a magnetic sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2019
From: HUGHES, MICHAEL KON YEW
To: HONEYWELL INTERNATIONAL INC.
Reel/Frame 048565/0169 →
Continuity (1)
Related Publication 20200292300A1 · Sep 17, 2020
Cited By (2)
US 12,482,681 US 12,529,556