Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle a in a pole figure with the small number of times of ϕ scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of. receiving input of a diffraction angle 2θ; and determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each ϕ scan for a rotation angle ϕ within a sample plane so as to make a range of an angle a continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2θ, in which determining the angle ω and the tilt angle χ is repeated.
1. A processing method for determining conditions of a pole figure measurement by X-ray diffraction, comprising the steps of:
receiving an input of a diffraction angle 2θ; and
determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each ϕ scan for a rotation angle ϕ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2θ, by calculating the range of the angle α based on an arrangement of the sample and the two-dimensional detection plane, and also a size of the two-dimensional detection plane,
wherein determining the angle ω and the tilt angle χ is repeated.
2. The processing method according to claim 1 , wherein the determining the angle ω and the tilt angle χ comprises determining the angle ω and the tilt angle χ in a first ϕ scan so that one end of an arc representing the range of the angle α that is detectable at a time on the two-dimensional detection plane, when the rotation angle ϕ within the sample plane is set to be constant, comes in contact with a position at which the angle α is 90°.
3. The processing method according to claim 1 , wherein the determining the angle ω and the tilt angle χ comprises determining the angle ω and the tilt angle χ in a second or subsequent ϕ scan so that one end of an arc representing the range of the angle α detectable at a time on the two-dimensional detection plane, when the rotation angle ϕ is set to be constant, comes in contact with one end of an arc in an immediately preceding measurement stage.
4. The processing method according to claim 1 , further comprising;
preliminary displaying the range of the angle α detectable at a time on the two-dimensional detection plane in each ϕ scan, based on the determined angle ω and the determined tilt angle χ.
5. A processing apparatus that determines conditions of a pole figure measurement by X-ray diffraction, comprising:
a processor configured to be controlled by a program to:
receive an input of a diffraction angle 2θ;
determine an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each ϕ scan for a rotation angle ϕ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2θ by calculating the range of the angle α based on the arrangement of the sample and the two-dimensional detection plane, and also a size of the two-dimensional detection plane; and
repeatedly determines the angle ω and the tilt angle χ.
6. A non-transitory computer readable recording medium having recorded thereon a processing program for determining conditions of a pole figure measurement by X-ray diffraction, the processing program causing a computer to execute processes of:
receiving an input of a diffraction angle 2θ; and
determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each ϕ scan for a rotation angle ϕ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2θ by calculating the range of the angle α based on the arrangement of the sample and the two-dimensional detection plane, and also a size of the two-dimensional detection plane,
wherein determining the angle ω and the tilt angle χ is repeated.