Charged particle beam source and a method for assembling a charged particle beam source

1. A charged particle beam source comprising:

a socket;

first and second electrodes coupled to the socket and spaced apart from each other;

an emitter brace coupled to the socket and disposed between the first and second electrodes, the emitter brace comprising a body extending away from the socket towards a distal end;

first and second supports disposed at the distal end of the emitter brace and spaced apart from each other defining a gap there between;

an emitter support element spanning the gap and coupled to the first and second supports;

an emitter coupled to the emitter support element and including a tip for emitting charged particles;

a filament coupled to the first and second electrodes and to the emitter, wherein the first and second electrodes are configured to provide electrical signals to the filament.

2. The charged particle beam source according to claim 1 wherein the first and second electrodes extend through apertures formed in the socket.

3. The charged particle beam source according to claim 1 wherein the filament comprises a first filament element that is connected to the first electrode and a second filament element that is connected to the second electrode.

4. The charged particle beam source according to claim 1 wherein a longitudinal axis of the emitter brace is parallel to a longitudinal axis of the tip.

5. The charged particle beam source according to claim 1 wherein the emitter support element is coated with diamond like carbon where the first and second supports are coupled to the emitter support.

6. The charged particle beam source according to claim 1 wherein the emitter support element is connected to only one point of the emitter brace.

7. The charged particle beam source according to claim 1 wherein the first and second supports comprise one or more movable elements that are movably coupled to a body of the emitter brace.

8. The charged particle beam source according to claim 1 wherein the first and second supports comprise one or more movable spheres that are movably coupled to a body of the emitter brace.

9. The charged particle beam source according to claim 1 wherein the first and second supports comprise one or more thermal isolators.

10. The charged particle beam source according to claim 1 wherein first and second supports extend beyond an intermediate part of the emitter brace thereby defining a gap between the intermediate part and the emitter support element when the emitter support element is supported by the emitter brace.

11. The charged particle beam source according to claim 1 wherein the socket and the emitter brace are ceramic.

12. The charged particle beam source according to claim 1 wherein a resonance frequency of the emitter exceeds ten thousand Hertz.

13. The charged particle beam source according to claim 1 wherein the emitter support element is a beam that has a longitudinal axis that is orthogonal to an imaginary plane defined by the filament.

14. A method for assembling a charged particle beam source, the method comprising:

positioning, by a positioning device, a support element on one or more interfaces of a support structure, wherein the support element belongs to a charged particle beam source and is connected to an emitter that includes a tip for emitting charged particles and wherein the charged particle beam source further comprises a socket, electrodes, a filament coupled to the emitter, and electrodes for providing electrical signals to the filament;

connecting the filament to the electrodes; and

releasing the support element from the positioning device.

15. The method according to claim 14 wherein the connecting comprises welding the filament to the electrodes.

16. The method according to claim 14 wherein the positioning comprises bending the support element towards the support structure.

17. The method according to claim 14 wherein the positioning excludes connecting the support element to the support structure.

18. The method according to claim 14 wherein the positioning comprises connecting the support element to only a single point of the support structure.

19. A charged particle beam source comprising:

a ceramic socket;

first and second electrodes coupled to the ceramic socket and spaced apart from each other;

a ceramic brace integral with the ceramic socket and disposed between the first and second electrodes, the ceramic brace comprising a body extending away from the ceramic socket to a distal end at which the ceramic brace includes first and second supports spaced apart from each other;

an emitter support element coupled to the first and second supports at the distal end of the ceramic brace;

an emitter welded to the emitter support element, the emitter including an emitter tip with a nanometric scale radius configured for emitting charged particles;

a filament coupled between the first and second electrodes and the emitter, wherein the first and second electrodes are configured to provide electrical signals to the filament.

20. The charged particle beam support according to claim 19 wherein the emitter support element comprises a beam extending between the first and second supports and having a surface comprising a diamond like carbon coating.