Multiple integrated tips scanning probe microscope
Device and system for characterizing samples using multiple integrated tips scanning probe microscopy. Multiple Integrated Tips (MiT) probes are comprised of two or more monolithically integrated and movable AFM tips positioned to within nm of each other, enabling unprecedented micro to nanoscale probing functionality in vacuum or ambient conditions. The tip structure is combined with capacitive comb structures offering laserless high-resolution electric-in electric-out actuation and sensing capability and novel integration with a Junction Field Effect Transistor for signal amplification and low-noise operation. This “platform-on-a-chip” approach is a paradigm shift relative to current technology based on single tips functionalized using stacks of supporting gear: lasers, nano-positioners and electronics.
1. A method of aligning at least two probe tips in a scanning probe adapter, the method comprising the steps of:
providing a probe head comprising at least two probe tips;
biasing a sample and the at least two probe tips with either an AC or DC signal, the sample arranged on a sample stage;
moving the sample and the at least two probe tips into proximity;
measuring a current from each of the at least two probe tips;
comparing the measured currents to determine which, if any, of the at least two probe tips generated a higher current; and
if one of the at least two probe tips generated a higher current, aligning the sample stage and the probe head, or determining that the at least two probe tips are aligned if equivalent currents are measured from the at least two probe tips wherein aligning the sample stage with the probe head comprises rotating the probe head about a first probe tip of the at least two probe tips that generates the higher current.
2. The method of claim 1 , further comprising the step of repeating the method until equivalent currents are measured from the at least two probe tips.