Inelastic spectrum measurement system and method

1. A method, comprising:

activating a neutron generation unit operable to emit neutrons toward a target for a first period of time;

receiving first measurement data, via a detection unit, during the first period of time;

storing the first measurement data;

deactivating the neutron generation unit after the first period of time;

processing at least a portion of the stored first measurement data after the first period of time, the first measurement data being correlated to a burst gate;

receiving second measurement data, via the neutron detection unit, during a second period of time, the second measurement data being correlated to a capture gate; and

processing the second measurement data during the second time period, wherein at least a portion of the first measurement data is processed in parallel with the second measurement data.

2. The method of claim 1 , further comprising:

activating the neutron generation unit for a third period of time after a delay period between a start of the third period of time and an end of the capture gate, wherein the delay period is long enough for a significant portion of thermal neutrons to be captured.

3. The method of claim 1 , wherein a significant amount of neutrons are not thermalized during the first period of time.

4. The method of claim 1 , further comprising:

processing at least a portion of the first measurement data during a fourth period of time, the fourth period of time extending from an end of the first period of time to an end of the capture gate.

5. The method of claim 1 , wherein the second period of time corresponds to a thermal neutron reactions period for neutrons emitted from the neutron generation unit.

6. The method of claim 1 , wherein the neutron generation unit is a pulsed neutron generator and the detection unit includes at least one gamma ray detector.

7. A computing device, comprising:

a microprocessor; and

memory including instructions that, when executed by the microprocessor, cause the computing device to:

obtain first measurement data from a detection unit, the first measurement data recorded during a burst gate of a neutron generation unit;

obtain second measurement data from the detection unit, the second measurement data recorded during a capture gate of the neutron generation unit, the capture gate starting after a waiting period from an end of the burst gate;

process at least a portion of the first measurement data during the waiting period;

process at least a portion of the second measurement data during the capture gate; and

process at least a portion of the first measurement data during the capture gate in parallel with the second measurement data.

8. The computing device of claim 7 , wherein the memory includes instructions that, when executed by the microprocessor, further cause the computing device to:

cause the neutron generation unit to emit neutrons for a first period of time corresponding to the burst gate, wherein less than a thermal threshold number of thermal neutrons are created during the burst gate;

cause the neutron generation unit to stop emitting neutrons after the first period of time; and

cause the neutron generation unit to emit neutrons for a second period of time corresponding to a second burst gate after a delay period, the delay period being long enough for more than an absorption threshold number of thermal neutrons to be absorbed.

9. The computing device of claim 8 , wherein the delay period begins after the capture gate, a start of the delay period corresponding to a period of time when a number of counts recorded within the capture gate falls below a threshold.

10. The computing device of claim 7 , wherein the neutron generation unit is a pulsed neutron generator and the detection unit includes at least one gamma ray detector.

11. The computing device of claim 7 , wherein the waiting period corresponds to a thermalization period for neutrons emitted by the neutron generation unit.

12. The computing device of claim 7 , wherein the memory includes instructions that, when executed by the microprocessor, further cause the computing device to:

store the first measurement data to a second memory; and

transmit the first measurement data to the memory.

13. The computing device of claim 7 , wherein the memory includes instructions that, when executed by the microprocessor, further cause the computing device to:

correlate the first measurement data with reactions associated with inelastic scattering; and

correlate the second measurement data with reactions associated with neutron capture.

14. A system for conducting measurement operations, the system comprising:

a neutron measurement device forming at least a portion of a downhole tool string, the neutron measurement device operable to generate measurement data for detecting a wellbore characteristic, wherein the neutron measurement device comprises:

a neutron generator operable to emit neutrons toward a target;

a plurality of detectors fixed relative to the neutron generator and operable to detect gamma rays from the target;

a microprocessor; and

memory including instructions that, when executed by the microprocessor, cause the system to:

activate the neutron generator for a first period of time;

store first measurement data during the first period of time;

deactivate the neutron generator after the first period of time;

disregard second measurement data during a second period of time, the second period of time being after the first period of time;

record third measurement data during a third period of time, the third period of time being after the second period of time;

process at least a portion of the first measurement data during the second period of time and the third period of time; and

process at least a portion of the third measurement data during the third period of time, wherein at least a portion of the first measurement data is processed in parallel with at least a portion of the third measurement data.

15. The system of claim 14 , wherein the first period of time corresponds to a burst gate and the first measurement data corresponds to inelastic scattering.

16. The system of claim 14 , wherein the third period of time corresponds to a capture gate and the third measurement data corresponds to capture gamma rays.

17. The system of claim 14 , wherein the memory includes instructions that, when executed by the microprocessor, further cause the system to:

activate the neutron generator for a fourth period of time, the activation occurring after a waiting period from an end of the capture gate.