Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
A method includes parallel or serial ionization of a gas mixture by activating at least two ionization devices operating using different ionization procedures, and/or by ionizing the gas mixture in a detector to which the gas mixture and ions and/or metastable particles of an ionization gas are fed. The method also includes detecting the ionized gas mixture in the detector for the mass spectrometric examination thereof. A mass spectrometer for mass spectrometric examination of gas mixtures includes an ionization unit for ionizing a gas mixture and a detector for detecting the ionized gas mixture.
1. A method, comprising:
a) external to a three dimensional ion trap configured to store ions, producing ions and/or metastable particles;
b) after a), in the three dimensional ion trap, interacting a gas mixture with the ions and/or the metastable particles to produce an ionized gas mixture; and
c) after b), using the three dimensional ion trap to mass spectrometrically examine the ionized gas mixture,
wherein a) comprises exposing an ionization gas to an ionizer to produce the ions and/or metastable particles.
2. The method of claim 1 , wherein the ionizer comprises a member selected from the group consisting of a charge exchange ionizer, an electron impact ionizer, a filament ionizer, a field ionizer, a pulsed laser ionizer, a photon ionizer, a UV light ionizer, a VUV light ionizer and an EUV light ionizer.
3. The method of claim 1 , wherein the ionizer comprises a plasma ionization device.
4. The method of claim 3 , wherein:
the plasma ionization device uses a dielectric barrier to produce a plasma; and
the method comprises exposing the ionization gas to the plasma to produce the ions and/or metastable particles.
5. The method of claim 3 , wherein:
the plasma ionization device uses a dielectric barrier to produce a radiofrequency plasma; and
the method comprises exposing the ionization gas to the radiofrequency plasma to produce the ions and/or metastable particles.
6. The method of claim 3 , wherein:
the plasma ionization device uses a dielectric barrier to produce a direct current plasma; and
the method comprises exposing the ionization gas to the direct current plasma to produce the ions and/or metastable particles.
7. The method of claim 3 , further comprising setting an ionization energy of the ionizer based on the gas mixture.
8. The method of claim 7 , further comprising, prior to producing the ionized gas mixture, using the ionizer to produce a plasma to clean at least one member selected from the group consisting of the three dimensional ion trap, a measurement chamber, and the ionizer.
9. The method of claim 7 , further comprising, prior to ionizing the gas mixture, using the ionizer to produce a plasma to clean a measurement chamber at a pressure of between one bar and 1×10 −10 millibar.
10. The method of claim 1 , wherein the gas mixture comprises particles having an atomic mass number of between 100 and 20,000.
11. The method of claim 1 , wherein the gas mixture comprises particles having an atomic mass number between 20,000 and 2,000,000.
12. The method of claim 1 , wherein the gas mixture comprises ions.
13. The method of claim 1 , wherein a) comprises exposing an ionization gas to an ionizer to produce the ions.
14. The method of claim 13 , wherein the ionizer comprises a plasma ionization device.
15. The method of claim 14 , further comprising setting an ionization energy of the ionizer based on the gas mixture.
16. The method of claim 15 , further comprising, prior to producing the ionized gas mixture, using the ionizer to produce a plasma to clean at least one member selected from the group consisting of the three dimensional ion trap, a measurement chamber, and the ionizer.
17. A mass spectrometer, comprising:
an ionizer configured to provide charged particles or a plasma;
a gas reservoir configured to store an ionization gas;
a gas feed configured to deliver the ionization gas from the gas reservoir to the ionizer; and
a three dimensional ion trap configured to store ions,
wherein the mass spectrometer is configured so that during use of the mass spectrometer:
external to the three dimensional ion trap, the ionization gas is delivered from the gas reservoir to the ionizer so that the ionization gas interacts with charged particles or is exposed to the plasma provided by the ionizer to produce a product comprising at least one member selected from the group consisting of ions of the ionization gas and metastable particles of the ionization gas;
the product is transferred from the ionizer to the three dimensional ion trap;
in the three dimensional ion trap, the product ionizes a gas mixture to provide an ionized gas mixture; and
the three dimensional ion trap mass spectrometrically examines the ionized gas mixture.
18. The mass spectrometer of claim 17 , wherein the product comprises ions of the ionization gas.
19. The mass spectrometer of claim 18 , wherein:
the ions of the ionization gas are transferred from the ionizer to the three dimensional ion trap;
in the three dimensional ion trap, the ions of the ionization gas ionize a gas mixture to provide an ionized gas mixture; and
the three dimensional ion trap mass spectrometrically examines the ionized gas mixture.
20. The mass spectrometer of claim 17 , wherein:
the ionizer is configured to provide charged particles; and
external to the three dimensional ion trap, the ionization gas is delivered from the gas reservoir to the ionizer so that the ionization gas interacts with charged particles provided by the ionizer to produce a product comprising at least one member selected from the group consisting of ions of the ionization gas and metastable particles of the ionization gas.