IP Library › Granted Patent US 10,923,877
Granted Patent B2
US 10,923,877 · App. 15/855,334 · Granted Feb 16, 2021

Surface-mount laser apparatus and output optical power monitoring method

Inventors: Kaisheng Chen (Wuhan, CN); Hongmin Chen (Santa Clara, CA)
Assignee: Huawei Technologies Co., Ltd.
H01S5/0264G02B6/12004G02B6/125G02B6/4286G02B6/4295H01S5/0042H01S5/021H01S5/0224H01S5/02248H01S5/0683H01S5/1032G02B2006/12097G02B2006/12121G02B2006/12123H01S5/02272H01S5/0617
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,923,877
App. No.
15/855,334
Granted
Feb 16, 2021
Kind
B2
Abstract

Embodiments of the present disclosure relate to a surface-mount laser apparatus. One example apparatus includes an on-chip laser, a passive waveguide, and a waveguide detector. The waveguide detector includes a first ridge waveguide. The on-chip laser includes a second ridge waveguide. The on-chip laser is coupled with the passive waveguide by the second ridge waveguide, and the waveguide detector is coupled with the passive waveguide by the first ridge waveguide.

Claims (24)

1. A surface-mount laser apparatus, comprising:

an on-chip laser,

a single passive waveguide, and

a waveguide detector, wherein:

the waveguide detector comprises: a first ridge waveguide, and an electrode, wherein the electrode is configured to connect to a bonding pad on a base board, wherein the base board comprises an optical waveguide; and

the on-chip laser comprises a second ridge waveguide; and the on-chip laser is configured to output test light;

the single passive waveguide is configured to:

split the test light into first test light and second test light, wherein optical energy of the first test light is higher than optical energy of the second test light;

couple the first test light into the optical waveguide of the base board, wherein the first test light is output from the optical waveguide of the base board; and

couple the second test light directly into the waveguide detector; and

the waveguide detector is configured to determine, using the electrode, a photocurrent corresponding to the second test light, wherein the photocurrent is corresponding to optical power of the first test light detected after the first test light is output from the optical waveguide of the base board;

wherein the on-chip laser is coupled with the single passive waveguide by the second ridge waveguide; and

wherein the waveguide detector is coupled with the single passive waveguide by the first ridge waveguide.

2. The surface-mount laser apparatus according to claim 1 , wherein

the first test light is coupled into the optical waveguide of the base board by using an evanescent wave.

3. The surface-mount laser apparatus according to claim 2 , wherein the first ridge waveguide is covered by metal, and wherein the metal is used as the electrode of the waveguide detector.

4. The surface-mount laser apparatus according to claim 1 , wherein

the waveguide detector further comprises a deeply etched cavity surface.

5. The surface-mount laser apparatus according to claim 4 , wherein

the deeply etched cavity surface is covered by a dense substance with a preset thickness.

6. The surface-mount laser apparatus according to claim 4 , wherein the deeply etched cavity surface is a straight surface or an arc surface.

7. The surface-mount laser apparatus according to claim 1 , wherein

an included angle between the first ridge waveguide of the waveguide detector and the second ridge waveguide of the on-chip laser is within a preset range; and

the single passive waveguide comprises a curved waveguide.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2018
From: CHEN, KAISHENG; CHEN, HONGMIN
To: HUAWEI TECHNOLOGIES CO., LTD.
Reel/Frame 045810/0815 →
Priority Claims (1)
CN 201611249152.0 · Dec 29, 2016 · national
Continuity (1)
Related Publication 20180191128A1 · Jul 5, 2018
Cited By (1)
US 12,272,928