IP Library › Granted Patent US 10,927,460
Granted Patent B2
US 10,927,460 · App. 16/302,895 · Granted Feb 23, 2021

Raw material for forming thin film, and method for manufacturing thin film

Inventors: Hiroki Sato (Tokyo, JP); Naoki Yamada (Tokyo, JP); Tsubasa Shiratori (Tokyo, JP); Haruyoshi Sato (Tokyo, JP)
Assignee: ADEKA CORPORATION
C23C16/45553C23C16/40C23C16/405
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Quick Facts
Patent No.
US 10,927,460
App. No.
16/302,895
Granted
Feb 23, 2021
Kind
B2
Abstract

A raw material for forming a thin film that includes a compound represented by General Formula (1) below. In the formula, R 1 represents a linear or branched alkyl group having 2 to 4 carbon atoms; R 2 to R 5 each independently represent a linear or branched alkyl group having 1 to 4 carbon atoms; A represents an alkanediyl group having 1 to 4 carbon atoms; and M represents titanium, zirconium or hafnium. Provided that when M represents zirconium, A represents an alkanediyl group having 3 or 4 carbon atoms. When M represents titanium or hafnium, it is preferred that A represents an alkanediyl group having 2 or 3 carbon atoms. When M represents zirconium, it is preferred that A represent an alkanediyl group having 3 carbon atoms.

Claims (4)

1. A method for manufacturing a thin film, comprising: introducing a vapor including at least one compound selected from the group consisting of Compound No. 34 and Compound No. 66, which is obtained by vaporizing a raw material for forming a thin film that includes the at least one compound, into a film formation chamber in which a substrate is disposed; and forming, on a surface of the substrate, a thin film including at least one atom selected from the group consisting of zirconium and hafnium by inducing decomposition and/or chemical reaction of the at least one compound:

2. The method for manufacturing a thin film according to claim 1 , wherein a groove having an aspect ratio of 10 to 200 is formed on the substrate.

3. A method for manufacturing a thin film, comprising: introducing a vapor including at least one compound selected from the group consisting of Compound No. 34 and Compound No. 66, which is obtained by vaporizing a raw material for forming a thin film by an ALD method that includes the at least one compound, into a film formation chamber in which a substrate is disposed; and forming, on a surface of the substrate, a thin film including at least one atom selected from the group consisting of zirconium and hafnium by inducing decomposition and/or chemical reaction of the at least one compound:

4. The method for manufacturing a thin film according to claim 3 , wherein a groove having an aspect ratio of 10 to 200 is formed on the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2018
From: SATO, HIROKI; YAMADA, NAOKI; SHIRATORI, TSUBASA; SATO, HARUYOSHI
To: ADEKA CORPORATION
Reel/Frame 047543/0698 →
Priority Claims (1)
JP 2016-102628 · May 23, 2016 · national
Continuity (1)
Related Publication 20190292663A1 · Sep 26, 2019