IP Library › Granted Patent US 10,937,990
Granted Patent B2
US 10,937,990 · App. 16/091,394 · Granted Mar 2, 2021

Encapsulation film

Inventors: Hyun Jee Yoo (Daejeon, KR); Hyun Suk Kim (Daejeon, KR); Jung Ok Moon (Daejeon, KR); Se Woo Yang (Daejeon, KR); Jae Jin Kim (Daejeon, KR); Dae Han Seo (Daejeon, KR); Min Soo Song (Daejeon, KR); Jung Woo Lee (Daejeon, KR)
Assignee: LG CHEM LTD.
H01L51/5253B32B3/02B32B3/26B32B3/30B32B7/12B32B9/005B32B15/08B32B15/18B32B15/20B32B38/0004B32B38/105H01L51/5259H01L51/56B32B2038/0076B32B2307/724B32B2307/7244B32B2307/7246B32B2310/0843B32B2457/00B32B2457/206B32B2581/00H01L21/56H01L23/28H01L2251/556H01L2251/558
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Quick Facts
Patent No.
US 10,937,990
App. No.
16/091,394
Granted
Mar 2, 2021
Kind
B2
Abstract

The present application relates to an encapsulation film, a method of manufacturing the same, an organic electronic device including the same, and a method of manufacturing the organic electronic device using the same. The present application provides an encapsulation film which can be formed to have a structure in which moisture or oxygen flowing from the outside into an organic electronic device can be effectively blocked, has excellent handling properties and processability, and also has excellent bonding properties with an organic electronic element and durability.

Claims (28)

1. An encapsulation film for an organic electronic device, the encapsulation film comprising:

a metal layer having a first surface and a second surface opposite to the first surface; and

an encapsulation layer provided on the first surface and positioned inside an edge of the first surface so that a predetermined gap is formed between an edge of the encapsulation layer and the edge of the first surface, and

satisfying the following General Equation 1:

0.95 ≤a/b ≤25  [General Equation 1]

wherein “a” is a size of the gap and “b” is a thickness of the encapsulation layer,

wherein the encapsulation layer comprises a cured part at the edge thereof, and

wherein the encapsulation layer comes in contact with the entire surface of an organic electronic element.

2. The encapsulation film according to claim 1 , wherein the cured part has a width ranging from 10 μm to 1,100 μm.

3. The encapsulation film according to claim 1 , wherein the size of the gap, a, is in a range of 20 μm to 1,200 μm.

4. The encapsulation film according to claim 1 , wherein the metal layer comprises a protrusion having a size of 50 μm or less at an edge of some area of the second surface thereof.

5. The encapsulation film according to claim 1 , wherein the metal layer comprises any one of a metal, a metal oxide, a metal nitride, a metal carbide, a metal oxynitride, a metal oxyboride, and a mixture thereof.

6. The encapsulation film according to claim 1 , wherein the metal layer comprises any one of iron, aluminum, copper, nickel, silicon oxide, aluminum oxide, titanium oxide, indium oxide, tin oxide, indium tin oxide, tantalum oxide, zirconium oxide, niobium oxide, and a mixture thereof.

7. The encapsulation film according to claim 1 , further comprising a protective layer provided on the second surface of the metal layer and an adhesive layer provided between the metal layer and the protective layer.

8. The encapsulation film according to claim 1 , wherein the encapsulation layer is formed with a single layer or two or more layers.

9. The encapsulation film according to claim 1 , wherein the encapsulation layer comprises a first layer comprising an encapsulating resin having a glass transition temperature of 85° C. or more.

10. The encapsulation film according to claim 1 , wherein the encapsulation layer comprises a second layer comprising an encapsulating resin having a glass transition temperature of 0° C. or less.

11. The encapsulation film according to claim 1 , wherein the encapsulation layer comprises a moisture absorbent.

12. A method of manufacturing the encapsulation film according to claim 1 comprising cutting a side of the encapsulation layer.

13. The method according to claim 12 comprising cutting a side of the metal layer.

14. The method according to claim 12 , wherein the cutting of a side of an encapsulation layer is performed using a CO2 laser or an optical fiber laser.

15. The method according to claim 13 , wherein the cutting of a side of the metal layer is performed using a CO 2 laser, an optical fiber laser or a knife cutter.

16. The method according to claim 12 , wherein the cutting of a side of the encapsulation layer is performed using a laser beam having a size of 30 μm to 1,000 μm.

17. The method according to claim 13 , wherein the cutting of a side of the metal layer is performed using a laser beam having a size of 1 μm to 30 μm.

18. An organic electronic device comprising a substrate, an organic electronic element formed on the substrate, and the encapsulation film according to claim 1 configured to encapsulate an entire surface of the organic electronic element.

19. A method of manufacturing an organic electronic device, comprising:

applying the encapsulation film according to claim 1 to a substrate having an organic electronic element formed thereon so as to cover the organic electronic element; and

curing the encapsulation film.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2018
From: YOO, HYUN JEE; KIM, HYUN SUK; MOON, JUNG OK; YANG, SE WOO; KIM, JAE JIN; SEO, DAE HAN; SONG, MIN SOO; LEE, JUNG WOO
To: LG CHEM, LTD.
Reel/Frame 047841/0939 →
Priority Claims (2)
KR 10-2016-0044519 · Apr 12, 2016 · national
KR 10-2016-0044520 · Apr 12, 2016 · national
Continuity (1)
Related Publication 20190157612A1 · May 23, 2019
Cited By (1)
US 12,315,770