IP Library › Granted Patent US 10,948,412
Granted Patent B2
US 10,948,412 · App. 15/755,716 · Granted Mar 16, 2021

Method and system for screening nanoparticle, and nanoparticle and method of producing the same

Inventors: Hiroyuki Nakamura (Ibaraki, JP); Maki Saeki (Fukuoka, JP); Masanori Tanaka (Fukuoka, JP); Eiichi Kanaumi (Fukuoka, JP)
Assignees: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY; NS MATERIALS INC.
G01N21/6428C09K11/06C09K11/565C09K11/883G01N21/31G01N21/3103G01N21/6489G01N2021/6439
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Quick Facts
Patent No.
US 10,948,412
App. No.
15/755,716
Granted
Mar 16, 2021
Kind
B2
Abstract

Particularly provided is a method and a system for screening nanoparticles which allow effective search of conditions for surface modification of nanoparticles and reduction in the time, the labor, and the amount of a sample required for the surface modification compared with conventional techniques. The method for screening nanoparticles includes the steps of: dividing a nanoparticle suspension for a respective plurality of containers provided in a containment receptacle; performing surface modification on nanoparticles under different conditions for the respective containers; preparing evaluation samples by adding a dispersion medium into each container and mixing the nanoparticles and the dispersion medium; and performing evaluation on the evaluation sample in each container by optical analysis.

Claims (15)

1. A method for screening nanoparticles, comprising:

dividing a nanoparticle suspension for a respective plurality of containers provided in a containment receptacle;

performing surface modification on nanoparticles for the respective containers;

incubating all the nanoparticle suspensions at one time under same conditions;

preparing evaluation samples by adding a dispersion medium into each container and mixing the nanoparticles and the dispersion medium; and

performing evaluation on the evaluation sample in each container by optical analysis,

wherein the containers are arranged in a matrix, a same surface modifier is used for the containers arranged in either ones of rows or columns and different surface modifiers are used for the containers arranged in the other of the rows and columns, and same surface modification conditions other than the surface modifiers are used for the containers arranged in the other of the rows and columns, and different surface modification conditions are used for the containers arranged in the ones of rows or columns,

wherein the surface modifiers and the surface modification conditions are adjusted on a column-by-column basis or on a row-by-row basis,

wherein the evaluation is performed using a plurality of light emitting diodes, as a light source, arranged to face the plurality of containers, using a plurality of light receiving elements, as a light receiving unit, arranged to face the plurality of containers, and

wherein the light emitting diodes and the light receiving elements are provided to face each other with a predetermined distance from the containment receptacle.

2. The method for screening nanoparticles according to claim 1 , wherein in the evaluation, an absorption spectrum and a fluorescence spectrum of the sample in each container are measured to evaluate dispersibility and fluorescence characteristics of the nanoparticles.

3. The method for screening nanoparticles according to claim 1 , wherein 20 μL or less of the nanoparticle suspension is added into each of 50 or more containers.

4. The method for screening nanoparticles according to claim 1 , wherein the containment receptacle is made of a material having good thermal conductivity, and the method further comprises simultaneously incubating the nanoparticles contained in the respective containers.

5. The method for screening nanoparticles according to claim 4 , wherein vacuum degassing is performed before, during, or after the incubation.

6. The method for screening nanoparticles according to claim 1 , wherein the containers constitute detachable individual receptacles, and the individual receptacles can be detached from the containment receptacle for individual treatments.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2018
From: NAKAMURA, HIROYUKI; SAEKI, MAKI; TANAKA, MASANORI; KANAUMI, EIICHI
To: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY; NS MATERIALS INC.
Reel/Frame 045997/0690 →
Priority Claims (2)
JP JP2015-169736 · Aug 28, 2015 · national
JP JP2015-169739 · Aug 28, 2015 · national
Continuity (1)
Related Publication 20190025211A1 · Jan 24, 2019
Cited By (1)
US 12,649,863