X-ray fluorescence analysis device, and spectrum display method used in same
In order to identify fluorescent X-rays and diffracted X-rays in a software without changing a configuration of an X-ray fluorescence analysis apparatus and to display fluorescent X-ray information and diffracted X-ray information on peaks in a spectrum, the X-ray fluorescence analysis apparatus having an X-ray tube that emits X-rays to a sample and a detector that detects X-rays from the sample and generating and displaying a spectrum indicating a relationship between X-ray energy and an element content based on the X-rays detected by the detector, includes: an identification information generation unit that generates identification information specifying a peak position by a diffracted X-ray caused by a crystal structure of the sample; and a display control unit that displays the diffracted X-ray information on a peak in the spectrum based on the identification information.
1. An X-ray fluorescence analysis apparatus having an X-ray tube that emits X-rays to a sample and a detector that detects X-rays from the sample and generating and displaying a spectrum indicating a relationship between X-ray energy and an element content based on the X-rays detected by the detector, the X-ray fluorescence analysis apparatus comprising:
an identification information generation unit that generates identification information specifying a peak position due to a diffracted X-ray caused by a crystal structure of the sample and identification information specifying a peak position due to fluorescent X-rays caused by elements contained in the sample; and
a display control unit that displays diffracted X-ray information, fluorescent X-ray information, or both diffracted X-ray information and fluorescent X-ray information at each peak in the spectrum based on the identification information.
2. The X-ray fluorescence analysis apparatus according to claim 1 ,
wherein the identification information includes information specifying a peak position due to a fluorescent X-ray caused by an element included in the sample, and
wherein the display control unit displays the fluorescent X-ray information and the diffracted X-ray information in the spectrum based on the identification information.
3. The X-ray fluorescence analysis apparatus according to claim 1 , wherein the identification information generation unit specifies the peak position due to the diffracted Xray based on a type of the crystal structure of the sample input by the input device.
4. The X-ray fluorescence analysis apparatus according to claim 1 ,
wherein the identification information generation unit generates the identification information respectively based on a plurality of types of the crystal structures, and
wherein the display control unit displays the diffracted X-ray information on the peak in the spectrum based on at least one piece of the identification information selected from a plurality of pieces of the identification information.
5. A spectrum display method used for an X-ray fluorescence analysis apparatus having an X-ray tube that emits X-rays to a sample and a detector that detects X-rays from the sample and generating and displaying a spectrum indicating a relationship between X-ray energy and an element content based on the X-rays detected by the detector, the spectrum display method comprising:
an identification information generating step of generating identification information specifying a peak position due to a diffracted X-ray caused by a crystal structure of the sample and identification information specifying a peak position due to fluorescent X-rays caused by elements contained in the sample; and
a displaying step of displaying diffracted X-ray information, fluorescent X-ray information, or both diffracted X-ray information and fluorescent X-ray information at each peak in the spectrum based on the identification information.