Granted Patent B2

US 12,480,896 · App. 18/161,389 · Granted Nov 25, 2025

Inventors: Yannai Z. R. Segal (Calgary, CA); Grant I. Sanden (Calgary, CA)

Assignee: Enersoft Inc.

G01N23/223G01N23/2204G01N23/2206G01N23/2208G01N33/241G01N2223/076G01N2223/507G01N2223/616

Abstract

Claims (107)

1 . A sample tray, comprising:

an elongate housing defining:

a plurality of sample chambers formed in an upper surface of the elongate housing;

a plurality of ports positioned on a side of the elongate housing; and

a plurality of passages, each passage providing communication between an interior of a respective one of the plurality of sample chambers and an interior of a respective one of the plurality of ports;

wherein each passage of the plurality of passages forms an angle with respect to the upper surface of the elongate housing of the sample tray such that a material disposed within one of the plurality of sample chambers is maintained within the one of the plurality of sample chambers when the sample tray is positioned such that the upper surface of the elongate housing is substantially horizontal, and such that the material disposed within the one of the plurality of sample chambers is transferred, via an associated passage of the plurality of passages, into an associated port of the plurality of ports, when the sample tray is positioned such that the upper surface of the elongate housing is angled with respect to horizontal; and

wherein each port of the plurality of ports is configured to attach to a vial such that a seal between the vial and a respective port of the plurality of ports is maintained by friction therebetween when the vial is attached to the respective port of the plurality of ports.

2 . A geological analysis system comprising:

at least one frame;

a plurality of sensors, each sensor in the plurality of sensors moveably mounted on the at least one frame, the plurality of sensors comprising an X-ray fluorescence (XRF) sensor and a spectrometer, the XRF sensor comprising an X-ray emitter and an X-ray fluorescence detector;

a sample tray defining a plurality of sample chambers; and

a processor configured, for each of one or more sample chambers in the plurality of sample chambers, to:

(i) cause one or both of the sample tray and the plurality of sensors to be positioned with respect to the other so that a respective one of the plurality of sample chambers of the sample tray is positioned in a first analysis position with respect to the XRF sensor such that the XRF sensor is positioned to perform X-ray fluorescence on a geological sample material disposed in the respective one of the plurality of sample chambers;

(ii) cause the geological sample material disposed in the respective one of the plurality of sample chambers to be irradiated with X-ray radiation emitted from the X-ray emitter;

(iii) cause X-ray fluorescence emitted from the geological sample material disposed in the respective one of the plurality of sample chambers to be detected by the X-ray fluorescence detector;

(iv) cause one or both of the sample tray and the plurality of sensors be positioned with respect to the other so that the respective one of the plurality of sample chambers of the sample tray is positioned a second analysis position with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the geological sample material; and

(v) cause the spectrometer to sense the one or more properties of the geological sample material disposed in the respective one of the plurality of sample chambers.

3 . The geological analysis system according to claim 2 , wherein the sample tray comprises:

an elongate housing defining the plurality of sample chambers formed in an upper surface of the elongate housing, a plurality of ports, and a plurality of passages, each passage providing communication between an interior of one of the plurality of sample chambers and an interior of one of the plurality of ports;

wherein each passage of the plurality of passages forms an angle with respect to the upper surface of the elongate housing of the sample tray such that a material disposed within one of the plurality of sample chambers is maintained within the one of the plurality of sample chambers when the sample tray is positioned such that the upper surface of the elongate housing is substantially horizontal, and such that the material disposed within the one of the plurality of sample chambers is transferred, via an associated passage of the plurality of passages, into an associated port of the plurality of ports, when the sample tray is positioned such that the upper surface of the elongate housing is angled with respect to horizontal; and

wherein each port of the plurality of ports is configured to attach to a vial such that a seal between the vial and a respective port of the plurality of ports is maintained by friction therebetween when the vial is attached to the respective port of the plurality of ports.

4 . The geological analysis system according to claim 2 , further comprising robotics configured to control positioning of the sample tray semi-automatically or fully-automatically.

5 . The geological analysis system according to claim 2 , wherein the spectrometer is configured to measure a relative absorption of light in a range of wavelengths of about 1710 nm, about 1910 nm, and/or about 2450 nm to determine a presence of hydrocarbons.

6 . The geological analysis system according to claim 2 , wherein the spectrometer is a short-wave infrared (SWIR) spectrometer, a visible-light spectrometer, or a passive gamma spectrometer.

7 . The geological analysis system according to claim 6 , wherein the spectrometer comprises any one of a prism, a diffraction grating, and an interferometer.

8 . The geological analysis system according to claim 2 , wherein the spectrometer is an imaging spectrometer, a line-scanning spectrometer, or a point spectrometer.

9 . A geological analysis system comprising:

at least one frame;

a plurality of sensors, each sensor in the plurality of sensors moveably mounted on the at least one frame, the plurality of sensors comprising an X-ray fluorescence (XRF) sensor and a spectrometer, the XRF sensor comprising an X-ray emitter and an X-ray fluorescence detector;

a sample tray defining a plurality of sample chambers; and

a processor configured to:

control a position of sample tray by moving one or both of the sample tray and the plurality of sensors with respect to the other,

wherein the sample tray is positionable in a first analysis position with respect to the XRF sensor such that a geological sample material disposed in one of the plurality of sample chambers is irradiated by X-ray radiation emitted from the X-ray emitter and that X-ray fluorescence emitted from the geological sample material is detected by the X-ray fluorescence detector, and

wherein the sample tray is positionable in a second analysis position with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the geological sample material; and

control an operation of the plurality of sensors.

10 . The geological analysis system according to claim 9 , wherein the sample tray comprises:

an elongate housing defining the plurality of sample chambers formed in an upper surface of the elongate housing, a plurality of ports, and a plurality of passages, each passage of the plurality of passages providing communication between an interior of one of the plurality of sample chambers and an interior of one of the plurality of ports;

wherein each passage of the plurality of passages forms an angle with respect to the upper surface of the elongate housing of the sample tray such that a material disposed within one of the plurality of sample chambers is maintained within the one of the plurality of sample chambers when the sample tray is positioned such that the upper surface of the elongate housing is substantially horizontal, and such that the material disposed within the one of the plurality of sample chambers is transferred, via an associated passage of the plurality of passages, into an associated port of the plurality of ports, when the sample tray is positioned such that the upper surface of the elongate housing is angled with respect to horizontal; and

wherein each port of the plurality of ports is configured to attach to a vial such that a seal between the vial and a respective port of the plurality of ports is maintained by friction therebetween when the vial is attached to the respective port of the plurality of ports.

11 . The geological analysis system according to claim 9 , further comprising robotics configured to control positioning of the sample tray semi-automatically or fully-automatically.

12 . The geological analysis system according to claim 9 , wherein the spectrometer is configured to measure a relative absorption of light in a range of wavelengths of about 1710 nm, about 1910 nm, and/or about 2450 nm to determine a presence of hydrocarbons.

13 . The geological analysis system according to claim 9 , wherein the spectrometer is a short-wave infrared (SWIR) spectrometer, a visible-light spectrometer, or a passive gamma spectrometer; wherein the spectrometer is an imaging spectrometer, a line-scanning spectrometer, or a point spectrometer; and/or

wherein the spectrometer comprises any one of a prism, a diffraction grating, and an interferometer.

14 . The geological analysis system according to claim 9 , wherein the processor is further configured to:

cause the sample tray to be positioned with respect to the spectrometer such that a first geological sample material disposed in a first sample chamber in the plurality of sample chambers is positioned with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the first geological sample material;

cause an absorption of light of the first geological sample material to be detected by the spectrometer;

cause the sample tray to be positioned with respect to the spectrometer such that a second geological sample material disposed in a second sample chamber in the plurality of sample chambers is positioned with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the second geological sample material;

cause an absorption of light of the second geological sample material to be detected by the spectrometer; and

determine an abundance of a target substance in the first geological sample material and the second geological sample material based on the absorption of light of the first geological sample material and the absorption of light of the second geological sample material.

15 . The geological analysis system according to claim 9 , wherein the processor is further configured to:

cause the sample tray to be positioned with respect to the X-ray emitter such that a first geological sample material disposed in a first sample chamber in the plurality of sample chambers is positioned with respect to the XRF sensor;

cause the first geological sample material to be irradiated with X-ray radiation emitted from the X-ray emitter;

cause X-ray fluorescence emitted from the first geological sample material to be detected by the X-ray fluorescence detector;

cause the sample tray to be positioned with respect to the X-ray emitter such that a second geological sample material disposed in a second sample chamber in the plurality of sample chambers is positioned with respect to the XRF sensor;

cause the second geological sample material to be irradiated with X-ray radiation emitted from the X-ray emitter;

cause X-ray fluorescence emitted from the second geological sample material to be detected by the X-ray fluorescence detector;

determine one or more properties of the first geological sample material and one or more properties of the second geological sample material based on the X-ray fluorescence of the first geological sample material and on the X-ray fluorescence of the second geological sample material; and

determine a location of a target substance in a geological formation based on the one or more properties of the first geological sample material and the one or more properties of the second geological sample material.

16 . The geological analysis system according to claim 15 , wherein the one or more properties comprise salinity.

17 . The geological analysis system according to claim 15 , wherein the processor is further configured to:

cause the sample tray to be positioned with respect to the spectrometer such that the first geological sample material disposed in the first sample chamber in the plurality of sample chambers is positioned with respect to the spectrometer such that the spectrometer is positioned to sense the one or more properties of the first geological sample material;

cause an absorption of light of the first geological sample material to be detected by the spectrometer;

cause the sample tray to be positioned with respect to the spectrometer such that the second geological sample material disposed in the second sample chamber in the plurality of sample chambers positioned with respect to the spectrometer such that the spectrometer is positioned to sense the one or more properties of the second geological sample material;

cause an absorption of light of the second geological sample material to be detected by the spectrometer; and

determine an abundance of the target substance in the first geological sample material and the second geological sample material based on the absorption of light of the first geological sample material and the absorption of light of the second geological sample material.

18 . The geological analysis system according to claim 17 , wherein the location of the target substance in the geological formation is further based on the abundance of target substance in the first geological sample material and the second geological sample material.

19 . An X-ray fluorescence (XRF) unit comprising:

a body; and

a head comprising:

an X-ray emitter positioned to emit X-ray radiation onto a geological sample material;

an X-ray fluorescence detector configured to detect X-ray fluorescence emitted from the geological sample material; and

an output port for emitting an inert gas onto the geological sample material;

wherein the head is configured such that X-ray radiation emitted from the X-ray emitter is incident directly on the geological sample material without being transmitted through any solid material between the X-ray emitter and the geological sample material.

20 . The XRF unit according to claim 19 , further comprising an attachment portion mechanically attached to the head,

wherein the head further comprises a first passage,

the attachment portion comprises a second passage corresponding to the first passage, and

wherein the first passage and the second passage, together, form a conduit for the inert gas to pass therethrough between the output port and the geological sample material.

21 . A method of determining an abundance of a target substance in a geological formation, the method comprising:

causing a sample tray to be positioned with respect to a spectrometer such that a first geological sample material disposed in a first sample chamber in a plurality of sample chambers formed within the sample tray with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the first geological sample material;

causing an absorption of light of the first geological sample material to be detected by the spectrometer;

causing the sample tray to be positioned with respect to the spectrometer such that a second geological sample material disposed in a second sample chamber in the plurality of sample chambers formed within the sample tray is positioned with respect to the spectrometer such that the spectrometer is positioned to sense one or more properties of the second geological sample material;

causing an absorption of light of the second geological sample material to be detected by the spectrometer; and

determining an abundance of the target substance in the first geological sample material and the second geological sample material based on the absorption of light of the first geological sample material and the absorption of light of the second geological sample material.

22 . The method according to claim 21 , further comprising: determining a location of the target substance in the geological formation based on the abundance of the target substance in the first geological sample material and the second geological sample material.

23 . The method according to claim 21 , further comprising: providing a plurality of geological sample materials, obtained from a geological formation, within the plurality of sample chambers formed within the sample tray.

24 . The method according to claim 21 , wherein the target substance comprises one or more hydrocarbons.

25 . The method according to claim 21 , wherein the geological formation comprises a reservoir.

26 . A method of determining a location of a target substance in a geological formation, the method comprising:

causing a sample tray to be positioned with respect to an X-ray emitter such that a first geological sample material disposed in a first sample chamber in a plurality of sample chambers formed within the sample tray is positioned with respect to the X-ray emitter;

causing the first geological sample material to be irradiated with X-ray radiation emitted from the X-ray emitter;

causing X-ray fluorescence emitted from the first geological sample material to be detected by an X-ray fluorescence detector;

causing the sample tray to be positioned with respect to the X-ray emitter such that a second geological sample material disposed in a second sample chamber in the plurality of sample chambers formed within the sample tray is positioned with respect to the X-ray emitter;

causing the second geological sample material to be irradiated with X-ray radiation emitted from the X-ray emitter;

causing X-ray fluorescence emitted from the second geological sample material to be detected by the X-ray fluorescence detector;

determining one or more properties of the first geological sample material and one or more properties of the second geological sample material based on the X-ray fluorescence of the first geological sample material and on the X-ray fluorescence of the second geological sample material; and

determining a location of the target substance in the geological formation based on the one or more properties of the first geological sample material and the one or more properties of the second geological sample material.

27 . The method according to claim 26 , wherein the one or more properties comprise salinity.

28 . The method according to claim 26 , wherein the geological formation comprises a reservoir.

29 . The method according to claim 26 , further comprising:

causing the sample tray to be positioned with respect to a spectrometer such that the first geological sample material disposed in the first sample chamber in the plurality of sample chambers is positioned with respect to the spectrometer such that the spectrometer is positioned to sense the one or more properties of the first geological sample material;

causing an absorption of light of the first geological sample material to be detected by the spectrometer;

causing the sample tray to be positioned with respect to the spectrometer such that the second geological sample material disposed in the second sample chamber in the plurality of sample chambers positioned with respect to the spectrometer such that the spectrometer is positioned to sense the one or more properties of the second geological sample material;

causing an absorption of light of the second geological sample material to be detected by the spectrometer; and

determining an abundance of the target substance in the first geological sample material and the second geological sample material based on the absorption of light of the first geological sample material and the absorption of light of the second geological sample material.

30 . The method according to claim 29 , wherein the location of the target substance in the geological formation is further based on the abundance of target substance in the first geological sample material and the second geological sample material.

31 . The method according to claim 26 , further comprising: providing a plurality of geological sample materials, obtained from a geological formation, within the plurality of sample chambers formed within the sample tray.

32 . The method according to claim 26 , wherein the target substance comprises one or more hydrocarbons.

Assignments (1)

Continuity (3)

References Cited (188)

Cited By (1)

US 12,704,440