Measuring method, measuring arrangement and measuring device
A measuring method includes: illuminating a silicone-coated layer using a light source; and imaging light from the light source that is specularly reflected from the silicone-coated layer to form an image of a surface of the silicone-coated layer. The method further includes detecting pores and/or voids in a silicone coating of the silicone-coated layer from the image; determining a silicone coverage of the silicone-coated layer based on the detected pores and/or voids; and determining a release force of the silicone-coated layer based on the silicone coverage.
1. A measuring method comprising:
illuminating a silicone-coated layer using a light source;
imaging light from the light source that is specularly reflected from the silicone-coated layer to form an image of a surface of the silicone-coated layer;
detecting pores and/or voids in a silicone coating of the silicone-coated layer from the image;
determining a silicone coverage of the silicone coating based on the detected pores and/or voids; and
determining a release force of the silicone-coated layer based on the silicone coverage of the silicone coating.
2. The method as claimed in claim 1 , wherein the silicone-coated layer is a moving web.
3. The method as claimed in claim 1 , wherein the silicone-coated layer is a silicone-coated paper.
4. The method as claimed in claim 2 , wherein the silicone-coated layer is a silicone-coated paper.
5. A measuring arrangement comprising:
a silicone-coated layer;
a light source configured to direct a beam of light to a surface of the silicone-coated layer at a desired angle;
an imaging measuring device configured to form an image of a specular reflection surface of the silicone-coated layer; and
a processor programmed to:
detect pores and/or voids in a silicone coating of the silicone-coated layer from the image;
determine a silicone coverage of the silicone coating based on the detected pores and/or voids; and
determine a release force of the silicone-coated layer based on the silicone coverage of the silicone coating.
6. The arrangement as claimed in claim 5 , wherein the silicone-coated layer is a moving web.
7. The arrangement as claimed in claim 5 , wherein the silicone-coated layer is a silicone-coated paper.
8. The arrangement as claimed in claim 6 , wherein the silicone-coated layer is a silicone-coated paper.
9. A measuring device comprising:
a light source configured to direct a beam of light to a surface of a silicone-coated layer at a desired angle;
an imaging measuring device, adapted configured to form an image of a specular reflection surface of the silicone-coated layer; and
a processor programmed to:
detect pores and/or voids in a silicone coating of the silicone-coated layer from the image;
determine a silicone coverage of the silicone coating based on the detected pores and/or voids; and
determine a release force of the silicone-coated layer based on the silicone coverage of the silicone coating.