IP Library › Granted Patent US 10,971,206
Granted Patent B2
US 10,971,206 · App. 16/751,392 · Granted Apr 6, 2021

Semiconductor memory device

Inventors: Jae-Seung Lee (Gyeonggi-do, KR); No-Geun Joo (Gyeonggi-do, KR)
Assignee: SK hynix Inc.
G11C11/40611G11C11/408G11C11/40603
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Quick Facts
Patent No.
US 10,971,206
App. No.
16/751,392
Granted
Apr 6, 2021
Kind
B2
Abstract

A semiconductor memory device includes a first count circuit suitable for counting a first clock signal which continuously toggles in each burst refresh cycle, and generating a first count code signal, based on a burst refresh command signal; a cycle guide circuit suitable for generating a second clock signal which toggles once in each burst refresh cycle, based on the burst refresh command signal and a precharge signal; a second count circuit suitable for counting the second clock signal and generating a second count code signal; and a control circuit suitable for generating a latch control signal for latching a target address in each burst refresh cycle, based on the first count code signal and the second count code signal.

Claims (14)

1. A semiconductor memory device comprising:

a first count circuit suitable for counting a first clock signal which continuously toggles in each burst refresh cycle, and generating a first count code signal, based on a burst refresh command signal;

a cycle guide circuit suitable for generating a second clock signal which toggles once in each burst refresh cycle, based on the burst refresh command signal and a precharge signal;

a second count circuit suitable for counting the second clock signal and generating a second count code signal; and

a control circuit suitable for generating a latch control signal for latching a target address in each burst refresh cycle, based on the first count code signal and the second count code signal,

wherein the control circuit comprises:

a comparison unit suitable for generating a comparison signal corresponding to a result of comparing a first count value corresponding to the first count code signal and a second count value corresponding to the second count code signal;

a limiting unit suitable for generating a limit signal which is activated for a limit period, based on the comparison signal and the burst refresh command signal; and

an output unit suitable for outputting the latch control signal which toggles for the limit period, based on the limit signal and the first clock signal.

2. The semiconductor memory device according to claim 1 , the control circuit generates the latch control signal when a first count value corresponding to the first count code signal and a second count value corresponding to the second count code signal are the same.

3. The semiconductor memory device according to claim 1 , wherein the first count circuit counts the first clock signal during each burst refresh cycle after being initialized in each burst refresh cycle in response to the burst refresh command signal.

4. The semiconductor memory device according to claim 1 , wherein the cycle guide circuit generates the second clock signal which is activated based on the burst refresh command signal and is deactivated based on the precharge signal.

5. The semiconductor memory device according to claim 1 , further comprising:

a cycle conversion circuit suitable for generating the first clock signal which toggles non-cyclically, based on a third clock signal which toggles cyclically.

Priority Claims (1)
KR 10-2017-0046754 · Apr 11, 2017 · national
Continuity (2)
Division 15832063 · Dec 5, 2017
Related Publication 20200160903A1 · May 21, 2020
Cited By (1)
US 12,488,826