X-ray detection optics for small-angle X-ray scatterometry
An X-ray apparatus includes a mount, an X-ray source, a detector, an actuator, and a controller. The mount is configured to hold a sample. The X-ray source is configured to direct a beam of X-rays toward a first side of the sample. The detector is positioned on a second side of the sample, opposite the first side, so as to receive at least a portion of the X-rays that have been transmitted through the sample and to output signals indicative of an intensity of the received X-rays. The actuator is configured to scan the detector over a range of positions on the second side of the sample so as to measure the transmitted X-rays as a function of a scattering angle. The controller is coupled to receive the signals output by the detector and to control the actuator, responsively to the signals, so as to increase an acquisition time of the detector at first positions where the intensity of the received X-rays is weak relative to the acquisition time at second positions where the intensity of the received X-rays is strong.
1. An X-ray apparatus, comprising:
a mount, which is configured to hold a sample;
an X-ray source, which is configured to direct a beam of X-rays toward a first side of the sample;
a detector, which comprises an array of sensor elements having a predefined pitch, and is positioned on a second side of the sample, opposite the first side, so as to receive at least a portion of the X-rays that have been transmitted through the sample and to output signals indicative of an intensity of the received X-rays;
an actuator, which is configured to scan the detector over a range of positions on the second side of the sample so as to measure the transmitted X-rays as a function of a scattering angle, wherein the actuator is configured to step the detector across the range of positions with a resolution that is finer than the predefined pitch; and
a controller, which is coupled to receive the signals output by the detector and to control the actuator, responsively to the signals, so as to increase an acquisition time of the detector at first positions where the intensity of the received X-rays is weak relative to the acquisition time at second positions where the intensity of the received X-rays is strong.
2. The apparatus according to claim 1 , wherein the array comprises a two-dimensional matrix of the sensor elements, and the actuator is configured to step the detector with the resolution that is finer than the pitch along both height and width axes of the matrix.
3. The apparatus according to claim 1 , wherein the sample comprises one or more high aspect ratio (HAR) features having an aspect ratio larger than ten, and wherein the actuator is configured to scan the detector over the range of positions so as to measure the transmitted X-rays scattered from the HAR features.
4. The apparatus according to claim 1 , wherein the controller is configured to control the acquisition time so that the detector receives a predefined intensity range at the first and second positions.
5. A method, comprising:
holding a sample on a mount;
directing a beam of X-rays toward a first side of the sample;
receiving, from a detector, which comprises an array of sensor elements having a predefined pitch, and is positioned on a second side of the sample, opposite the first side, at least a portion of the X-rays that have been transmitted through the sample, and outputting signals indicative of an intensity of the received X-rays;
scanning, by an actuator, the detector over a range of positions on the second side of the sample, by stepping the detector across the range of positions with a resolution that is finer than the predefined pitch so as to measure the transmitted X-rays as a function of a scattering angle; and
receiving the signals output by the detector and controlling the actuator, responsively to the signals, so as to increase an acquisition time of the detector at first positions where the intensity of the received X-rays is weak relative to the acquisition time at second positions where the intensity of the received X-rays is strong.
6. The method according to claim 5 , wherein the array comprises a two-dimensional matrix of the sensor elements, and scanning the detector comprises stepping the detector with the resolution that is finer than the pitch along both height and width axes of the matrix.
7. The method according to claim 5 , wherein the sample comprises one or more high aspect ratio (HAR) features having an aspect ratio larger than ten, and measuring the transmitted X-rays scattered from the HAR features by scanning the detector over the range of positions.
8. The method according to claim 5 , wherein controlling the actuator comprises controlling the acquisition time so that the detector receives a predefined intensity range at the first and second positions.
9. An X-ray apparatus, comprising:
a first mount, which is configured to hold a sample;
an X-ray source, which is configured to direct a beam of X-rays toward the sample;
a detector, which is positioned to receive the X-rays that have been transmitted through the sample, wherein at least part of the transmitted beams are scattered from the sample over a range of angles; and
a beam blocker, which comprises:
a second mount made of a material that is transparent to the X-rays; and
one or more pieces of an X-ray opaque material held within the second mount, such that the X-ray opaque material is entirely surrounded by the material that is transparent to the X-rays,
wherein the beam blocker is positionable so that the X-ray opaque material at least attenuates the X-rays in a part of the range of angles, while the X-rays at the angles surrounding the at least attenuated part of the range pass through the mount to the detector.
10. The apparatus according to claim 9 , wherein at least one of the pieces of the X-ray opaque material is ellipsoidal.
11. The apparatus according to claim 9 , wherein the mount comprises a polymer.
12. The apparatus according to claim 9 , wherein the mount comprises diamond.
13. The apparatus according to claim 9 , wherein at least part of the at least attenuated X-rays comprise X-rays transmitted through the sample without being scattered.
14. The apparatus according to claim 9 , and comprising a processor, which is configured to measure an intensity of the X-rays received by the detector, and to position the beam blocker relative to the transmitted beam responsively to the measured intensity.
15. The apparatus according to claim 9 , wherein at least one of the pieces of the X-ray opaque material is held within a recess of the mount.
16. The apparatus according to claim 9 , wherein the mount comprises a sheet made from (i) biaxially-oriented polyethylene terephthalate (BoPET) polyester, or (ii) poly (4,4′-oxydiphenylene-pyromellitimide) polyimide.
17. The apparatus according to claim 9 , wherein at least one of the pieces of the X-ray opaque material comprises gold, tantalum, or tungsten.
18. The apparatus according to claim 9 , wherein the pieces of the X-ray opaque material comprise at least a first piece and a second piece, having a different size and laid out in an array at a predefined distance from one another.