IP Library › Granted Patent US 10,989,820
Granted Patent B2
US 10,989,820 · App. 16/185,341 · Granted Apr 27, 2021

Radiation detector

Inventors: Peiyan Cao (Shenzhen, CN); Yurun Liu (Shenzhen, CN)
Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
G01T1/241A61B6/032A61B6/4208A61B6/4233G01N23/046G01T1/247G01T1/2928G01V5/0025A61B6/14A61B6/502
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Quick Facts
Patent No.
US 10,989,820
App. No.
16/185,341
Granted
Apr 27, 2021
Kind
B2
Abstract

Disclosed herein is a radiation detector, comprising: a radiation absorption layer comprising an electrode; a voltage comparator that compares a voltage of the electrode to a first threshold; a counter that registers a number of photons of radiation absorbed by the radiation absorption layer; a controller; and a voltmeter. The controller is configured to start a time delay from a time at which the voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold. The controller is configured to cause the voltmeter to measure the voltage upon expiration of the time delay. The controller is configured to determine the number of photons by dividing the voltage measured by the voltmeter by a voltage that a single photon would have caused on the electrode. The controller can cause the number registered by the counter to increase by the number of photons.

Claims (33)

1. A radiation detector, comprising:

a radiation absorption layer comprising an electrode;

a voltage comparator configured to compare a voltage of the electrode to a first threshold;

a counter configured to register a number of photons of radiation absorbed by the radiation absorption layer;

a controller;

a voltmeter;

wherein the controller is configured to start a time delay from a time at which the voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;

wherein the controller is configured to cause the voltmeter to measure the voltage upon expiration of the time delay;

wherein the controller is configured to determine a number of photons by dividing the voltage measured by the voltmeter by a voltage that a single photon would have caused on the electrode;

wherein the controller is configured to cause the number registered by the counter to increase by the number of photons.

2. The radiation detector of claim 1 , further comprising a capacitor module electrically connected to the electrode, wherein the capacitor module is configured to collect charge carriers from the electrode.

3. The radiation detector of claim 1 , wherein the controller is configured to connect the electrode to an electrical ground.

4. The radiation detector of claim 1 , wherein the controller is configured to deactivate the voltage comparator at a beginning of the time delay.

5. The radiation detector of claim 1 , wherein the first threshold is 5-10% of a voltage a single photon generates on the electrode.

6. The radiation detector of claim 1 , wherein the radiation absorption layer comprises a diode.

7. The radiation detector of claim 1 , wherein the radiation absorption layer comprises silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof.

8. The radiation detector of claim 1 , wherein the apparatus does not comprise a scintillator.

9. The radiation detector of claim 1 , wherein the apparatus comprises an array of pixels.

10. A system comprising the radiation detector of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human chest or abdomen.

11. A system comprising the radiation detector of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human mouth.

12. A cargo scanning or non-intrusive inspection (NII) system, comprising the radiation detector of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using backscattered X-ray.

13. A cargo scanning or non-intrusive inspection (NII) system, comprising the radiation detector of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using X-ray transmitted through an object inspected.

14. A full-body scanner system comprising the radiation detector of claim 1 and an X-ray source.

15. An X-ray computed tomography (X-ray CT) system comprising the radiation detector of claim 1 and an X-ray source.

16. An electron microscope comprising the radiation detector of claim 1 , an electron source and an electronic optical system.

17. A system comprising the radiation detector of claim 1 , wherein the system is an X-ray telescope, or an X-ray microscopy, or wherein the system is configured to perform mammography, industrial defect detection, microradiography, casting inspection, weld inspection, or digital subtraction angiography.

18. A method comprising:

starting a time delay from a time at which an absolute value of a voltage of an electrode of a radiation absorption layer equals or exceeds an absolute value of a first threshold;

measuring the voltage upon expiration of the time delay;

determine a number of photons incident on the radiation absorption layer by dividing the voltage by a voltage that a single photon would have caused on the electrode;

increasing a count of X-ray photon incident on the X-ray absorption layer by the number of photons.

19. The method of claim 18 , further comprising connecting the electrode to an electrical ground.

20. The method of claim 18 , further comprising deactivating a first circuit at a beginning of or during the time delay.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2018
From: CAO, PEIYAN; LIU, YURUN
To: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Reel/Frame 047460/0808 →
Continuity (2)
Continuation PCTCN2017072175 · Jan 23, 2017
Related Publication 20190094393A1 · Mar 28, 2019
Cited By (1)
US 12,303,316