IP Library › Granted Patent US 10,990,079
Granted Patent B2
US 10,990,079 · App. 16/291,125 · Granted Apr 27, 2021

Fabricating apparatus, fabricating system, and fabricating method

Inventor: Yasuaki Yorozu (Kanagawa, JP)
Assignee: RICOH COMPANY, LTD
G05B19/4093B29B7/72B29C64/118B29C64/153B29C64/393B33Y40/00B33Y50/02B33Y10/00B33Y30/00B33Y50/00G05B2219/49
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Quick Facts
Patent No.
US 10,990,079
App. No.
16/291,125
Granted
Apr 27, 2021
Kind
B2
Abstract

A fabricating apparatus includes a fabricating device, a sensor, and a control unit. The fabricating device is configured to fabricate a fabrication layer according to fabrication data of a three-dimensional object. The sensor is configured to measure a shape of the fabrication layer. The control unit is configured to control the fabricating device according to the fabrication data and the shape of the fabrication layer measured with the sensor.

Claims (47)

1. A fabricating apparatus, comprising:

a fabricating device configured to fabricate an nth fabrication layer according to fabrication data of a three-dimensional object;

a sensor configured to measure a height from the fabricating device to the nth fabrication layer; and

a controller configured to control the fabricating device according to the fabrication data and the height measured with the sensor, wherein the controller is further configured to:

control the fabricating device upon the height of an nth fabrication layer, measured by the sensor, being greeter than or equal to a first threshold height and,

control the fabricating device for an (n+1)th fabrication layer,

to fabricate a first region relatively lower than the first threshold height, and to not fabricate a second region relatively higher than the first threshold height, wherein (n+1)th fabrication layers include the first region and the second region.

2. The fabricating apparatus of claim 1 ,

wherein the fabricating device is configured to divide the three-dimensional object into a plurality of sliced layers in a vertical direction and is configured to fabricate the plurality of sliced layers as a plurality of fabrication layers including the fabrication layer, and

the controller is configured to change fabrication data indicating a relatively upper fabrication layer to be fabricated on top of the fabrication layer including the height measured with the sensor.

3. The fabricating apparatus of claim 1 ,

wherein the sensor is configured to measure a height of the fabrication layer, and

wherein, upon a region of the fabrication layer measured with the sensor including a threshold height or a height relatively higher than the threshold height, the controller is configured to control the fabricating device not to fabricate another (n+1) fabrication layer onto the region including the threshold height or a height relatively higher than the threshold height.

4. The fabricating apparatus of claim 3 ,

wherein upon a region measured with the sensor including the threshold height or a height relatively higher than the threshold height,

the controller is configured to control the fabricating device to fabricate a relatively upper fabrication layer to be fabricated on top of the fabrication layer measured with the sensor, in another region different from the region measured with the sensor.

5. The fabricating apparatus of claim 1 ,

wherein the controller is configured to control the fabricating device to add another (n+1) fabrication layer in accordance with the height measured with the sensor.

6. The fabricating apparatus of claim 1 , wherein upon a region of the fabrication layer measured with the sensor including a height relatively lower than a threshold height, the controller is configured to control the fabricating device to increase an amount of fabrication material.

7. The fabricating apparatus of claim 1 ,

wherein the sensor is configured to measure a height of the fabrication layer, and

wherein, upon a region of the fabrication layer measured with the sensor including a threshold height or a height relatively higher than the threshold height, the controller is configured to control the fabricating device to fabricate another (n+1) fabrication layer, in a region relatively lower than the threshold height.

8. The fabricating apparatus of claim 1 , wherein the controller is further configured to:

control the fabricating device in fabricating an (n+2)th fabrication layer, to fabricate a region to a second threshold height.

9. A method for fabricating a three-dimensional object, the method, comprising:

fabricating, via a fabricating device, an nth fabrication layer according to fabrication data of the three-dimensional object;

measuring a height from the fabricating device to the nth fabrication layer; and

changing a fabricating operation of the nth fabrication layer according to the fabrication data and the height measured, the changing of the fabricating operation including

controlling the fabricating device upon the height of the nth fabrication layer, measured by the sensor, being greater than or equal to a first threshold height and,

for an (n+1)th fabrication layer, controlling the fabricating device to fabricate a first region relatively lower than the first threshold height, and to not fabricate a second region relatively higher than the first threshold height, wherein (n+1)th fabrication layers include the first region and the second region.

10. The method of claim 9 , wherein upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively lower than the threshold height, the fabricating device is controlled to increase an amount of fabrication material.

11. The method of claim 9 , wherein the measuring includes measuring a height of the fabrication layer, and

wherein, upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively higher than the threshold height, the fabricating device is controlled to not fabricate another (n+1) fabrication layer onto the region including the threshold height or a height relatively higher than the threshold height.

12. The method of claim 9 , wherein the measuring includes measuring a height of the fabrication layer, and

wherein, upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively higher than the threshold height, the fabricating device is controlled to fabricate another (n+1) fabrication layer, in a region relatively lower than the threshold height.

13. The method of claim 9 , further comprising:

controlling the fabricating device in fabricating an (n+2)th fabrication layer, to fabricate a region to a second threshold height.

14. A non-transitory computer readable medium storing a computer program including computer code, for execution by at least one processor, the at least one processor, upon execution of the computer code, being configured to fabricate a three-dimensional object via a method, comprising:

fabricating, via a fabricating device, an nth fabrication layer according to fabrication data of the three-dimensional object;

measuring a height from the fabricating device to the nth fabrication layer; and

changing a fabricating operation of the nth fabrication layer according to the fabrication data and the height measured, the changing of the fabricating operation including

controlling the fabricating device upon the height of the nth fabrication laver, measured by the sensor, being greater than or equal to a first threshold height and

for an (n+1)th fabrication layer, controlling the fabricating device to fabricate a first region relatively lower than the first threshold height, and to not fabricate a second region relatively higher than the first threshold height, wherein (n+1)th fabrication layers include the first region and the second region.

15. The non-transitory computer readable medium of claim 14 , wherein the at least one processor, upon execution of the computer code and upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively lower than the threshold height, is configured to control the fabricating device to increase an amount of fabrication material.

16. The non-transitory computer readable medium of claim 14 , wherein the at least one processor, upon execution of the computer code and upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively lower than the threshold height, is configured to control the fabricating device not fabricate another (n+1) fabrication layer onto the region including the threshold height or a height relatively higher than the threshold height.

17. The non-transitory computer readable medium of claim 14 , wherein the at least one processor, upon execution of the computer code and upon the measuring indicating that a region of the fabrication layer includes a threshold height or a height relatively lower than the threshold height, is configured to control the fabricating device to fabricate another (n+1) fabrication layer, in a region relatively lower than the threshold height.

18. The non-transitory computer readable medium of claim 14 , wherein the at least one processor, upon execution of the computer code, is configured to control the fabricating device in fabricating an (n+2)th fabrication layer, to fabricate a region to a second threshold height.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2019
From: YOROZU, YASUAKI
To: RICOH COMPANY, LTD.
Reel/Frame 048492/0653 →
Priority Claims (1)
JP JP2018-040758 · Mar 7, 2018 · national
Continuity (1)
Related Publication 20190275742A1 · Sep 12, 2019