Device including element having rectification characteristics and thin film transistor
A device includes a first element having rectification characteristics that allow electric current to flow from an upper electrode to a lower electrode, an n-channel thin film transistor, and a control electrode. The n-channel thin film transistor includes a semiconductor film, a gate electrode, a first signal electrode, and a second signal electrode. The control electrode faces the gate electrode with the semiconductor film interposed therebetween. The second signal electrode is connected with the lower electrode. The control electrode is connected with the lower electrode. At least a part of a first channel end on the first signal electrode side of the semiconductor film is located within a region of the control electrode, when viewed planarly. A second channel end on the second signal electrode side of the semiconductor film is distant from the control electrode, when viewed planarly.
1. A device comprising:
a first element having rectification characteristics that allow electric current to flow from an upper electrode to a lower electrode;
an n-channel thin film transistor including a semiconductor film, a gate electrode, a first signal electrode, and a second signal electrode; and
a control electrode facing the gate electrode with the semiconductor film interposed therebetween,
wherein the second signal electrode is connected with the lower electrode,
wherein the control electrode is connected with the lower electrode,
wherein at least a part of a first channel end on the first signal electrode side of the semiconductor film is located within a region of the control electrode, when viewed planarly,
wherein a second channel end on the second signal electrode side of the semiconductor film is distant from the control electrode, when viewed planarly, and
wherein the first channel end and the second channel end of the semiconductor film are disposed between distal ends of the gate electrode, when viewed planarly.
2. The device according to claim 1 , wherein the first element is a photodiode.
3. The device according to claim 1 , wherein the semiconductor film is an oxide semiconductor film.
4. The device according to claim 1 , wherein the gate electrode is disposed lower than the semiconductor film.
5. The device according to claim 1 , wherein the entire first channel end is located within the region of the control electrode, when viewed planarly.
6. The device according to claim 1 , wherein an end on the second channel end side of the control electrode is closer to the first channel end than to the second channel end.
7. The device according to claim 1 , wherein the control electrode and the lower electrode are made of the same material and disposed on the same layer.
8. The device according to claim 1 , wherein the control electrode is disposed on a layer between the layer of the lower electrode and the layer of the first signal electrode.
9. A device comprising:
a first element having rectification characteristics that allow electric current to flow from a lower electrode to an upper electrode;
an n-channel thin film transistor including a semiconductor film, a gate electrode, a first signal electrode, and a second signal electrode; and
a control electrode facing the gate electrode with the semiconductor film interposed therebetween,
wherein the second signal electrode is connected with the lower electrode,
wherein the control electrode is connected with the lower electrode,
wherein a first channel end on the first signal electrode side of the semiconductor film is distant from the control electrode, when viewed planarly,
wherein at least a part of a second channel end on the second signal electrode side of the semiconductor film is located within a region of the control electrode, when viewed planarly, and
wherein the first channel end and the second channel end of the semiconductor film are disposed between distal ends of the gate electrode, when viewed planarly.
10. The device according to claim 9 , wherein the first element is a photodiode.
11. The device according to claim 9 , wherein the semiconductor film is an oxide semiconductor film.
12. The device according to claim 9 , wherein the gate electrode is disposed lower than the semiconductor film.
13. The device according to claim 9 , wherein the entire second channel end is located within the region of the control electrode, when viewed planarly.
14. The device according to claim 9 , wherein an end on the first channel end side of the control electrode is closer to the second channel end than to the first channel end.
15. The device according to claim 9 , wherein the control electrode and the lower electrode are made of the same material and disposed on the same layer.
16. The device according to claim 9 , wherein the control electrode is disposed on a layer between the layer of the lower electrode and the layer of the second signal electrode.