Oscilloscope and method for testing a device under test

1. A digital sampling oscilloscope (DSO) comprising:

a housing;

an analog measurement input interface arranged in a housing wall of the housing;

at least one measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer, the at least one measurement acquisition system being integrated into the housing and being coupled to the analog measurement input interface;

a signal generator integrated into the housing; and

an operation mode control signal output interface arranged in the housing wall of the housing, the signal generator being coupled to the operation mode control signal output interface and being configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

2. The DSO of claim 1 , wherein the DUT is connected to the analog measurement input interface by a wired connection.

3. The DSO of claim 2 , wherein the wired connection is a universal serial bus connection.

4. The DSO of claim 1 , further comprising:

a trigger system integrated into the housing and coupled to the at least one measurement acquisition system, the trigger system being configured to output gating and timing control signals to the digitizer and the acquisition memory.

5. The DSO of claim 1 , further comprising:

an operation mode control signal memory integrated into the signal generator, the operation mode control signal memory being configured to store configuration data for the signal generator.

6. The DSO of claim 5 , further comprising:

a signal generator configuration input interface arranged in the housing and coupled to the operation mode control signal memory, the signal generator configuration input interface being configured to receive external configuration signals for configuring the operation mode control signal output by the signal generator to the DUT.

7. The DSO of claim 1 , wherein the operation mode control signal is output at a frequency of 30 MHz.

8. The DSO of claim 1 , wherein the operation mode control signal output interface has an output impedance of 50Ω.

9. A process of testing a device under test (DUT) using a digital sampling oscilloscope (DSO) having a housing, an analog measurement input interface arranged in a housing wall of the housing, at least one measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer, the at least one measurement acquisition system being integrated into the housing and being coupled to the analog measurement input interface, a signal generator integrated into the housing, and an operation mode control signal output interface arranged in the housing wall of the housing, the signal generator being coupled to the operation mode control signal output interface, the process comprising:

connecting the DUT to the operation mode control signal output interface and the analog measurement input interface of the DSO;

outputting, by the signal generator of the DSO, an operation mode control signal to the DUT connected to the operation mode control signal output interface; and

setting a test operation mode in the DUT according to a content of the operation mode control signal.

10. The process of claim 9 , further comprising acquiring measurement output signals from the DUT by the at least one measurement acquisition system.

11. The process of claim 10 , wherein the acquired measurement output signals depend on the test operation mode in the DUT set by the content of the operation mode control signal.

12. The process of claim 11 , wherein connecting the DUT to the operation mode control signal output interface includes forming a wired connection between the operation mode control signal output interface and a first universal serial bus port of the DUT.

13. The process of claim 12 , wherein connecting the DUT to the analog measurement input interface includes forming a wired connection between the analog measurement input interface and a second universal serial bus port of the DUT.

14. The process of claim 9 , wherein outputting the operation mode control signal comprises outputting the operation mode control signal at a frequency of 30 MHz.

15. A testing method for testing a device under test (DUT), the testing method comprising:

connecting a DUT to a signal generator integrated in a housing of a digital sampling oscilloscope (DSO);

connecting the DUT to a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer, the at least one measurement acquisition system being integrated into the housing of the DSO;

outputting, by the signal generator of the DSO, an operation mode control signal to the DUT;

setting a test operation mode in the DUT according to a content of the operation mode control signal; and

acquiring, by the measurement acquisition system, at least one measurement signal generated by the DUT in the test operation mode.

16. The testing method of claim 15 , wherein outputting the operation mode control signal comprises outputting the operation mode control signal at a frequency of 30 MHz.

17. The testing method of claim 15 , wherein the test operation mode of the DUT set according to the content of the operation mode control signal is used for testing universal serial bus communication modes of the DUT.

18. The testing method of claim 15 , wherein the DUT includes a processor operable to set different test operation modes in the DUT.

19. The testing method of claim 15 , wherein the operation mode control signal is used for emulating at least one of distortion and predistorted communication in the DUT.