IP Library › Granted Patent US 11,012,787
Granted Patent B2
US 11,012,787 · App. 16/377,921 · Granted May 18, 2021

Piezoelectric element, piezoelectric microphone, piezoelectric resonator and method for manufacturing piezoelectric element

Inventors: Keiichi Umeda (Nagaokakyo, JP); Takaaki Mizuno (Nagaokakyo, JP)
Assignee: MURATA MANUFACTURING CO., LTD.
H04R17/02H01L41/09H01L41/113H01L41/1136H01L41/1138H01L41/187H01L41/257H01L41/316H03H3/02H03H9/02574H03H9/173H03H9/174H04R17/10H04R31/00
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Quick Facts
Patent No.
US 11,012,787
App. No.
16/377,921
Granted
May 18, 2021
Kind
B2
Abstract

A piezoelectric element includes a first piezoelectric layer which has a first polarization axis direction in a thickness direction of the first piezoelectric layer and is made of AlN. A second piezoelectric layer made of GeAIN which is deposited on the first piezoelectric layer and has a second polarization axis direction opposite to the first polarization axis direction. A first electrode is provided on a side of the first piezoelectric layer which is opposite from a side where the second piezoelectric layer is disposed. A second electrode provided on a side of the second piezoelectric layer which is opposite from a side where the first piezoelectric layer is disposed.

Claims (15)

1. A piezoelectric element, comprising:

a first piezoelectric layer which has a first polarization axis direction in a thickness direction of the first piezoelectric layer and is made of AlN;

a second piezoelectric layer which is deposited on the first piezoelectric layer, has a second polarization axis direction opposite to the first polarization axis direction and is made of GeAlN;

a first electrode provided on a side of the first piezoelectric layer which is opposite from a side where the second piezoelectric layer is disposed: and

a second electrode provided on a side of the second piezoelectric layer which is opposite from a side where the first piezoelectric layer is disposed.

2. The piezoelectric element according to claim 1 , wherein the second piezoelectric layer is directly deposited on the first piezoelectric layer.

3. A piezoelectric device, comprising:

the piezoelectric element according to claim 1 ; and

a support which supports the piezoelectric element from a side of the first piezoelectric layer so as to have a space where the piezoelectric element vibrates.

4. A method for manufacturing a piezoelectric element, the method comprising the steps of:

forming a first piezoelectric layer made of AlN by deposition so as to have a first polarization axis direction in a thickness direction of the first piezoelectric layer;

forming a second piezoelectric layer made of GeAlN by deposition on the first piezoelectric layer so as to have a second polarization axis direction opposite to the first polarization axis direction;

providing a first electrode on a side of the first piezoelectric layer which is opposite from a side where the second piezoelectric layer is disposed; and

providing a second electrode on a side of the second piezoelectric layer which is opposite from a side where the first piezoelectric layer is disposed.

5. The method according to claim 4 , wherein the second piezoelectric layer is directly formed on the first piezoelectric layer in the step of forming the second piezoelectric layer.

Priority Claims (1)
JP JP2015-235504 · Dec 2, 2015 · national
Continuity (3)
Continuation 15909016 · Mar 1, 2018
Continuation PCTJP2016084132 · Nov 17, 2016
Related Publication 20190238996A1 · Aug 1, 2019