IP Library › Granted Patent US 11,022,703
Granted Patent B2
US 11,022,703 · App. 15/525,266 · Granted Jun 1, 2021

Photoelectric converter, detector, and scanning apparatus

Inventors: Qingguo Xie (Jiangsu, CN); Jun Zhu (Jiangsu, CN); Ming Niu (Jiangsu, CN); Luyao Wang (Jiangsu, CN)
Assignee: RAYCAN TECHNOLOGY CO., LTD. (SU ZHOU)
G01T1/1642G01T1/2002G01T1/248H01L31/02327H01L31/107
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Quick Facts
Patent No.
US 11,022,703
App. No.
15/525,266
Granted
Jun 1, 2021
Kind
B2
Abstract

A photoelectric converter includes a silicon photomultiplier array and a light guide coupled to the silicon photomultiplier array. The silicon photomultiplier array is generated by splicing i×j silicon photomultipliers on a horizontal plane, where both i and j are integers greater than or equal to 2. A detector includes a scintillation crystal, an electronic system, a light guide and a silicon photomultiplier. A scanning device includes a detection apparatus and a rack, the detection apparatus includes a detector, and the detector includes the photoelectric converter.

Claims (30)

1. A detector, comprising:

a scintillation crystal array, comprising a plurality of scintillation crystals on a horizontal plane;

an electronic system; and

a photoelectric converter, wherein the photoelectric converter comprises a silicon photomultiplier array generated by directly splicing i rows and j columns of silicon photomultipliers on a horizontal plane, wherein each silicon photomultiplier includes an avalanche photodiode micro-pixel unit array consisting of a plurality of micro pixel units; and wherein i indicates the number of the silicon photomultipliers in a length direction on the horizontal plane, j indicates the number of the silicon photomultipliers in a width direction on the horizontal plane, both i and j are integers greater than or equal to 2, a detection area of a single silicon photomultiplier ranges from 1×1 mm 2 to 6×6 mm 2 and an area of each micro pixel unit of the silicon photomultiplier ranges from 25×25 μm 2 to 100×100 μm 2 , wherein the photoelectric converter further comprises a light guide coupled to the silicon photomultiplier array, wherein the light guide comprises P layers, wherein the light guide is made of a non-full-cut or continuous optical fiber, a non-full-cut or continuous common inorganic glass or a non-full-cut or continuous organic glass, wherein P ranges from 2 to 4, and wherein a total thickness of the layers of the light guide ranges from 0.1 mm to 50 mm, wherein

the scintillation crystal array, a light guide and the silicon photomultiplier array are coupled by an optical coupling agent in the order listed; wherein

the photoelectric converter is configured to generate k paths of electrical pulse signals in response to one γ photon deposition event, wherein k corresponds to the number of the silicon photomultipliers; wherein

the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain m paths of electrical pulse signals, and to calculate a deposition position of the γ photon based on the reduced m electrical pulse signals by using a position algorithm, wherein m is an integer which is less than k; and wherein

the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to multiple scintillation crystals.

2. The detector according to claim 1 , wherein a shape of the light guide is a cone, a cylinder, a cuboid, a cube or a cone-like polyhedron.

3. The detector according to claim 1 , wherein the electronic system processes the k paths of electrical pulse signals to obtain information on energy and time of a γ photon.

4. The detector according to claim 1 , wherein the electronic system calculates deposition time of the γ photon based on the m electrical pulse signals by using a time algorithm, and the time algorithm comprises: calculating a sum or a weighted sum of the m electrical pulse signals to obtain a sum electrical pulse signal, and extracting time information of the sum electrical pulse signal as the deposition time of the γ photon.

5. The detector according to claim 1 , wherein the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to nine scintillation crystals.

6. The detector according to claim 1 , wherein the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to a 3×3 subarray of the nine scintillation crystals.

7. The detector according to claim 1 , wherein the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain i paths of electrical pulse signals corresponding to i rows of the silicon photomultipliers or j paths of electrical pulse signals corresponding to the j columns of the silicon photomultipliers.

8. The detector according to claim 7 , wherein the electronic system is configured to obtain the i paths of electrical pulse signals or the j paths of electrical pulse signals by applying different resistance weights to different paths of electrical pulse signals in a resistor network.

9. The detector according to claim 7 , wherein the electronic system is configured to obtain the i paths of electrical pulse signals or the j paths of electrical pulse signals by applying different resistance weights to different paths of electrical pulse signals in a resistor network.

10. The detector according to claim 1 , wherein the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain i+j paths of electrical pulse signals corresponding to the i rows of the silicon photomultipliers and the j columns of the silicon photomultipliers.

11. The detector according to claim 10 , wherein the electronic system is configured to obtain the paths of electrical pulse signals by acquiring cathode signals and anode signals of the silicon photomultipliers simultaneously.

12. The detector according to claim 10 , wherein the electronic system is configured to obtain the i+j paths of electrical pulse signals by acquiring cathode signals and anode signals of the silicon photomultipliers simultaneously.

13. The detector according to claim 1 , wherein the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain i+j paths of electrical pulse signals corresponding to the i rows of the silicon photomultipliers and the j columns of the silicon photomultipliers.

14. A scanning device, comprising:

a rack; and

a detection apparatus mounted on the rack, wherein the detection apparatus comprises a detector, and the detector comprises a photoelectric converter and an electronic system, wherein the photoelectric converter comprises a silicon photomultiplier array generated by directly splicing i rows and j columns of silicon photomultipliers on a horizontal plane, wherein each silicon photomultiplier includes an avalanche photodiode micro-pixel unit array consisting of a plurality of micro pixel units; and wherein i indicates the number of the silicon photomultipliers in a length direction on the horizontal plane, j indicates the number of the silicon photomultipliers in a width direction on the horizontal plane, both i and j are integers greater than or equal to 2, a detection area of a single silicon photomultiplier ranges from 1×1 mm 2 to 6×6 mm 2 and an area of each micro pixel unit of the silicon photomultiplier ranges from 25×25 μm 2 to 100×100 μm 2 , wherein the photoelectric converter further comprises a light guide coupled to the silicon photomultiplier array, wherein the light guide comprises P layers, wherein the light guide is made of a non-full-cut or continuous optical fiber, a non-full-cut or continuous common inorganic glass or a non-full-cut or continuous organic glass, wherein P ranges from 2 to 4, and wherein a total thickness of the layers of the light guide ranges from 0.1 mm to 50 mm;

the photoelectric converter is configured to generate k paths of electrical pulse signals in response to one γ photon deposition event, wherein k corresponds to the number of the silicon photomultipliers; wherein

the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain m paths of electrical pulse signals, and to calculate a deposition position of the γ photon based on the reduced m electrical pulse signals by using a position algorithm, wherein m is an integer which is less than k.

15. The scanning device according to claim 14 , wherein a shape of the light guide is a cone, a cylinder, a cuboid, a cube or a cone-like polyhedron.

16. The scanning device according to claim 14 , wherein the detector, further comprises a scintillation crystal array, comprising a plurality of scintillation crystals on a horizontal plane: wherein the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to multiple scintillation crystals.

17. The scanning device according to claim 16 , wherein the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to nine scintillation crystals.

18. The scanning device according to claim 17 , wherein the scintillation crystals and the silicon photomultipliers are sized such that each silicon photomultiplier corresponds to a 3×3 subarray of the nine scintillation crystals.

19. The scanning device according to claim 14 , wherein the electronic system is configured to pre-process the k paths of electrical pulse signals to reduce the number of electronic channels, to obtain i paths of electrical pulse signals corresponding to i rows of the silicon photomultipliers or j paths of electrical pulse signals corresponding to the j columns of the silicon photomultipliers.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 2, 2021
From: XIE, QINGGUO; ZHU, JUN; NIU, MING; WANG, LUYAO
To: RAYCAN TECHNOLOGY CO., LTD. (SU ZHOU)
Reel/Frame 055813/0590 →
Priority Claims (1)
CN 201410648328.4 · Nov 14, 2014 · national
Continuity (1)
Related Publication 20180284294A1 · Oct 4, 2018