Nonvolatile memory device with verification signal to indicate success or failure of programming memory cell and method for operating thereof
A nonvolatile memory device is provided. A nonvolatile memory device comprises a word line, a bit line, a memory cell array including a first memory cell at an intersection region between the word line and the bit line, a word line voltage generating circuitry configured to generate a program voltage, the program voltage to be provided to the word line, a row decoder circuitry configured to receive the program voltage from the word line voltage generating circuitry and configured to provide the program voltage to the word line, a verification circuitry configured to generate a verification signal in response to verifying a success or a failure of programming of the first memory cell, and a control circuitry configured to apply the program voltage to the first memory cell in response to the verification signal, and configured to cut off the program voltage in response to the verification signal.
1. A nonvolatile memory device comprising:
a word line;
a bit line;
a memory cell array including a first memory cell at an intersection region between the word line and the bit line;
a word line voltage generating circuitry configured to generate a program voltage, the program voltage to be provided to the word line;
a row decoder circuitry configured to receive the program voltage from the word line voltage generating circuitry and configured to provide the program voltage to the word line;
a verification circuitry configured to generate a verification signal in response to determining a success or a failure of programming of the first memory cell; and
a control circuitry configured to apply the program voltage to the first memory cell in response to the verification signal, and configured to cut off the program voltage in response to the verification signal, wherein
the control circuitry is configured to repeatedly apply the program voltage for consecutive periods of time during a plurality of loops, and
the control circuitry is configured to reduce the period of time of one of the plurality of loops by cutting off the program voltage in response to the verification signal,
wherein the control circuitry includes,
a controller configured to apply the program voltage separately for each of a plurality of loops, and configured to generate a count-up signal for each of the plurality of loops,
wherein the plurality of loops comprises a first loop, and a second loop immediately after the first loop, and
the verification circuitry is configured to verify the success or failure of program of the first loop during the second loop, and is configured to transmit a success signal or a failure signal to the controller.
2. The nonvolatile memory device of claim 1 , wherein the control circuitry comprises:
a program voltage adjustor configured to receive the count-up signal and configured to provide a step control signal to the word line voltage generating circuitry,
wherein the word line voltage generating circuitry is configured to adjust the program voltage in accordance with the step control signal.
3. The nonvolatile memory device of claim 2 , wherein the program voltage adjustor comprises:
a loop counter configured to receive the count-up signal to generate a counting signal, and
a decoder configured to receive the counting signal and configured to generate the step control signal in accordance with the counting signal.
4. The nonvolatile memory device of claim 3 , wherein the loop counter is configured to count a number of times of the plurality of loops to generate the counting signal in response to receiving the count-up signal.
5. The nonvolatile memory device of claim 2 , wherein the controller is configured to transmit a program voltage activation signal to the word line voltage generating circuitry, and is configured to transmit a program state activation signal to the row decoder circuitry,
the word line voltage generating circuitry is configured to generate the program voltage in response to the program voltage activation signal, and
the row decoder circuitry is configured to provide the program voltage to the word line in response to the program state activation signal.
6. A nonvolatile memory device comprising:
a word line;
a bit line;
a memory cell array including a first memory cell at an intersection region between the word line and the bit line;
a verification circuitry configured to generate a verification signal in response to determining a success or a failure of programming of the first memory cell; and
a control circuitry configured to apply a program voltage to the first memory cell in response to the verification signal, and configured to cut off the program voltage in response to the verification signal,
wherein the control circuitry includes,
a controller configured to apply the program voltage separately for each of a plurality of loops, and configured to generate a count-up signal for each of the plurality of loops,
wherein the plurality of loops comprises a first loop, and a second loop immediately after the first loop, and
the verification circuitry is configured to verify the success or failure of program of the first loop during the second loop, and is configured to transmit a success signal or a failure signal to the controller.
7. The nonvolatile memory device of claim 6 , wherein the controller is configured to transmit a count-up signal to a program voltage adjustor in response to receiving the failure signal.
8. The nonvolatile memory device of claim 6 , wherein the controller is configured to deactivate a program state activation signal in response to receiving the success signal.
9. The nonvolatile memory device of claim 6 , wherein the controller is configured to deactivate a program voltage activation signal in response to receiving the success signal.
10. The nonvolatile memory device of claim 6 , wherein the controller is configured to deactivate a program state activation signal and a program voltage activation signal in response to receiving the success signal.
11. The nonvolatile memory device of claim 1 , wherein the verification circuitry is configured to receive a scan start signal from the control circuitry, and after receiving the scan start signal, is configured to start verification of the success or failure of program the memory cells.
12. The nonvolatile memory device of claim 1 , wherein the memory cell array comprises a second memory cell arranged in the intersection region between the word line and the bit line, the second memory cell being different from the first memory cell, and
the verification circuitry is configured to verify the first and second memory cells in parallel.
13. A nonvolatile memory device comprising:
a word line;
a bit line;
a memory cell array including a first memory cell at an intersection region between the word line and the bit line;
a word line voltage generating circuitry configured to generate a program voltage, the program voltage to be provided to the word line;
a row decoder circuitry configured to receive the program voltage from the word line voltage generating circuitry and configured to provide the program voltage to the word line;
verification circuitry configured to generate a verification signal in response to determining a success or a failure of programming of the first memory cell; and
control circuitry configured to apply the program voltage to the first memory cell in response to the verification signal, and configured to cut off the program voltage in response to the verification signal, wherein
the control circuitry is configured to apply the program voltage for a first length of time, and to apply the program voltage for a second length of time in response to the verification signal, the second length of time less than the first length of time,
wherein the control circuitry includes,
a controller configured to apply the program voltage separately for each of a plurality of loops, and configured to generate a count-up signal for each of the plurality of loops,
wherein the plurality of loops comprises a first loop, and a second loop immediately after the first loop, and
the verification circuitry is configured to verify the success or failure of program of the first loop during the second loop, and is configured to transmit a success signal or a failure signal to the controller.
14. The nonvolatile memory device of claim 13 , wherein the control circuitry comprises:
a program voltage adjustor configured to receive the count-up signal and configured to provide a step control signal to the word line voltage generating circuitry,
wherein the word line voltage generating circuitry is configured to adjust the program voltage in accordance with the step control signal.
15. The nonvolatile memory device of claim 14 , wherein the program voltage adjustor comprises:
a loop counter configured to receive the count-up signal to generate a counting signal, and
a decoder configured to receive the counting signal and configured to generate the step control signal in accordance with the counting signal.
16. The nonvolatile memory device of claim 15 , wherein the loop counter is configured to count a number of times of the plurality of loops to generate the counting signal in response to receiving the count-up signal.
17. The nonvolatile memory device of claim 14 , wherein the controller is configured to transmit a program voltage activation signal to the word line voltage generating circuitry, and is configured to transmit a program state activation signal to the row decoder circuitry,
the word line voltage generating circuitry is configured to generate the program voltage in response to the program voltage activation signal, and
the row decoder circuitry is configured to provide the program voltage to the word line in response to the program state activation signal.