IP Library › Granted Patent US 11,027,684
Granted Patent B2
US 11,027,684 · App. 15/544,087 · Granted Jun 8, 2021

Occupant protection device

Inventors: Shunpei Yamazaki (Setagaya, JP); Takayuki Ikeda (Atsugi, JP); Yoshiyuki Kurokawa (Sagamihara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
B60R21/0134B60R21/00G06K9/00791B60R21/013B60R2021/01013B60R2021/01211G06T2207/30252
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Quick Facts
Patent No.
US 11,027,684
App. No.
15/544,087
Granted
Jun 8, 2021
Kind
B2
Abstract

An occupant protection device which can protect an occupant without delay is provided. An image taken by an imaging device is analyzed to judge whether there is an object approaching the subject car. In the case where a collision between the object and the subject car is judged to be inevitable, an airbag device is activated before the collision, whereby the occupant can be protected without delay. By using selenium for a light-receiving element of the imaging device, an accurate image can be obtained even under low illuminance. Imaging in a global shutter system leads to an accurate image with little distortion. This enables more accurate image analysis.

Claims (32)

1. An occupant protection device comprising:

an imaging device;

a control device; and

an airbag device,

wherein the imaging device comprises:

a light-receiving element comprising selenium; and

a transistor comprising an oxide semiconductor including a channel formation region, the transistor being electrically connected to the light-receiving element, and

wherein the control device is configured to predict a collision with the use of an image taken by the imaging device and to activate the airbag device.

2. The occupant protection device according to claim 1 , wherein the occupant protection device comprises a plurality of the imaging devices.

3. The occupant protection device according to claim 1 , wherein the oxide semiconductor comprises indium.

4. The occupant protection device according to claim 1 , wherein the oxide semiconductor comprises zinc.

5. The occupant protection device according to claim 1 , wherein the imaging device is configured to operate in a global shutter system.

6. An occupant protection device comprising:

an imaging device;

a control device; and

an airbag device,

wherein the imaging device comprises:

a light-receiving element comprising selenium; and

a transistor comprising an oxide semiconductor including a channel formation region, the transistor being electrically connected to the light-receiving element, and

wherein the control device is configured to predict a collision with the use of an image taken by the imaging device and to activate, before the collision, the airbag device on the basis of the prediction.

7. The occupant protection device according to claim 6 , wherein the occupant protection device comprises a plurality of the imaging devices.

8. The occupant protection device according to claim 6 , wherein the oxide semiconductor comprises indium.

9. The occupant protection device according to claim 6 , wherein the oxide semiconductor comprises zinc.

10. The occupant protection device according to claim 6 , wherein the imaging device is configured to operate in a global shutter system.

11. The occupant protection device according to claim 1 ,

wherein the control device estimates a collision impact by the prediction, and

wherein a pressure in the airbag device is determined in accordance with the collision impact estimated.

12. The occupant protection device according to claim 1 , wherein the airbag device comprises a plurality of inflators.

13. The occupant protection device according to claim 6 ,

wherein the control device estimates a collision impact by the prediction, and

wherein a pressure in the airbag device is determined in accordance with the collision impact estimated.

14. The occupant protection device according to claim 6 , wherein the airbag device comprises a plurality of inflators.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2017
From: YAMAZAKI, SHUNPEI; IKEDA, TAKAYUKI; KUROKAWA, YOSHIYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 043023/0438 →
Priority Claims (1)
JP JP2015-012880 · Jan 27, 2015 · national
Continuity (1)
Related Publication 20180009403A1 · Jan 11, 2018