IP Library › Granted Patent US 11,031,516
Granted Patent B2
US 11,031,516 · App. 15/031,838 · Granted Jun 8, 2021

Photoelectric conversion element, photoelectric conversion module, and solar photovoltaic power generation system

Inventors: Kenji Kimoto (Osaka, JP); Naoki Koide (Osaka, JP); Yuta Matsumoto (Osaka, JP); Junichi Nakamura (Osaka, JP)
Assignee: SHARP KABUSHIKI KAISHA
H01L31/036H01L31/02167H01L31/022425H01L31/022441H01L31/0352H01L31/068H01L31/0747H02S10/00Y02E10/547
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Quick Facts
Patent No.
US 11,031,516
App. No.
15/031,838
Granted
Jun 8, 2021
Kind
B2
Abstract

There is provided a photoelectric conversion element which can prevent the contact resistance between a non-crystalline semiconductor layer containing impurities and an electrode formed on the non-crystalline semiconductor layer from increasing, and can improve the element characteristics. A photoelectric conversion element ( 10 ) includes a semiconductor substrate ( 12 ), a first semiconductor layer ( 20 n ), a second semiconductor layer ( 20 p ), a first electrode ( 22 n ), and a second electrode ( 22 p ). The first semiconductor layer has a first conductive type. The second semiconductor layer has a second conductive type. The first electrode is formed on the first semiconductor layer. The second electrode is formed on the second semiconductor layer. The first electrode includes a first transparent conductive layer ( 26 n ) formed on the first semiconductor layer, and a first metal layer ( 28 n ) formed on the first transparent conductive layer. The first metal layer includes a plurality of metal crystal grains in which the average crystal grain size in the in-surface direction of the first metal layer is greater than the thickness of the first metal layer.

Claims (37)

1. A photoelectric conversion element comprising:

a semiconductor substrate;

a first non-crystalline semiconductor layer having a first conductive type;

a second non-crystalline semiconductor layer having a second conductive type opposite to the first conductive type;

a first electrode which is in contact with the first non-crystalline semiconductor layer; and

a second electrode which is in contact with the second non-crystalline semiconductor layer,

wherein the first electrode includes a first transparent conductive layer formed on the first non-crystalline semiconductor layer and a first metal layer formed on the first transparent conductive layer,

wherein the first metal layer includes a plurality of metal crystal grains,

wherein an average crystal grain size of the plurality of metal crystal grains in an in-surface direction of the first metal layer is greater than 1.5 times a thickness of the first metal layer,

wherein the plurality of metal crystal grains includes metal crystal grains oriented in a <110> direction, metal crystal grains oriented in a <100> direction, and metal crystal grains oriented in a <111> direction,

wherein each of the <100> direction, the <110> direction, and the <111> direction is within 10 degrees with respect to a thickness direction of the semiconductor substrate, and

wherein an area of the plurality of metal crystal grains oriented in the <111> direction is greater than an area of the plurality of metal crystal grains oriented in the <100> direction and an area of the plurality of metal crystal grains oriented in the <110> direction.

2. The photoelectric conversion element according to claim 1 , wherein the first electrode is made of a metal film which has silver as a main component.

3. The photoelectric conversion element according to claim 1 , wherein the first non-crystalline semiconductor layer and the second non-crystalline semiconductor layer are formed on a rear surface opposite to a light-receiving surface on the semiconductor substrate.

4. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is an n-type, and

wherein the average crystal grain size is less than 3.33 times the thickness of the first metal layer.

5. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is an n-type, and

wherein the average crystal grain size is less than or equal to 2.85 times the thickness of the first metal layer.

6. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is an n-type, and

wherein the average crystal grain size is greater than or equal to 1.55 times and less than or equal to 2.85 times the thickness of the first metal layer.

7. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is a p-type, and

wherein the average crystal grain size is less than or equal to 3.3 times the thickness of the first metal layer.

8. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is a p-type, and

wherein the average crystal grain size is greater than 1.5 times and less than or equal to 2.95 times the thickness of the first metal layer.

9. The photoelectric conversion element according to claim 1 ,

wherein the first conductive type is a p-type, and

wherein the average crystal grain size is greater than or equal to 1.53 times and less than or equal to 2.15 times the thickness of the first metal layer.

10. The photoelectric conversion element according to claim 1 ,

wherein the second electrode includes a second transparent conductive layer formed on the second non-crystalline semiconductor layer, and a second metal layer formed on the second transparent conductive layer,

wherein the second metal layer includes a plurality of metal crystal grains,

wherein a contact area between the second electrode and the second non-crystalline semiconductor layer is greater than or equal to 1 time a contact area between the first electrode and the first non-crystalline semiconductor layer, and

wherein an average value of the average crystal grain size of the metal crystal grain in the first metal layer, and the average crystal grain size of the metal crystal grain in the second metal layer, is greater than 1.5 times and less than or equal to 2.15 times the thickness of the first metal layer and the second metal layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: KIMOTO, KENJI; KOIDE, NAOKI; MATSUMOTO, YUTA; NAKAMURA, JUNICHI
To: SHARP KABUSHIKI KAISHA
Reel/Frame 051326/0136 →
Priority Claims (1)
JP JP2013-222818 · Oct 25, 2013 · national
Continuity (1)
Related Publication 20160268459A1 · Sep 15, 2016