Teaching method
In a teaching method for a transfer mechanism that transfers a substrate to a mounting table, the method includes: transferring an inspection substrate having a plurality of imaging devices on an outer peripheral edge thereof to a transfer position where the substrate is transferred between the transfer mechanism and the mounting table; imaging a part of the mounting table which includes an outer periphery of the mounting table at the transfer position by the imaging devices; calculating a central position of the mounting table based on the image obtained by the imaging devices; and correcting the transfer position based on the central position of the mounting table which is calculated in the calculating and a central position of the inspection substrate at the transfer position.
1. A teaching method for a transfer mechanism that transfers a substrate to a mounting table, the method comprising:
transferring an inspection substrate having a plurality of imaging devices on an outer peripheral edge thereof to a transfer position where the substrate is transferred between the transfer mechanism and the mounting table;
imaging a part of the mounting table which includes an outer periphery of the mounting table at the transfer position by the imaging devices;
calculating a central position of the mounting table based on an image obtained by the imaging devices; and
correcting the transfer position based on the central position of the mounting table which is calculated in said calculating and a central position of the inspection substrate at the transfer position.
2. The teaching method of claim 1 , therein the imaging devices are arranged on the same circumference.
3. The teaching method of claim 1 , wherein the imaging devices simultaneously image different portions of the mounting table.
4. The teaching method of claim 1 , wherein the imaging devices image the mounting table through a reflector.
5. The teaching method of claim 1 , wherein the mounting table is provided in a processing chamber in which predetermined processing is performed on the substrate.
6. The teaching method of claim 1 , therein the transfer position is separated upward by a predetermined distance from a surface of the mounting table on which the substrate is mounted.
7. The teaching method of claim 1 , wherein said transferring, said imaging, said calculating and said correcting are repeated in that order.
8. The teaching method of claim 1 , further comprising, before said transferring, position-aligning the inspection substrate.
9. The teaching method of claim 1 , further comprising, before said transferring, calibrating deviation of actual installation positions of the imaging devices on the inspection substrate with respect to designed positions of the imaging devices on the inspection substrate.
10. The teaching method of claim 1 , wherein the inspection substrate has a communication device configured to transmit the image obtained by the imaging devices to an external device.
11. The teaching method of claim 1 , wherein the inspection substrate has the same size as the size of the substrate.
12. The teaching method of claim 1 , wherein the inspection substrate is provided with a touch sensor.