Active-matrix organic light emitting diode (AMOLED) panel cell testing circuit and method for repairing data lines via same

1. An active-matrix organic light emitting diode (AMOLED) panel cell testing circuit, comprising:

a first switch, wherein a control end of the first switch is connected to a detection control signal, a first data signal is input into an input end of the first switch, an output end of the first switch is connected to a first detection data signal line;

a second switch, wherein a control end of the second switch is connected to a detection control signal, a second data signal is input into an input end of the second switch, an output end of the second switch is connected to a second detection data signal line;

a third switch, wherein a control end of the third switch is connected to a detection control signal, a third data signal is input into an input end of the third switch, an output end of the third switch is connected to a third detection data signal line;

wherein data lines of a panel are divided into first kind of data lines, second kind of data lines, and third kind of data lines according to an arrangement mode of a connection to sub pixels, the first detection data signal line is connected to the first kind of data lines, the second detection data signal line is connected to the second kind of data lines, and the third detection data signal line is connected to the third kind of data lines;

wherein the first detection data signal line, the second detection data signal line, and the third detection data signal line comprise a first vertical line, a second vertical line, and a third vertical line disposed correspondingly and placed in two sides of an active display area of the panel, and a plurality of first parallel lines, a plurality of second parallel lines, and a plurality of third parallel lines arranged by a default interval and being perpendicular to the data lines are formed in the active display area of the panel and correspondingly connected to the first vertical line, the second vertical line, and the third vertical line placed in the two sides; and

wherein when a cell testing process is employed, a color bar screen detection process is employed by the first data signal, the second data signal, and the third data signal via a clock signal.

2. The AMOLED panel cell testing circuit of claim 1 , wherein the sub pixels connected to the first kind of data lines are arranged alternately by R sub pixels and B sub pixels; the sub pixels connected to the second kind of data lines are arranged alternately by B sub pixels and R sub pixels; and all of the sub pixels connected the third kind of data lines are G sub pixels.

3. The AMOLED panel cell testing circuit of claim 1 , wherein the cell testing circuit further is connected to cell testing pads, the cell testing pads are configured to provide the first data signal, the second data signal, and the third data signal for the cell testing circuit.

4. The AMOLED panel cell testing circuit of claim 3 , wherein there are two cell testing pads placed in two sides under the active display area.

5. The AMOLED panel cell testing circuit of claim 4 , wherein a main body is placed upon the active display area.

6. The AMOLED panel cell testing circuit of claim 1 , wherein when an open circuit does not occur in the data lines of the panel, the first parallel lines, the second parallel lines, and the third parallel lines are not connected to the data lines.

7. The AMOLED panel cell testing circuit of claim 1 , wherein when an open circuit occurs in a certain position of a certain data line of the panel, one of the first parallel lines, the second parallel lines, and the third parallel lines is connected to the certain data line to repair the open circuit in the certain position.

8. A method for repairing the data lines via the AMOLED panel cell testing circuit of claim 1 , comprising:

a step 10 of detecting an open circuit in a certain position of a certain data line in the active display area of the panel via the cell testing circuit;

a step 20 of selecting one selected position in each of two sides of the certain position of the certain data line, selecting one of the first parallel lines, the second parallel lines, and the third parallel lines to connect the certain data line at the selected positions to repair the open circuit in the certain position;

a step 30 of disconnecting the first data signal, the second data signal and the third data signal from the cell testing pads to the cell testing circuit in a module stage.

9. The method for repairing the signal lines of claim 8 further comprises a step 21 of repeating the step 10 and the step 20 to repair all of the open circuits of the certain data line.

10. The method for repairing the data lines of claim 9 further comprises a step 22 of repeating the step 21 to repair several open circuits of several data lines in the active display area.

11. The method for repairing the data lines of claim 8 , wherein the first parallel line, the second parallel line, and the third parallel line are configured for repair the open circuits placed in three different data lines of the active display area of the panel respectively.

12. The method for repairing the data lines of claim 8 , wherein one of the first parallel line, the second parallel line, and the third parallel line is configured for repair the open circuits placed in different positions of one of the data lines of the active display area of the panel.