Method and system to route semiconductor parts to machines distributed in a multi-building plant

1. A method comprising:

responsive to identifying a part completed a step in a manufacture process, determining, by a processing device, a first number of parts waiting to be processed in a subsequent step by a plurality of machines housed in a plurality of buildings interconnected by rails;

determining a second number of parts that the plurality of machines housed in the plurality of buildings is capable of processing in the subsequent step of the manufacture process over a determined period of time;

calculating a capability occupancy ratio based on the first number and the second number for each one of the plurality of buildings;

determining a target building of the plurality of buildings based on the capability occupancy ratio; and

causing to dispatch the part to the target building via the rails.

2. The method of claim 1 , wherein the part is one of a semiconductor wafer or a semiconductor wafer lot, wherein the plurality of buildings composes of a semiconductor manufacture plant, and wherein the manufacture process comprises a plurality of steps to convert the semiconductor wafer to an end product.

3. The method of claim 1 , wherein determining the target building comprises:

determining the target building as one associated with a least capability occupancy ratio among the plurality of buildings.

4. The method of claim 1 , wherein calculating the capability occupancy ratio comprises calculating the capability occupancy ratio based on one or more rules.

5. The method of claim 4 , wherein the one or more rules comprises:

responsive to determining that the first number of parts in a current building associated with the part is less than a threshold value, assigning the current building as the target building.

6. The method of claim 4 , wherein the one or more rules comprises:

amplifying the second number associated with a current building in which the part is located.

7. The method of claim 4 , wherein the one or more rules comprises:

determining a congestion state associated with each one of the rails; and

determining the target building as a building connected by least congested rail based on the congestion state.

8. The method of claim 1 , wherein determining the first number of parts waiting to be processed comprises determining the first number of parts based on real-time information stored in a data record of a manufacture execution system; and

wherein determining the second number of parts that the plurality of machines housed in the plurality of buildings further comprises: estimating the second number of parts based on a simulation of operation of the plurality of machines housed in the plurality of buildings in a future time period.

9. The method of claim 8 , wherein estimating the second number of parts that the plurality of machines housed in the plurality of buildings further comprises:

calculating an uptime percentage for each one of the plurality of machines;

determining, based on a duration to process each part, a third number of parts that each one of the plurality of machines is capable of processing over the determined period of time; and

estimating the second number of parts based on the uptime percentage and the third number.

10. A system, comprises:

a storage device to store information of real-time operation of a plant, the plant comprising a plurality of machines in a plurality of buildings interconnected by rails; and

a processing device, communicatively coupled to the storage device, to:

responsive to identifying a part completed a step in a manufacture process, determine a first number of parts waiting to be processed in a subsequent step by the plurality of machines housed in the plurality of buildings;

determine a second number of parts that the plurality of machines housed in the plurality of buildings is capable of processing in the subsequent step of the manufacture process over a determined period of time;

calculate a capability occupancy ratio based on the first number and the second number for each one of the plurality of buildings;

determine a target building of the plurality of buildings based on the capability occupancy ratio; and

cause to dispatch the part to the target building via the rails.

11. The system of claim 10 , wherein the part is one of a semiconductor wafer or a semiconductor wafer lot, wherein the plurality of buildings composes of a semiconductor manufacture plant, and wherein the manufacture process comprises a plurality of steps to convert the semiconductor wafer to an end product.

12. The system of claim 10 , wherein to determine the target building, the processing device is further to determine the target building as one associated with a least capability occupancy ratio among the plurality of buildings.

13. The system of claim 10 , wherein to calculate the capability occupancy ratio, the processing device is further to calculate the capability occupancy ratio based on one or more rules.

14. The system of claim 13 , wherein the one or more rules comprises:

responsive to determining that the first number of parts in a current building associated with the part is less than a threshold value, assigning the current building as the target building.

15. The system of claim 14 , wherein the one or more rules comprises:

amplifying the second number associated with a current building in which the part is located.

16. The system of claim 14 , wherein the one or more rules comprises:

determining a congestion state associated with each one of the rails; and

determining the target building as a building connected by least congested rail based on the congestion state.

17. The system of claim 10 , wherein to determine the first number of parts waiting to be processed, the processing device is further to determine the first number of parts based on real-time information stored in a data record of a manufacture execution system; and

wherein to determine the second number of parts that the plurality of machines housed in the plurality of buildings, the processing device is further to: estimate the second number of parts based on a simulation of operation of the plurality of machines housed in the plurality of buildings in a future time period.

18. The system of claim 17 , wherein to estimate the second number of parts that the plurality of machines housed in the plurality of buildings, the processing device is further to:

calculate an uptime percentage for each one of the plurality of machines;

determine, based on a duration to process each part, a third number of parts that each one of the plurality of machines is capable of processing over the determined period of time; and

estimate the second number of parts based on the uptime percentage and the third number.

19. A non-transitory machine-readable storage medium storing instructions which, when executed, cause a processing device to:

responsive to identifying a part completed a step in a manufacture process, determine, by the processing device, a first number of parts waiting to be processed in a subsequent step by a plurality of machines housed in a plurality of buildings interconnected by rails;

determine a second number of parts that the plurality of machines housed in the plurality of buildings is capable of processing in the subsequent step of the manufacture process over a determined period of time;

calculate a capability occupancy ratio based on the first number and the second number for each one of the plurality of buildings;

determine a target building of the plurality of buildings based on the capability occupancy ratio; and

cause to dispatch the part to the target building via the rails.

20. The non-transitory machine-readable storage medium of claim 19 , wherein the part is one of a semiconductor wafer or a semiconductor wafer lot, wherein the plurality of buildings composes of a semiconductor manufacture plant, and wherein the manufacture process comprises a plurality of steps to convert the semiconductor wafer to an end product.