IP Library › Granted Patent US 11,062,992
Granted Patent B2
US 11,062,992 · App. 16/556,656 · Granted Jul 13, 2021

Electronic component

Inventor: Bungo Tanaka (Kyoto, JP)
Assignee: ROHM CO., LTD.
H01L23/5256
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Quick Facts
Patent No.
US 11,062,992
App. No.
16/556,656
Granted
Jul 13, 2021
Kind
B2
Abstract

An electronic component includes a lower insulating layer, an upper insulating layer formed on the lower insulating layer, a first via electrode embedded in the lower insulating layer, a second via electrode embedded in the lower insulating layer at an interval from the first via electrode, and a resistance layer that is made of a metal thin film, is interposed in a region between the lower insulating layer and the upper insulating layer, and is electrically connected to the first via electrode and the second via electrode.

Claims (69)

1. Electronic component comprising:

a lower insulating layer;

an upper insulating layer formed on the lower insulating layer;

a first via electrode embedded in the lower insulating layer;

a second via electrode embedded in the lower insulating layer at an interval from the first via electrode;

a resistance layer that is made of a metal thin film, is interposed in a region between the lower insulating layer and the upper insulating layer, and is electrically connected to the first via electrode and the second via electrode;

a first lower wiring layer formed in a region at a lower insulating layer side with respect to the resistance layer and electrically connected to the first via electrode;

a second lower wiring layer formed in the region at a lower insulating layer side with respect to the resistance layer and electrically connected to the second via electrode;

a first upper wiring layer formed on the upper insulating layer and electrically connected to the first lower wiring layer;

a second upper wiring layer formed on the upper insulating layer and electrically connected to the second lower wiring layer;

a first long via electrode penetrating through and embedded in the lower insulating layer and the upper insulating layer and electrically connected to the first lower wiring layer and the first upper wiring layer; and

a second long via electrode penetrating through and embedded in the lower insulating layer and the upper insulating layer and electrically connected to the second lower wiring layer and the second upper wiring layer.

2. The electronic component according to claim 1 , wherein

the first upper wiring layer is separated from the resistance layer in plan view, and

the second upper wiring layer is separated from the resistance layer in plan view.

3. The electronic component according to claim 1 , wherein

the first upper wiring layer forms a top wiring layer, and

the second upper wiring layer forms a top wiring layer.

4. The electronic component according to claim 1 , wherein

the first upper wiring layer has a thickness not less than a thickness of the first lower wiring layer, and

the second upper wiring layer has a thickness not less than a thickness of the second lower wiring layer.

5. The electronic component according to claim 1 , wherein the resistance layer is positioned on a straight line connecting the first long via electrode and the second long via electrode in plan view.

6. The electronic component according to claim 1 , wherein

the first long via electrode has a first lower portion positioned at a first lower wiring layer side with respect to the resistance layer and a first upper portion positioned at a first upper wiring layer side with respect to the resistance layer and having a length not less than a length of the first lower portion, and

the second long via electrode has a second lower portion positioned at a second lower wiring layer side with respect to the resistance layer and a second upper portion positioned at a second upper wiring layer side with respect to the resistance layer and having a length not less than a length of the second lower portion.

7. The electronic component according to claim 1 , further comprising:

an insulating layer covering the first upper wiring layer and the second upper wiring layer and having a first pad opening that exposes the first upper wiring layer and a second pad opening that exposes the second upper wiring layer.

8. The electronic component according to claim 7 , wherein the insulating layer covers a connection portion of the first upper wiring layer and the first long via electrode and a connection portion of the second upper wiring layer and the second long via electrode in plan view.

9. The electronic component according to claim 1 , wherein

the first via electrode has a first projecting portion projecting toward the upper insulating layer with respect to a main surface of the lower insulating layer,

the second via electrode has a second projecting portion projecting toward the upper insulating layer with respect to the main surface of the lower insulating layer, and

the resistance layer covers the first projecting portion of the first via electrode and the second projecting portion of the second via electrode.

10. The electronic component according to claim 1 , further comprising:

a semiconductor layer having a main surface; and

wherein the lower insulating layer is formed on the main surface of the semiconductor layer.

11. The electronic component according to claim 10 , wherein

the semiconductor layer includes a device region in which a function device is formed and an outside region outside the device region, and

the resistance layer is formed in the outside region in plan view.

12. The electronic component according to claim 1 , wherein the resistance layer is made of a metal thin film including at least one among CrSi, TaN, and TiN.

13. An electronic component comprising:

a lower insulating layer;

an upper insulating layer formed on the lower insulating layer;

a first via electrode embedded in the lower insulating layer;

a second via electrode embedded in the lower insulating layer at an interval from the first via electrode;

a first upper wiring layer formed on the upper insulating layer;

a second upper wiring layer formed on the upper insulating layer at an interval from the first upper wiring layer;

a resistance layer that is made of a metal thin film, is interposed in a region between the lower insulating layer and the upper insulating layer such as to be positioned in a region between the first upper wiring layer and the second upper wiring layer in plan view, and is electrically connected to the first via electrode and the second via electrode; and

a first long via electrode penetrating through and embedded in the lower insulating layer and the upper insulating layer such as to traverse a side of the resistance layer and electrically connected to the first upper wiring layer; and

a second long via electrode penetrating through and embedded in the lower insulating layer and the upper insulating layer such as to traverse a side of the resistance layer and electrically connected to the second upper wiring layer.

14. The electronic component according to claim 13 , wherein the resistance layer is positioned on a straight line connecting the first long via electrode and the second long via electrode in plan view.

15. The electronic component according to claim 13 , wherein the first long via electrode and the second long via electrode are positioned on a straight line connecting the first via electrode and the second via electrode in plan view.

16. The electronic component according to claim 13 , wherein the resistance layer is electrically connected to the first upper wiring layer and the second upper wiring layer.

17. The electronic component according to claim 13 , wherein the resistance layer is made of a metal thin film including at least one among CrSi, TaN, and TiN.

18. An electronic component comprising:

a semiconductor layer having a main surface;

a lower insulating layer formed on the main surface of the semiconductor layer;

an upper insulating layer formed on the lower insulating layer;

a first via electrode embedded in the lower insulating layer;

a second via electrode embedded in the lower insulating layer at an interval from the first via electrode; and

a resistance layer that is made of a metal thin film, is interposed in a region between the lower insulating layer and the upper insulating layer, and is electrically connected to the first via electrode and the second via electrode.

19. The electronic component according to claim 18 , further comprising:

a first lower wiring layer formed in a region at a lower insulating layer side with respect to the resistance layer and electrically connected to the first via electrode; and

a second lower wiring layer formed in the region at a lower insulating layer side with respect to the resistance layer and electrically connected to the second via electrode.

20. The electronic component according to claim 19 , further comprising:

a first upper wiring layer formed on the upper insulating layer and electrically connected to the first lower wiring layer; and

a second upper wiring layer formed on the upper insulating layer and electrically connected to the second lower wiring layer.

21. The electronic component according to claim 18 , wherein

the semiconductor layer includes a device region in which a function device is formed and an outside region outside the device region, and

the resistance layer is formed in the outside region in plan view.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2019
From: TANAKA, BUNGO
To: ROHM CO., LTD.
Reel/Frame 050221/0726 →
Priority Claims (2)
JP JP2018-166368 · Sep 5, 2018 · national
JP JP2019-073660 · Apr 8, 2019 · national
Continuity (1)
Related Publication 20200075486A1 · Mar 5, 2020
Cited By (1)
US 12,568,679